{"title":"使用具有成本效益的VXI总线测试技术测试混合信号板-一个案例研究","authors":"J. Epstein","doi":"10.1109/AUTEST.1991.197564","DOIUrl":null,"url":null,"abstract":"A VXIbus system consisting of digital functional test modules and a high-speed oscilloscope was evaluated as a primary test platform. Bus emulation was used to apply test vectors over the high-speed bus to the graphics card under test. Test vectors were generated using the design simulation and prototype hardware. The process of developing the tests is reviewed, and the pros and cons of this methodology versus the hot mock up technique previously used are discussed.<<ETX>>","PeriodicalId":320001,"journal":{"name":"Conference Record AUTOTESTCON '91 IEEE Systems Readiness Technology Conference Improving Systems Effectiveness in the Changing Environment of the '90s","volume":"187 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1991-09-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Testing a mixed signal board using cost effective VXI bus test technologies-A case study\",\"authors\":\"J. Epstein\",\"doi\":\"10.1109/AUTEST.1991.197564\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A VXIbus system consisting of digital functional test modules and a high-speed oscilloscope was evaluated as a primary test platform. Bus emulation was used to apply test vectors over the high-speed bus to the graphics card under test. Test vectors were generated using the design simulation and prototype hardware. The process of developing the tests is reviewed, and the pros and cons of this methodology versus the hot mock up technique previously used are discussed.<<ETX>>\",\"PeriodicalId\":320001,\"journal\":{\"name\":\"Conference Record AUTOTESTCON '91 IEEE Systems Readiness Technology Conference Improving Systems Effectiveness in the Changing Environment of the '90s\",\"volume\":\"187 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1991-09-24\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Conference Record AUTOTESTCON '91 IEEE Systems Readiness Technology Conference Improving Systems Effectiveness in the Changing Environment of the '90s\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/AUTEST.1991.197564\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Conference Record AUTOTESTCON '91 IEEE Systems Readiness Technology Conference Improving Systems Effectiveness in the Changing Environment of the '90s","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/AUTEST.1991.197564","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Testing a mixed signal board using cost effective VXI bus test technologies-A case study
A VXIbus system consisting of digital functional test modules and a high-speed oscilloscope was evaluated as a primary test platform. Bus emulation was used to apply test vectors over the high-speed bus to the graphics card under test. Test vectors were generated using the design simulation and prototype hardware. The process of developing the tests is reviewed, and the pros and cons of this methodology versus the hot mock up technique previously used are discussed.<>