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Conference Record AUTOTESTCON '91 IEEE Systems Readiness Technology Conference Improving Systems Effectiveness in the Changing Environment of the '90s最新文献

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The need for multi-service test equipment standardization 多业务测试设备需要标准化
Conference Record AUTOTESTCON '91 IEEE Systems Readiness Technology Conference Improving Systems Effectiveness in the Changing Environment of the '90s Pub Date : 1991-09-24 DOI: 10.1109/AUTEST.1991.197533
D. Crowe, G. Matysek
{"title":"The need for multi-service test equipment standardization","authors":"D. Crowe, G. Matysek","doi":"10.1109/AUTEST.1991.197533","DOIUrl":"https://doi.org/10.1109/AUTEST.1991.197533","url":null,"abstract":"The goal of this work is not to resolve the standardization of military testing issues but to create an awareness of some additional issues arising from a prime mission equipment developer perspective. A concept that calls for the creation of a base of reusable, sharable test functions which can be invoked at various stages during the life cycle of the product is developed. Basing these test methods on a modular automatic test equipment (ATE) ATE architecture focused on TPS interfaces allows test systems to be developed that support test code reuse across ATE.<<ETX>>","PeriodicalId":320001,"journal":{"name":"Conference Record AUTOTESTCON '91 IEEE Systems Readiness Technology Conference Improving Systems Effectiveness in the Changing Environment of the '90s","volume":"2 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-09-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122126395","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Uncertainty computations in model-based diagnostics 基于模型的诊断中的不确定性计算
Conference Record AUTOTESTCON '91 IEEE Systems Readiness Technology Conference Improving Systems Effectiveness in the Changing Environment of the '90s Pub Date : 1991-09-24 DOI: 10.1109/AUTEST.1991.197552
J. Sheppard, W. Simpson
{"title":"Uncertainty computations in model-based diagnostics","authors":"J. Sheppard, W. Simpson","doi":"10.1109/AUTEST.1991.197552","DOIUrl":"https://doi.org/10.1109/AUTEST.1991.197552","url":null,"abstract":"The authors briefly describe the computational methods used in uncertainty data gathering (modified fuzzy logic), evidence accumulation (modified Dempster-Shafer), and termination of the evidence-gathering process (backpropagation neural network) as they are implemented in the POINTER system. An example demonstrates the proposed approach.<<ETX>>","PeriodicalId":320001,"journal":{"name":"Conference Record AUTOTESTCON '91 IEEE Systems Readiness Technology Conference Improving Systems Effectiveness in the Changing Environment of the '90s","volume":"136 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-09-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122752426","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 5
ATAG: An initiative to accelerate ABET standardization ATAG:加速ABET标准化的倡议
Conference Record AUTOTESTCON '91 IEEE Systems Readiness Technology Conference Improving Systems Effectiveness in the Changing Environment of the '90s Pub Date : 1991-09-24 DOI: 10.1109/AUTEST.1991.197543
J. Heiser, K. Schoonover
{"title":"ATAG: An initiative to accelerate ABET standardization","authors":"J. Heiser, K. Schoonover","doi":"10.1109/AUTEST.1991.197543","DOIUrl":"https://doi.org/10.1109/AUTEST.1991.197543","url":null,"abstract":"To hasten the evolution of the IEEE ABET (ATLAS/Ada based environment for test) set of standards, the USAF created the ABET Technical Advisory Group (ATAG). The ATAG organization, ground rules, accomplishments, and plans are described. The approach taken and lessons learned are valuable for other initiatives designed to aid the development of test-related standards.<<ETX>>","PeriodicalId":320001,"journal":{"name":"Conference Record AUTOTESTCON '91 IEEE Systems Readiness Technology Conference Improving Systems Effectiveness in the Changing Environment of the '90s","volume":"439 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-09-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125774682","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 5
Laser beam divergence measurement using a large aperture diamond-turned collimator 用大孔径菱形准直仪测量激光束发散度
Conference Record AUTOTESTCON '91 IEEE Systems Readiness Technology Conference Improving Systems Effectiveness in the Changing Environment of the '90s Pub Date : 1991-09-24 DOI: 10.1109/AUTEST.1991.197530
D. Filgas
{"title":"Laser beam divergence measurement using a large aperture diamond-turned collimator","authors":"D. Filgas","doi":"10.1109/AUTEST.1991.197530","DOIUrl":"https://doi.org/10.1109/AUTEST.1991.197530","url":null,"abstract":"The process of diamond-turning makes possible the manufacture of large-aperture, long effective-focal-length collimators that are compact and lightweight. These properties make such collimators an excellent choice for automated testing of military electrooptical sensor systems. A series of experiments which were performed to analyze the use of diamond-tuned collimators in laser beam divergence measurements are discussed. The experiments show that beam divergence can be measured to high accuracy using diamond-turned collimators.<<ETX>>","PeriodicalId":320001,"journal":{"name":"Conference Record AUTOTESTCON '91 IEEE Systems Readiness Technology Conference Improving Systems Effectiveness in the Changing Environment of the '90s","volume":"9 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-09-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114623823","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Standardizing operational flight data handling 标准化运营飞行数据处理
Conference Record AUTOTESTCON '91 IEEE Systems Readiness Technology Conference Improving Systems Effectiveness in the Changing Environment of the '90s Pub Date : 1991-09-24 DOI: 10.1109/AUTEST.1991.197535
F. Shows, J. Ayala, P. Breaux
{"title":"Standardizing operational flight data handling","authors":"F. Shows, J. Ayala, P. Breaux","doi":"10.1109/AUTEST.1991.197535","DOIUrl":"https://doi.org/10.1109/AUTEST.1991.197535","url":null,"abstract":"Improving system effectiveness through standardization of data transfer operations required to support avionics systems is an objective of the San Antonio Air Logistics Center (SA-ALC). The Digital Computer System (DCS) was developed in response to this objective. This automated support system standardizes the loading, unloading, and verification of operational flight information transferred to and from avionic systems. The SA-ALC has estimated that this should save the US Air Force a minimum of two million dollars in the first year of deployment as the replacement of multiple outdated data transfer systems.<<ETX>>","PeriodicalId":320001,"journal":{"name":"Conference Record AUTOTESTCON '91 IEEE Systems Readiness Technology Conference Improving Systems Effectiveness in the Changing Environment of the '90s","volume":"96 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-09-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127617385","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
An approach to intelligent integrated diagnostic design tools 智能集成诊断设计工具的一种方法
Conference Record AUTOTESTCON '91 IEEE Systems Readiness Technology Conference Improving Systems Effectiveness in the Changing Environment of the '90s Pub Date : 1991-09-24 DOI: 10.1109/AUTEST.1991.197569
S. Ofsthun
{"title":"An approach to intelligent integrated diagnostic design tools","authors":"S. Ofsthun","doi":"10.1109/AUTEST.1991.197569","DOIUrl":"https://doi.org/10.1109/AUTEST.1991.197569","url":null,"abstract":"Integrated diagnostics (ID) is a structured process which maximizes the effectiveness of diagnostics by integrating pertinent elements such as testability, automatic and manual testing, training, maintenance aiding, and technical information as a means for providing a cost-effective capability to detect and unambiguously isolate all faults known or expected to occur in weapon systems and equipment and to satisfy weapon system mission requirements. The products of this process are hardware, software, documentations, and trained personnel. The author focuses on those tasks which directly affect, or are fundamentally affected by, the diagnostic design of the system.<<ETX>>","PeriodicalId":320001,"journal":{"name":"Conference Record AUTOTESTCON '91 IEEE Systems Readiness Technology Conference Improving Systems Effectiveness in the Changing Environment of the '90s","volume":"318 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-09-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131968236","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 5
On computing the detection probability of stuck-at faults in a combinational circuit 组合电路卡死故障检测概率的计算
Conference Record AUTOTESTCON '91 IEEE Systems Readiness Technology Conference Improving Systems Effectiveness in the Changing Environment of the '90s Pub Date : 1991-09-24 DOI: 10.1109/AUTEST.1991.197566
B. Phillips
{"title":"On computing the detection probability of stuck-at faults in a combinational circuit","authors":"B. Phillips","doi":"10.1109/AUTEST.1991.197566","DOIUrl":"https://doi.org/10.1109/AUTEST.1991.197566","url":null,"abstract":"In the context of random testing and testability analysis of combinatorial circuits, the author presents a reduced-search-space method for computing the exact detection probability of stuck-at faults. The proposed method is simple, search-oriented, and subexponential in the number of input variables of the circuit. A Prolog implementation is given.<<ETX>>","PeriodicalId":320001,"journal":{"name":"Conference Record AUTOTESTCON '91 IEEE Systems Readiness Technology Conference Improving Systems Effectiveness in the Changing Environment of the '90s","volume":"10 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-09-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123834957","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
Testing a mixed signal board using cost effective VXI bus test technologies-A case study 使用具有成本效益的VXI总线测试技术测试混合信号板-一个案例研究
Conference Record AUTOTESTCON '91 IEEE Systems Readiness Technology Conference Improving Systems Effectiveness in the Changing Environment of the '90s Pub Date : 1991-09-24 DOI: 10.1109/AUTEST.1991.197564
J. Epstein
{"title":"Testing a mixed signal board using cost effective VXI bus test technologies-A case study","authors":"J. Epstein","doi":"10.1109/AUTEST.1991.197564","DOIUrl":"https://doi.org/10.1109/AUTEST.1991.197564","url":null,"abstract":"A VXIbus system consisting of digital functional test modules and a high-speed oscilloscope was evaluated as a primary test platform. Bus emulation was used to apply test vectors over the high-speed bus to the graphics card under test. Test vectors were generated using the design simulation and prototype hardware. The process of developing the tests is reviewed, and the pros and cons of this methodology versus the hot mock up technique previously used are discussed.<<ETX>>","PeriodicalId":320001,"journal":{"name":"Conference Record AUTOTESTCON '91 IEEE Systems Readiness Technology Conference Improving Systems Effectiveness in the Changing Environment of the '90s","volume":"187 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-09-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134429814","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Operating system interface for MATE (OSIM): A technical overview 用于MATE (OSIM)的操作系统接口:技术概述
Conference Record AUTOTESTCON '91 IEEE Systems Readiness Technology Conference Improving Systems Effectiveness in the Changing Environment of the '90s Pub Date : 1991-09-24 DOI: 10.1109/AUTEST.1991.197590
C. Wood, R. Krupa
{"title":"Operating system interface for MATE (OSIM): A technical overview","authors":"C. Wood, R. Krupa","doi":"10.1109/AUTEST.1991.197590","DOIUrl":"https://doi.org/10.1109/AUTEST.1991.197590","url":null,"abstract":"Four areas of the OSIM (operating system interface for MATE) concept are discussed. The OSIM system architecture is described. OSIM's functional objectives, including OSIM's relationship to the POSIX standard, MCSS (MATE control and support software) rehost requirements, technical benefits in terms of technology insertion, and OSIM's impact on MATE systems performance, are discussed. It is shown that the OSIM's concept, and specifically MCSS Versions 6.0 and 7.0, represented major advances in MATE. In terms of cost, the concept represents reductions in ATE acquisition, maintenance, and total life-cycle cost.<<ETX>>","PeriodicalId":320001,"journal":{"name":"Conference Record AUTOTESTCON '91 IEEE Systems Readiness Technology Conference Improving Systems Effectiveness in the Changing Environment of the '90s","volume":"26 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-09-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134194935","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Computer controlled hydraulic component test equipment: Friend or foe 计算机控制的液压元件测试设备:是敌是友
Conference Record AUTOTESTCON '91 IEEE Systems Readiness Technology Conference Improving Systems Effectiveness in the Changing Environment of the '90s Pub Date : 1991-09-24 DOI: 10.1109/AUTEST.1991.197559
D.M. Abood
{"title":"Computer controlled hydraulic component test equipment: Friend or foe","authors":"D.M. Abood","doi":"10.1109/AUTEST.1991.197559","DOIUrl":"https://doi.org/10.1109/AUTEST.1991.197559","url":null,"abstract":"A user's perspective on the experiences associated with long-term use of automated hydraulic test stations is presented. An overview of anticipated goals is presented. The focus is on minimizing test time and operator intervention and reducing the skill level required. The automation process includes advanced techniques to offer the operator menu-driven options that permit linear advancement through the program as well as branching to other modes and subroutines. Real world benefits are explored, and realized and missed improvements or gains over manual counterparts are highlighted.<<ETX>>","PeriodicalId":320001,"journal":{"name":"Conference Record AUTOTESTCON '91 IEEE Systems Readiness Technology Conference Improving Systems Effectiveness in the Changing Environment of the '90s","volume":"76 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-09-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130133718","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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