{"title":"基于红外能量发射的人工神经网络印刷电路板诊断系统","authors":"H. Spence, D. Burris, J. Lopez, R. A. Houston","doi":"10.1109/AUTEST.1991.197528","DOIUrl":null,"url":null,"abstract":"A diagnostic method based on the infrared emissions of an electronic system is presented. Steps required to acquire thermal information reduce it to a manageable size, and form diagnostic decisions are discussed. The shortfalls of conventional ATE which may be improved by this approach are identified.<<ETX>>","PeriodicalId":320001,"journal":{"name":"Conference Record AUTOTESTCON '91 IEEE Systems Readiness Technology Conference Improving Systems Effectiveness in the Changing Environment of the '90s","volume":"9 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1991-09-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"15","resultStr":"{\"title\":\"An artificial neural network printed circuit board diagnostic system based on infrared energy emissions\",\"authors\":\"H. Spence, D. Burris, J. Lopez, R. A. Houston\",\"doi\":\"10.1109/AUTEST.1991.197528\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A diagnostic method based on the infrared emissions of an electronic system is presented. Steps required to acquire thermal information reduce it to a manageable size, and form diagnostic decisions are discussed. The shortfalls of conventional ATE which may be improved by this approach are identified.<<ETX>>\",\"PeriodicalId\":320001,\"journal\":{\"name\":\"Conference Record AUTOTESTCON '91 IEEE Systems Readiness Technology Conference Improving Systems Effectiveness in the Changing Environment of the '90s\",\"volume\":\"9 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1991-09-24\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"15\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Conference Record AUTOTESTCON '91 IEEE Systems Readiness Technology Conference Improving Systems Effectiveness in the Changing Environment of the '90s\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/AUTEST.1991.197528\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Conference Record AUTOTESTCON '91 IEEE Systems Readiness Technology Conference Improving Systems Effectiveness in the Changing Environment of the '90s","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/AUTEST.1991.197528","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
An artificial neural network printed circuit board diagnostic system based on infrared energy emissions
A diagnostic method based on the infrared emissions of an electronic system is presented. Steps required to acquire thermal information reduce it to a manageable size, and form diagnostic decisions are discussed. The shortfalls of conventional ATE which may be improved by this approach are identified.<>