{"title":"Standardized test resource models vs. UUT signal oriented models for test system control","authors":"D. Crowe, W. Griffin, G. Matysek","doi":"10.1109/AUTEST.1991.197541","DOIUrl":null,"url":null,"abstract":"The strengths and weaknesses of the UUT signal-oriented approach are examined in light of the standardized test resource model approach that has been presented to the IEEE ABET committee. This approach would create standard models for types of test resources that would define functionality, parametric ranges, and connectivity. It is shown that the test resource model concept presented will greatly reduce the TPS maintenance burden by moving test-station-specific information from detailed station documentation to the TPS program and to the software interfaces used by those programs. It will also greatly improve code reuse by making it clear in the code where non-standard or instrument-class-dependent test functions are being used.<<ETX>>","PeriodicalId":320001,"journal":{"name":"Conference Record AUTOTESTCON '91 IEEE Systems Readiness Technology Conference Improving Systems Effectiveness in the Changing Environment of the '90s","volume":"9 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1991-09-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Conference Record AUTOTESTCON '91 IEEE Systems Readiness Technology Conference Improving Systems Effectiveness in the Changing Environment of the '90s","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/AUTEST.1991.197541","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 3
Abstract
The strengths and weaknesses of the UUT signal-oriented approach are examined in light of the standardized test resource model approach that has been presented to the IEEE ABET committee. This approach would create standard models for types of test resources that would define functionality, parametric ranges, and connectivity. It is shown that the test resource model concept presented will greatly reduce the TPS maintenance burden by moving test-station-specific information from detailed station documentation to the TPS program and to the software interfaces used by those programs. It will also greatly improve code reuse by making it clear in the code where non-standard or instrument-class-dependent test functions are being used.<>