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MELECON 2006 - 2006 IEEE Mediterranean Electrotechnical Conference最新文献

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A novel approach for segmentation of MRI brain images 一种新的MRI脑图像分割方法
MELECON 2006 - 2006 IEEE Mediterranean Electrotechnical Conference Pub Date : 2006-05-16 DOI: 10.1109/MELCON.2006.1653154
Jun Kong, Jianzhong Wang, Yinghua Lu, Jingdan Zhang, Yongli Li, Baoxue Zhang
{"title":"A novel approach for segmentation of MRI brain images","authors":"Jun Kong, Jianzhong Wang, Yinghua Lu, Jingdan Zhang, Yongli Li, Baoxue Zhang","doi":"10.1109/MELCON.2006.1653154","DOIUrl":"https://doi.org/10.1109/MELCON.2006.1653154","url":null,"abstract":"A novel method for segmentation of brain tissues in MRI (magnetic resonance imaging) images is proposed in this paper. First, we reduce noise using a versatile wavelet-based filter. Subsequently, watershed algorithm is applied to brain tissues as an initial segmenting method. Normally, the result of classical watershed algorithm on grey-scale textured images such as tissue images is over-segmentation. The following procedure is a merging process for the over-segmentation regions using fuzzy clustering algorithm (fuzzy C-means). But there are still some regions which are not divided completely, particularly in the transitional regions of gray matter and white matter, or cerebrospinal fluid and gray matter. This motivated the construction of a re-segmentation processing approach to partition these regions. We exploited a method base on minimum covariance determinant (MCD) estimator to detect the regions needed segmentation again, and then partition them by a supervised k-nearest neighbor (kNN) classifier. This integrated approach yields a robust and precise segmentation. The efficacy of the proposed algorithm is validated using extensive experiments","PeriodicalId":299928,"journal":{"name":"MELECON 2006 - 2006 IEEE Mediterranean Electrotechnical Conference","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2006-05-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130091449","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 33
A BV/sub CEO/ engineering in horizontal current bipolar transistor (HCBT) technology 水平电流双极晶体管(HCBT)技术的BV/sub CEO/工程
MELECON 2006 - 2006 IEEE Mediterranean Electrotechnical Conference Pub Date : 2006-05-16 DOI: 10.1109/MELCON.2006.1653055
T. Suligoj, M. Koričić, P. Biljanovic
{"title":"A BV/sub CEO/ engineering in horizontal current bipolar transistor (HCBT) technology","authors":"T. Suligoj, M. Koričić, P. Biljanovic","doi":"10.1109/MELCON.2006.1653055","DOIUrl":"https://doi.org/10.1109/MELCON.2006.1653055","url":null,"abstract":"A need for different breakdown voltages of vertical-current bipolar transistors on the same chip is accomplished by added process complexity and increased fabrication costs. In horizontal current bipolar transistor (HCBT) technology, the devices with different collector-emitter breakdown voltages (BVCEO) can be fabricated just by changing the mask dimensions, without any addition to process flow. Extrinsic base has a main effect on BVCEO due to charge sharing effect. Cutoff frequency and maximum frequency of oscillations of HCBT structures with different extrinsic base widths are measured together with BVCEO. The optimum fTBVCEO product of more than 100 GHzV is achieved at extrinsic base width of 0.8 mum. The charge sharing effect is analyzed by 2D simulations and the reduction of the peak electric field in the intrinsic region is shown. Moreover, the increase of BVCEO at low base currents is measured and explained by the current gain reduction due to SHR recombination in emitter-base depletion region. The breakdown occurs in different regions of HCBT structure at low and high currents","PeriodicalId":299928,"journal":{"name":"MELECON 2006 - 2006 IEEE Mediterranean Electrotechnical Conference","volume":"141 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2006-05-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134030734","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Metamaterial-based dual-band six-port front-end for direct digital QPSK transceiver 用于直接数字QPSK收发器的基于超材料的双频六端口前端
MELECON 2006 - 2006 IEEE Mediterranean Electrotechnical Conference Pub Date : 2006-05-16 DOI: 10.1109/MELCON.2006.1653114
H. Nguyen, C. Caloz
{"title":"Metamaterial-based dual-band six-port front-end for direct digital QPSK transceiver","authors":"H. Nguyen, C. Caloz","doi":"10.1109/MELCON.2006.1653114","DOIUrl":"https://doi.org/10.1109/MELCON.2006.1653114","url":null,"abstract":"A composite right/left-handed (CRLH) transmission line (TL) dual-band (DB) six-port front-end is presented. The two key components in the six-port front-end, i.e. a 90deg hybrid coupler and a power splitter, are designed using CRLH TL sections and therefore are capable of operating at two arbitrary frequencies. The novel DB six-port front-end is well suited to a direct digital transceiver","PeriodicalId":299928,"journal":{"name":"MELECON 2006 - 2006 IEEE Mediterranean Electrotechnical Conference","volume":"156 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2006-05-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131532597","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 5
Efficient ANN based noise modeling of microwave FETs against temperature 基于高效神经网络的微波场效应管温度噪声建模
MELECON 2006 - 2006 IEEE Mediterranean Electrotechnical Conference Pub Date : 2006-05-16 DOI: 10.1109/MELCON.2006.1653059
Z. Marinković, O. Pronić-Rančić, V. Markovic
{"title":"Efficient ANN based noise modeling of microwave FETs against temperature","authors":"Z. Marinković, O. Pronić-Rančić, V. Markovic","doi":"10.1109/MELCON.2006.1653059","DOIUrl":"https://doi.org/10.1109/MELCON.2006.1653059","url":null,"abstract":"An improved noise modeling technique for microwave MESFET/HEMT versus temperature is presented. It is based on an artificial neural network (ANN) that produces noise parameters as its outputs for device temperature, S parameters and frequency at its inputs. Once trained, the proposed model can be used for efficient prediction of transistor noise parameters over a wide temperature range. Since the model is based on ANN, all noise-generating mechanisms are included and therefore it is more accurate than empirical transistor models, as it is shown on a numerical example","PeriodicalId":299928,"journal":{"name":"MELECON 2006 - 2006 IEEE Mediterranean Electrotechnical Conference","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2006-05-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130870534","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
Impacts of grid-connected photovoltaic plant operation on the harmonic distortion 并网光伏电站运行对谐波畸变的影响
MELECON 2006 - 2006 IEEE Mediterranean Electrotechnical Conference Pub Date : 2006-05-16 DOI: 10.1109/MELCON.2006.1653234
F. Bătrînu, G. Chicco, J. Schlabbach, F. Spertino
{"title":"Impacts of grid-connected photovoltaic plant operation on the harmonic distortion","authors":"F. Bătrînu, G. Chicco, J. Schlabbach, F. Spertino","doi":"10.1109/MELCON.2006.1653234","DOIUrl":"https://doi.org/10.1109/MELCON.2006.1653234","url":null,"abstract":"This paper illustrates and discusses some specific aspects concerning the harmonic distortion occurring in the operation of photovoltaic (PV) plants. The time evolution of the individual, total and partially weighted harmonic distortion is evaluated for a multistring PV plant and for a sun-shield installation affected by the consequences of the shading effect in the morning hours of the day","PeriodicalId":299928,"journal":{"name":"MELECON 2006 - 2006 IEEE Mediterranean Electrotechnical Conference","volume":"36 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2006-05-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130906243","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 32
Second order TDTL performance analysis and FPGA implementation 二阶TDTL性能分析及FPGA实现
MELECON 2006 - 2006 IEEE Mediterranean Electrotechnical Conference Pub Date : 2006-05-16 DOI: 10.1109/MELCON.2006.1653151
M. Al-Qutayri, S. Al-Araji, N. Al-Moosa
{"title":"Second order TDTL performance analysis and FPGA implementation","authors":"M. Al-Qutayri, S. Al-Araji, N. Al-Moosa","doi":"10.1109/MELCON.2006.1653151","DOIUrl":"https://doi.org/10.1109/MELCON.2006.1653151","url":null,"abstract":"This paper presents the architecture, and the mathematical and simulation models of the second order time delay tanlock loop (TDTL). It discusses the transformation of the loop blocks and their subsequent implementation on an FPGA prototype system. The real time results of the FPGA based TDTL system are in agreement with those obtained from simulation. Compared with the first order, the response of the second order loop converges to zero but with a restricted locking range","PeriodicalId":299928,"journal":{"name":"MELECON 2006 - 2006 IEEE Mediterranean Electrotechnical Conference","volume":"167 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2006-05-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133685860","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
CBR-based Load Estimation for Distribution Networks 基于cbr的配电网负荷估计
MELECON 2006 - 2006 IEEE Mediterranean Electrotechnical Conference Pub Date : 2006-05-16 DOI: 10.1109/MELCON.2006.1653256
Jianzhong Wu, Yixin Yu
{"title":"CBR-based Load Estimation for Distribution Networks","authors":"Jianzhong Wu, Yixin Yu","doi":"10.1109/MELCON.2006.1653256","DOIUrl":"https://doi.org/10.1109/MELCON.2006.1653256","url":null,"abstract":"Load estimation is very important for management and control of complex distribution networks. A novel method based on case-based-reasoning (CBR) is proposed for distribution network nodal load estimation. Principle of the method is analyzed, a hybrid learning algorithm is presented, and its application is discussed. The CBR-based load estimation method can build nodes and connections for a fuzzy neural network dynamically by a rapid and incremental learning procedure and can withstand the effect of bad data effectively through network self-organizing. The method is a key component of an integrated load and state estimation framework. The proposed method is tested on a 33-node system whose nodal load data come from a practical system, and test results show that it can provide high quality nodal load estimates","PeriodicalId":299928,"journal":{"name":"MELECON 2006 - 2006 IEEE Mediterranean Electrotechnical Conference","volume":"61 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2006-05-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132759944","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 11
A New Approach of Hot-Carrier Degradation and Lifetime Prediction for N-MOS Transistors N-MOS晶体管热载流子退化及寿命预测新方法
MELECON 2006 - 2006 IEEE Mediterranean Electrotechnical Conference Pub Date : 2006-05-16 DOI: 10.1109/MELCON.2006.1653053
F. Kaçar, A. Kuntman, H. Kuntman
{"title":"A New Approach of Hot-Carrier Degradation and Lifetime Prediction for N-MOS Transistors","authors":"F. Kaçar, A. Kuntman, H. Kuntman","doi":"10.1109/MELCON.2006.1653053","DOIUrl":"https://doi.org/10.1109/MELCON.2006.1653053","url":null,"abstract":"In this paper the degradation in the drain current and threshold voltage of the N-MOS transistors are observed by operating the device under stress voltage conditions. Using the observation results the effect of hot-carriers was investigated statistically and a new statistical method for modeling was proposed to be an alternative to those given in the literature. The observed and the estimated values of the degradation are compared","PeriodicalId":299928,"journal":{"name":"MELECON 2006 - 2006 IEEE Mediterranean Electrotechnical Conference","volume":"20 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2006-05-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131305845","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
A sixport receiver's analog front-end for the K-band based on a rapid-prototyped PCB 基于快速原型PCB的六端口k波段接收器模拟前端
MELECON 2006 - 2006 IEEE Mediterranean Electrotechnical Conference Pub Date : 2006-05-16 DOI: 10.1109/MELCON.2006.1653113
A. Kolpin, S. Winter, Robert Weigel, T. Eireiner
{"title":"A sixport receiver's analog front-end for the K-band based on a rapid-prototyped PCB","authors":"A. Kolpin, S. Winter, Robert Weigel, T. Eireiner","doi":"10.1109/MELCON.2006.1653113","DOIUrl":"https://doi.org/10.1109/MELCON.2006.1653113","url":null,"abstract":"Within the scope of the research project presented in this paper an alternative architecture to mixing based receivers like hetero- or homodyne receivers is investigated: the sixport receiver. The theoretical aspects of the system concept are shown and the structure of the analog front-end is presented supported by measurement results. The analog front-end is based on a microwave circuit with a carrier frequency of 24 GHz and constructed as a PCB milled by a circuit board plotter","PeriodicalId":299928,"journal":{"name":"MELECON 2006 - 2006 IEEE Mediterranean Electrotechnical Conference","volume":"9 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2006-05-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127324730","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 8
Influence of Phase-Angle Jump on Inrush Currents of Transformers 相角跳变对变压器涌流的影响
MELECON 2006 - 2006 IEEE Mediterranean Electrotechnical Conference Pub Date : 2006-05-16 DOI: 10.1109/MELCON.2006.1653283
O.O. Gencer, S. Ozturk, H. T. Duru
{"title":"Influence of Phase-Angle Jump on Inrush Currents of Transformers","authors":"O.O. Gencer, S. Ozturk, H. T. Duru","doi":"10.1109/MELCON.2006.1653283","DOIUrl":"https://doi.org/10.1109/MELCON.2006.1653283","url":null,"abstract":"In power systems, the transients caused by the energization of the power transformers and the voltage sags are some of the more common problems. The voltage recovery after voltage sag can saturate the transformer and this saturation can produce an inrush current, which is similar to that of the energizing. In this paper transformer inrush currents resulting from voltage sags with and without phase jumps are experimentally analyzed. The analysis of the test results reveal that the peak value of the inrush current strictly depends on the phase jumps which are occurred during the voltage sags","PeriodicalId":299928,"journal":{"name":"MELECON 2006 - 2006 IEEE Mediterranean Electrotechnical Conference","volume":"74 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2006-05-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124276998","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
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