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Conference Record AUTOTESTCON '91 IEEE Systems Readiness Technology Conference Improving Systems Effectiveness in the Changing Environment of the '90s最新文献

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Built-in test IC provides automatic test equipment capabilities 内置测试IC，提供自动测试设备功能
Conference Record AUTOTESTCON '91 IEEE Systems Readiness Technology Conference Improving Systems Effectiveness in the Changing Environment of the '90s Pub Date : 1991-09-24 DOI: 10.1109/AUTEST.1991.197565
L. Ungar
{"title":"Built-in test IC provides automatic test equipment capabilities","authors":"L. Ungar","doi":"10.1109/AUTEST.1991.197565","DOIUrl":"https://doi.org/10.1109/AUTEST.1991.197565","url":null,"abstract":"An approach to implementing built-in test (BIT) and built-in test equipment (BITE) is introduced. It consists of an IC that was designed to be used with any digital circuit. Called built-in test exerciser and sensor or BITES, the chip furnishes all stimuli generation and response measurements needed to monitor performance. It also detects and isolates faults in digital systems, circuit boards, and ASICs. BITES can facilitate a variety of tests with a general-purpose computer that would otherwise require several generically different automatic test equipments (ATEs). Combined with boundary-scan, it can also provide test features not available with conventional ATE.<<ETX>>","PeriodicalId":320001,"journal":{"name":"Conference Record AUTOTESTCON '91 IEEE Systems Readiness Technology Conference Improving Systems Effectiveness in the Changing Environment of the '90s","volume":"49 12","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-09-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114036800","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
The emergence of Air Force Material Command and automatic test equipment (ATE) acquisition 空军物资司令部和自动测试设备(ATE)采办的出现
Conference Record AUTOTESTCON '91 IEEE Systems Readiness Technology Conference Improving Systems Effectiveness in the Changing Environment of the '90s Pub Date : 1900-01-01 DOI: 10.1109/AUTEST.1991.197576
D. L. Jackson
{"title":"The emergence of Air Force Material Command and automatic test equipment (ATE) acquisition","authors":"D. L. Jackson","doi":"10.1109/AUTEST.1991.197576","DOIUrl":"https://doi.org/10.1109/AUTEST.1991.197576","url":null,"abstract":"The acquisition of automatic test equipment (ATE) should change when Air Force Logistics Command (AFLC) and Air Force Systems Command (AFSC) become a single entity. ATE is purchased by both commands, but many differences exist such as: type of equipment purchased, types of monies utilized, and the number and expertise of those involved in acquisition guidance. The author explores the differences between the commands in the way they acquire automatic test equipment and the expected changes that will result from the emergence of the unified Air Force Material Command (AFMC).<<ETX>>","PeriodicalId":320001,"journal":{"name":"Conference Record AUTOTESTCON '91 IEEE Systems Readiness Technology Conference Improving Systems Effectiveness in the Changing Environment of the '90s","volume":"5 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122056922","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Technology insertion, a strategy for existing aerospace equipment inventories 技术插入，现有航空航天设备库存的策略
Conference Record AUTOTESTCON '91 IEEE Systems Readiness Technology Conference Improving Systems Effectiveness in the Changing Environment of the '90s Pub Date : 1900-01-01 DOI: 10.1109/AUTEST.1991.197577
X. Peña
{"title":"Technology insertion, a strategy for existing aerospace equipment inventories","authors":"X. Peña","doi":"10.1109/AUTEST.1991.197577","DOIUrl":"https://doi.org/10.1109/AUTEST.1991.197577","url":null,"abstract":"The capability to use state-of-the-art technologies to solve reliability and maintainability (R&M) problems in automatic test equipment (ATE) and aerospace equipment has been developed. This capability is intended as a tool to provide quality logistics support.<<ETX>>","PeriodicalId":320001,"journal":{"name":"Conference Record AUTOTESTCON '91 IEEE Systems Readiness Technology Conference Improving Systems Effectiveness in the Changing Environment of the '90s","volume":"29 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114225132","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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