{"title":"On computing the detection probability of stuck-at faults in a combinational circuit","authors":"B. Phillips","doi":"10.1109/AUTEST.1991.197566","DOIUrl":null,"url":null,"abstract":"In the context of random testing and testability analysis of combinatorial circuits, the author presents a reduced-search-space method for computing the exact detection probability of stuck-at faults. The proposed method is simple, search-oriented, and subexponential in the number of input variables of the circuit. A Prolog implementation is given.<<ETX>>","PeriodicalId":320001,"journal":{"name":"Conference Record AUTOTESTCON '91 IEEE Systems Readiness Technology Conference Improving Systems Effectiveness in the Changing Environment of the '90s","volume":"10 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1991-09-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Conference Record AUTOTESTCON '91 IEEE Systems Readiness Technology Conference Improving Systems Effectiveness in the Changing Environment of the '90s","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/AUTEST.1991.197566","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 3
Abstract
In the context of random testing and testability analysis of combinatorial circuits, the author presents a reduced-search-space method for computing the exact detection probability of stuck-at faults. The proposed method is simple, search-oriented, and subexponential in the number of input variables of the circuit. A Prolog implementation is given.<>