A common engineering-to-manufacturing-to-field test strategy to achieve systems readiness beyond the 1990s

Abstract

To achieve test program commonality an ATE (automated test equipment) architecture that provides a common platform for the separate test disciplines has been defined using integrating standards. This common ATE architecture is amenable to engineering electronics design so that prime equipment designers will use it in conjunction with design-for-test strategies for equipment proof-of-design and qualification testing. In its use for manufacturing test, the standard ATE architecture is functional (performance) test oriented (versus component or in-circuit) to ensure reusability of functional tests for depot return for issue purposes and fault isolation techniques. The common ATE architecture promises to integrate various program requirements imposed by differing field ATEs such as MATE, IFTE, CASS, and SMART into a unified factory solution.<>