发布求助
文献互助 智能选刊 最新文献

Conference Record AUTOTESTCON '91 IEEE Systems Readiness Technology Conference Improving Systems Effectiveness in the Changing Environment of the '90s最新文献

筛选
英文 中文
Commanders independent thermal viewer and hull/turret electronics unit-built-in test and diagnostics: Two different approaches to meeting the M1A2 supportability requirements 指挥官独立的热观测器和船体/炮塔内置电子单元测试和诊断:两种不同的方法来满足M1A2的可支持性要求
Conference Record AUTOTESTCON '91 IEEE Systems Readiness Technology Conference Improving Systems Effectiveness in the Changing Environment of the '90s Pub Date : 1991-09-24 DOI: 10.1109/AUTEST.1991.197525
R. Sallade
{"title":"Commanders independent thermal viewer and hull/turret electronics unit-built-in test and diagnostics: Two different approaches to meeting the M1A2 supportability requirements","authors":"R. Sallade","doi":"10.1109/AUTEST.1991.197525","DOIUrl":"https://doi.org/10.1109/AUTEST.1991.197525","url":null,"abstract":"Two subsystems have been developed for the General Dynamics M1A2 Main Battle Tank. They are the commander's independent thermal viewer (CITV) and the hull/turret electronics unit (H/TEU). The built-in test and embedded diagnostics for each of these systems support the requirements for elimination of special test equipment at the tank level, and use of standard Army test equipment for test and repair at higher echelons of maintenance. The implementation of built-in test/diagnostics in these two systems was quite different, despite the fact that the functional requirements were identical.<<ETX>>","PeriodicalId":320001,"journal":{"name":"Conference Record AUTOTESTCON '91 IEEE Systems Readiness Technology Conference Improving Systems Effectiveness in the Changing Environment of the '90s","volume":"41 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-09-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121801860","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
A streamlined ATS requirements definition strategy 精简的ATS需求定义策略
Conference Record AUTOTESTCON '91 IEEE Systems Readiness Technology Conference Improving Systems Effectiveness in the Changing Environment of the '90s Pub Date : 1991-09-24 DOI: 10.1109/AUTEST.1991.197575
T. Leverette, G. Touchette
{"title":"A streamlined ATS requirements definition strategy","authors":"T. Leverette, G. Touchette","doi":"10.1109/AUTEST.1991.197575","DOIUrl":"https://doi.org/10.1109/AUTEST.1991.197575","url":null,"abstract":"How concurrent engineering principles, combined with a computer-aided information management tool, can help to streamline the ATS (automatic test system) requirements definition process is demonstrated. To fill this need, development was initiated of an optimized ATS acquisition process with a computer-aided road map which focuses on ATS requirement definition problems. A brief discussion of some problems in current ATS requirements definition methods is presented. The authors present the basic concepts of TQM, (total quality control), CALS (computer-aided acquisition logistic support), and concurrent engineering, and discuss how these principles have been used to improve ATS requirement definition.<<ETX>>","PeriodicalId":320001,"journal":{"name":"Conference Record AUTOTESTCON '91 IEEE Systems Readiness Technology Conference Improving Systems Effectiveness in the Changing Environment of the '90s","volume":"24 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-09-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121357672","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
AI-ESTATE-a standard for the 1990s and beyond ai - estate——20世纪90年代及以后的标准
Conference Record AUTOTESTCON '91 IEEE Systems Readiness Technology Conference Improving Systems Effectiveness in the Changing Environment of the '90s Pub Date : 1991-09-24 DOI: 10.1109/AUTEST.1991.197553
L. Orlidge
{"title":"AI-ESTATE-a standard for the 1990s and beyond","authors":"L. Orlidge","doi":"10.1109/AUTEST.1991.197553","DOIUrl":"https://doi.org/10.1109/AUTEST.1991.197553","url":null,"abstract":"AI-ESTATE stands for Artificial Intelligence-Expert System Tie to Automatic Test Equipment. AI-ESTATE defines the interfaces between a generic expert system model and its users, target test equipment, and external knowledge bases and databases. The author defines AI-ESTATE, and discusses its background history, long-term goals, and architecture, and the plan of action for developing the standard.<<ETX>>","PeriodicalId":320001,"journal":{"name":"Conference Record AUTOTESTCON '91 IEEE Systems Readiness Technology Conference Improving Systems Effectiveness in the Changing Environment of the '90s","volume":"19 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-09-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116150410","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
At-speed verification technique for LRMs and PCBs lrm和pcb的快速验证技术
Conference Record AUTOTESTCON '91 IEEE Systems Readiness Technology Conference Improving Systems Effectiveness in the Changing Environment of the '90s Pub Date : 1991-09-24 DOI: 10.1109/AUTEST.1991.197548
J.M. Nagy
{"title":"At-speed verification technique for LRMs and PCBs","authors":"J.M. Nagy","doi":"10.1109/AUTEST.1991.197548","DOIUrl":"https://doi.org/10.1109/AUTEST.1991.197548","url":null,"abstract":"A method is presented to perform at-speed verification and parametric evaluation of an LRM (line replaceable module) by testing the module to verify its form, fit, function, and interface (F31) characteristics. A demonstration of this methodology was conducted, utilizing a VLSI component tester as a display of this capability. The LRM demonstration was conducted on two distinct VLS test systems to verify the portability of using standard data formats and the concept of tester independence. The data format for capturing of the test requirements is the proposed IEEE standard TRSL (Test Requirement Specification Language) and the test vector information used the IEEE standard WAVES (Waveform and Vector Exchange Specification) format.<<ETX>>","PeriodicalId":320001,"journal":{"name":"Conference Record AUTOTESTCON '91 IEEE Systems Readiness Technology Conference Improving Systems Effectiveness in the Changing Environment of the '90s","volume":"22 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-09-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114511802","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
Improving system effectiveness at the advanced electronics technology center 提高先进电子技术中心的系统效率
Conference Record AUTOTESTCON '91 IEEE Systems Readiness Technology Conference Improving Systems Effectiveness in the Changing Environment of the '90s Pub Date : 1991-09-24 DOI: 10.1109/AUTEST.1991.197578
G. Natsuhara, E. Campbell
{"title":"Improving system effectiveness at the advanced electronics technology center","authors":"G. Natsuhara, E. Campbell","doi":"10.1109/AUTEST.1991.197578","DOIUrl":"https://doi.org/10.1109/AUTEST.1991.197578","url":null,"abstract":"The capabilities of the Air Force Logistics Command's Sacramento Air Logistics Center (SM-ALC), which provides weapon system support by developing solutions for electronics problems, are described. The applications of the design-for-testability approach in the F-111 Digital Computer Complex VHSIC insertion project are examined. The VHSIC Hardware Description Language (VHDL) and efforts underway to develop the capability to support the VHDL workload are discussed.<<ETX>>","PeriodicalId":320001,"journal":{"name":"Conference Record AUTOTESTCON '91 IEEE Systems Readiness Technology Conference Improving Systems Effectiveness in the Changing Environment of the '90s","volume":"12 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-09-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114888757","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Using integrated diagnostics on automatic test equipment 在自动测试设备上使用集成诊断
Conference Record AUTOTESTCON '91 IEEE Systems Readiness Technology Conference Improving Systems Effectiveness in the Changing Environment of the '90s Pub Date : 1991-09-24 DOI: 10.1109/AUTEST.1991.197571
J. R. Franco
{"title":"Using integrated diagnostics on automatic test equipment","authors":"J. R. Franco","doi":"10.1109/AUTEST.1991.197571","DOIUrl":"https://doi.org/10.1109/AUTEST.1991.197571","url":null,"abstract":"The author addresses the use of integrated diagnostic tools and techniques as applied to automatic test equipment (ATE) and test program sets (TPSs). The use of the tools provided as part of the integrated diagnostic support system (IDSS), namely, the weapon system testability analyzer (WSTA), the adaptive diagnostic system (ADS), and the use of electronic data delivery for technical documentation, is addressed.<<ETX>>","PeriodicalId":320001,"journal":{"name":"Conference Record AUTOTESTCON '91 IEEE Systems Readiness Technology Conference Improving Systems Effectiveness in the Changing Environment of the '90s","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-09-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128716946","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
ADAing and ABETing TPS portability 增强和增强TPS可移植性
Conference Record AUTOTESTCON '91 IEEE Systems Readiness Technology Conference Improving Systems Effectiveness in the Changing Environment of the '90s Pub Date : 1991-09-24 DOI: 10.1109/AUTEST.1991.197544
M.D. Walters, P. A. Cundiff
{"title":"ADAing and ABETing TPS portability","authors":"M.D. Walters, P. A. Cundiff","doi":"10.1109/AUTEST.1991.197544","DOIUrl":"https://doi.org/10.1109/AUTEST.1991.197544","url":null,"abstract":"Specific Ada constructs that decrease TPS portability are discussed. A portion of the Ada language specification contains machine-dependent features that may or may not be implemented by Ada compiler vendors. Ada language constructs can also be used to bypass the defined ABET interfaces (ATLAS/Ada based environment for test). Typical usage of these constructs and problems associated with them are described. Adherence to the ABET standards and to the recommendations presented should increase transportability and improve maintainability.<<ETX>>","PeriodicalId":320001,"journal":{"name":"Conference Record AUTOTESTCON '91 IEEE Systems Readiness Technology Conference Improving Systems Effectiveness in the Changing Environment of the '90s","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-09-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122666920","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Automatic production test equipment (APTE) for the B-2 B-2的自动生产测试设备(APTE)
Conference Record AUTOTESTCON '91 IEEE Systems Readiness Technology Conference Improving Systems Effectiveness in the Changing Environment of the '90s Pub Date : 1991-09-24 DOI: 10.1109/AUTEST.1991.197531
P. Robinson, R. Gillette, R. Tucker, B. Aust
{"title":"Automatic production test equipment (APTE) for the B-2","authors":"P. Robinson, R. Gillette, R. Tucker, B. Aust","doi":"10.1109/AUTEST.1991.197531","DOIUrl":"https://doi.org/10.1109/AUTEST.1991.197531","url":null,"abstract":"The automatic production test equipment (APTE) was developed to provide an integrated capability for seven test conductors and one chief test conductor to interactively test a system with bus architecture. Each test conductor has access to 35 data buses and a centralized database to generate stimuli and monitor responses from the vehicle subsystem. The chief test conductor resolves potential resource conflicts and monitors critical parameters for safety considerations. Test program development is accomplished using windows, graphics, and a menu-driven environment to eliminate the need for extensive operator training and software language skills.<<ETX>>","PeriodicalId":320001,"journal":{"name":"Conference Record AUTOTESTCON '91 IEEE Systems Readiness Technology Conference Improving Systems Effectiveness in the Changing Environment of the '90s","volume":"16 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-09-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126466523","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Integrating VXIbus-based RF test systems 集成基于vxibus的射频测试系统
Conference Record AUTOTESTCON '91 IEEE Systems Readiness Technology Conference Improving Systems Effectiveness in the Changing Environment of the '90s Pub Date : 1991-09-24 DOI: 10.1109/AUTEST.1991.197534
M. Levy
{"title":"Integrating VXIbus-based RF test systems","authors":"M. Levy","doi":"10.1109/AUTEST.1991.197534","DOIUrl":"https://doi.org/10.1109/AUTEST.1991.197534","url":null,"abstract":"VXIbus has received widespread acceptance as a means of improving performance and downsizing automatic test and measurement systems. However, there has been some reluctance to adopt it for all applications, particularly high-performance RF and microwave. A complete line of RF products featuring low-noise, highly shielded designs which offer the user a new spectrum of potential VXIbus applications is discussed. The user of high-performance RF test systems can now benefit from the size, speed, versatility, and financial advantages of VXIbus technology. The special areas of concern relating to RF and microwave integration and how VXIbus products can achieve the necessary performance are described.<<ETX>>","PeriodicalId":320001,"journal":{"name":"Conference Record AUTOTESTCON '91 IEEE Systems Readiness Technology Conference Improving Systems Effectiveness in the Changing Environment of the '90s","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-09-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129274903","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Integration of neural networks with diagnostic expert systems 神经网络与诊断专家系统的集成
Conference Record AUTOTESTCON '91 IEEE Systems Readiness Technology Conference Improving Systems Effectiveness in the Changing Environment of the '90s Pub Date : 1991-09-24 DOI: 10.1109/AUTEST.1991.197555
D. Hornig, R. Aschenbrenner, R. Enand
{"title":"Integration of neural networks with diagnostic expert systems","authors":"D. Hornig, R. Aschenbrenner, R. Enand","doi":"10.1109/AUTEST.1991.197555","DOIUrl":"https://doi.org/10.1109/AUTEST.1991.197555","url":null,"abstract":"The integration of expert system and neural network technologies is a promising approach to solving diagnostic and field service problems. A hybrid system has shown the feasibility of integrating these two technologies. It uses a neural network to perform an initial diagnosis via acoustic signal recognition, and uses an expert system to perform follow-up tests leading to a specific diagnosis. The hybrid successfully diagnoses a simulated mechanical fault using acoustic information and expert-level knowledge, demonstrating that a standard low-cost platform can support a combination of neural network, expert system, and data acquisition software. This hybrid technology has potential applications in diagnostics and prognostics applications where the available diagnostic evidence includes both signal and symbolic information. The hybrid technology is particularly appropriate for situations that require rapid development and cost-effective maintenance of the diagnostic system.<<ETX>>","PeriodicalId":320001,"journal":{"name":"Conference Record AUTOTESTCON '91 IEEE Systems Readiness Technology Conference Improving Systems Effectiveness in the Changing Environment of the '90s","volume":"65 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-09-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129301621","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
首页 上一页 下一页 尾页
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整，为了账户安全，请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
请完成安全验证×
相关产品
×
本文献相关产品
联系我们：info@booksci.cn Book学术提供免费学术资源搜索服务，方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号：604180095
Book学术官方微信