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2017 89th ARFTG Microwave Measurement Conference (ARFTG)最新文献

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High dynamic range DC coupled CW Doppler radar for accurate respiration characterization and identification 高动态范围直流耦合连续波多普勒雷达精确呼吸表征和识别
2017 89th ARFTG Microwave Measurement Conference (ARFTG) Pub Date : 2017-06-01 DOI: 10.1109/ARFTG.2017.8000828
Ashikur Rahman, V. Lubecke, E. Yavari, Xiaomeng Gao, O. Boric-Lubecke
{"title":"High dynamic range DC coupled CW Doppler radar for accurate respiration characterization and identification","authors":"Ashikur Rahman, V. Lubecke, E. Yavari, Xiaomeng Gao, O. Boric-Lubecke","doi":"10.1109/ARFTG.2017.8000828","DOIUrl":"https://doi.org/10.1109/ARFTG.2017.8000828","url":null,"abstract":"Accurate radar characterization of respiration can allow sleep diagnostics, and unique identification. A low distortion DC coupled system with high signal to noise ratio is required for such characterization and classification. This is especially critical with small signals as with through wall measurements with poor signal to noise ratio (SNR). This paper proposes a technique to improve signal to noise ratio by DC offset management and using the method of zooming in the fractions of the respiratory cycle waveform. Experimental results show a gain increment of 195 and 42% reduction of error in unique identification by complexity analysis techniques. Unique identification of human subjects behind walls has many potential applications such as, security, health monitoring, IoT applications, and virtual reality, and this technique can also benefit respiratory health diagnostics applications.","PeriodicalId":282023,"journal":{"name":"2017 89th ARFTG Microwave Measurement Conference (ARFTG)","volume":"25 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2017-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132134100","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 10
A review of the IEEE 1785 standards for rectangular waveguides above 110 GHz 110 GHz以上矩形波导的IEEE 1785标准综述
2017 89th ARFTG Microwave Measurement Conference (ARFTG) Pub Date : 2017-06-01 DOI: 10.1109/ARFTG.2017.8000830
N. Ridler, R. A. Ginleyt
{"title":"A review of the IEEE 1785 standards for rectangular waveguides above 110 GHz","authors":"N. Ridler, R. A. Ginleyt","doi":"10.1109/ARFTG.2017.8000830","DOIUrl":"https://doi.org/10.1109/ARFTG.2017.8000830","url":null,"abstract":"A new series of standards has recently been published by IEEE defining waveguide for use at millimeter-wave and terahertz frequencies. The series comprises three standards covering different aspects of this technology: (i) frequency bands and waveguide dimensions; (ii) waveguide interfaces; and (iii) recommendations for performance and uncertainty specifications. This paper describes each of these standards.","PeriodicalId":282023,"journal":{"name":"2017 89th ARFTG Microwave Measurement Conference (ARFTG)","volume":"131 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2017-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133758647","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 7
Cryogenic test fixture for two-port calibration at 4.2 K and above 低温测试夹具，用于在4.2 K及以上的双端口校准
2017 89th ARFTG Microwave Measurement Conference (ARFTG) Pub Date : 2017-06-01 DOI: 10.1109/ARFTG.2017.8000842
D. Oates, R. Slattery, D. Hover
{"title":"Cryogenic test fixture for two-port calibration at 4.2 K and above","authors":"D. Oates, R. Slattery, D. Hover","doi":"10.1109/ARFTG.2017.8000842","DOIUrl":"https://doi.org/10.1109/ARFTG.2017.8000842","url":null,"abstract":"A test fixture for full 2-port-calibrated, error-corrected measurements at cryogenic temperatures has been built and tested. Through-reflect-line (TRL) calibrations have been demonstrated at frequencies up to 4.5 GHz and at temperatures as low as 4.2 K. Calibrated measurements of both passive filters and active devices, amplifiers have been demonstrated. The calibration standards are collocated with the device under test. The calibration and device measurement can be accomplished in a single cooldown. Mechanical switches at the cold stage are used to switch in the TRL standards and the device under test. Measurements of the repeatability of the calibration will be discussed. The amplitude accuracy is approximately ± 0.03 dB.","PeriodicalId":282023,"journal":{"name":"2017 89th ARFTG Microwave Measurement Conference (ARFTG)","volume":"2 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2017-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115455988","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
A millimeter wave MIMO testbed for 5G communications 5G通信的毫米波MIMO测试平台
2017 89th ARFTG Microwave Measurement Conference (ARFTG) Pub Date : 2017-06-01 DOI: 10.1109/ARFTG.2017.8000845
T. Loh, D. Cheadle, P. Miller
{"title":"A millimeter wave MIMO testbed for 5G communications","authors":"T. Loh, D. Cheadle, P. Miller","doi":"10.1109/ARFTG.2017.8000845","DOIUrl":"https://doi.org/10.1109/ARFTG.2017.8000845","url":null,"abstract":"This paper presents a 2 × 2 millimeter wave (mm-wave) multiple-input-multiple-output (MIMO) testbed that operates at around 30 GHz. The link assessment of the system operating at 26.25 GHz was carried out on a test bench, with a short communication distance between the transmitting and receiving antennas. A user-programmable, reconfigurable and real-time signal processing field-programmable gate arrays (FPGAs)-based software defined radio (SDR) system was employed as part of the testbed to validate the system-level performance for a downlink time division long-term evolution (TD-LTE) duplex scheme. Constellation diagram for quadrature phase shift keying (QPSK) digital modulation were acquired while the testbed was operating at 30 GHz. The testbed could be employed for the development of signal test, communication algorithm and measurement metrology for 5G communications.","PeriodicalId":282023,"journal":{"name":"2017 89th ARFTG Microwave Measurement Conference (ARFTG)","volume":"38 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2017-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116686471","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 7
Pad-open-short de-embedding method extended for 3-port devices and non-ideal standards 扩展到3端口设备和非理想标准的Pad-open-short去嵌方法
2017 89th ARFTG Microwave Measurement Conference (ARFTG) Pub Date : 2017-06-01 DOI: 10.1109/ARFTG.2017.8000844
W. Khelifi, T. Reveyrand, J. Lintignat, B. Jarry, R. Quéré, L. Lapierre, V. Armengaud, D. Langrez
{"title":"Pad-open-short de-embedding method extended for 3-port devices and non-ideal standards","authors":"W. Khelifi, T. Reveyrand, J. Lintignat, B. Jarry, R. Quéré, L. Lapierre, V. Armengaud, D. Langrez","doi":"10.1109/ARFTG.2017.8000844","DOIUrl":"https://doi.org/10.1109/ARFTG.2017.8000844","url":null,"abstract":"This paper presents an extension of a three step de-embedding (Pad-Open-Short) method to a 3-port device for accurate on wafer MMIC S-parameters measurements. In the proposed method, an equivalent circuit-model using lumped elements is established according to the test-fixture. Furthermore, classical Pad-Open-Short method introduces systematic errors, observed beyond 20 GHz, due to perfect ‘Open’ and ‘Short’ standards assumption. This work also proposes a generalized Pad-Open-Short method with non-ideal standards. To validate the performance of this new method, reliable data were obtained from simulations and measurements of a GaAs transistor from UMS foundry operating up to 40 GHz.","PeriodicalId":282023,"journal":{"name":"2017 89th ARFTG Microwave Measurement Conference (ARFTG)","volume":"94 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2017-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130091951","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 6
A comparative analysis of the complexity/accuracy tradeoff in the mitigation of RF MIMO transmitter impairments 减轻射频MIMO发射机损伤的复杂性/精度权衡的比较分析
2017 89th ARFTG Microwave Measurement Conference (ARFTG) Pub Date : 2017-06-01 DOI: 10.1109/ARFTG.2017.8000827
Zain Ahmed Khan, P. Händel, M. Isaksson
{"title":"A comparative analysis of the complexity/accuracy tradeoff in the mitigation of RF MIMO transmitter impairments","authors":"Zain Ahmed Khan, P. Händel, M. Isaksson","doi":"10.1109/ARFTG.2017.8000827","DOIUrl":"https://doi.org/10.1109/ARFTG.2017.8000827","url":null,"abstract":"This paper presents a comparative analysis of the complexity accuracy tradeoff in state-of-the-art RF MIMO transmitter mitigation models. The complexity and accuracy of the candidate models depends on the basis functions considered in these models. Therefore, a brief description of the mitigation models is presented accompanied by derivations of the model complexities in terms of the number of FLOPs. Consequently, the complexity accuracy tradeoff in the candidate models is evaluated for a 2 × 2 RF MIMO transmitter. Furthermore, the model complexities are analyzed for increasing nonlinear orders and number of antennas.","PeriodicalId":282023,"journal":{"name":"2017 89th ARFTG Microwave Measurement Conference (ARFTG)","volume":"94 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2017-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131918294","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
Broadband microwave dielectric characterization method for printable dielectric inks 可印刷介质油墨的宽带微波介质表征方法
2017 89th ARFTG Microwave Measurement Conference (ARFTG) Pub Date : 2017-06-01 DOI: 10.1109/ARFTG.2017.8000849
E. Harper, Mahdi Haghzadeh, Ehsan Hajisaeid, C. Armiento, A. Akyurtlu
{"title":"Broadband microwave dielectric characterization method for printable dielectric inks","authors":"E. Harper, Mahdi Haghzadeh, Ehsan Hajisaeid, C. Armiento, A. Akyurtlu","doi":"10.1109/ARFTG.2017.8000849","DOIUrl":"https://doi.org/10.1109/ARFTG.2017.8000849","url":null,"abstract":"This work presents a parameter-related, one-probe based microwave characterization method for determining complex dielectric properties of various printable dielectric inks from 1–30 GHz. Dielectric constant and loss tangent of a material under test (MUT) are extracted utilizing the measured reflection 511-parameters and analyzed equivalent circuits of a cylindrical capacitor with and without the MUT. This method is also verified by HFSS simulations with predefined dielectric and loss tangent profiles. Both simulated and measured results show good agreement between the extracted data and predefined data. The method was implemented by microwave dielectric characterization of a commercially available dielectric ink. This commercial material was also characterized using a waveguide method developed by the National Institute of Standards and Technology (NIST) and a commercial based software. Results show good agreements between the complex dielectric properties obtained from our wideband printed technique and the banded waveguide technique.","PeriodicalId":282023,"journal":{"name":"2017 89th ARFTG Microwave Measurement Conference (ARFTG)","volume":"11 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2017-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114426566","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Setup and calibration procedure for LPE PA characterization with synchronous input-output excitations 同步输入输出激励下LPE PA特性的设置和校准程序
2017 89th ARFTG Microwave Measurement Conference (ARFTG) Pub Date : 2017-06-01 DOI: 10.1109/ARFTG.2017.8000836
Filipe M. Barradas, T. Cunha, J. Pedro
{"title":"Setup and calibration procedure for LPE PA characterization with synchronous input-output excitations","authors":"Filipe M. Barradas, T. Cunha, J. Pedro","doi":"10.1109/ARFTG.2017.8000836","DOIUrl":"https://doi.org/10.1109/ARFTG.2017.8000836","url":null,"abstract":"Modern transmitter architectures make use of multi-input multi-output (MIMO) techniques, employing a high number of RF power amplifiers (PAs) to excite an antenna array. The array elements are often coupled, creating an excitation at the output of the PAs, which is dependent on the outputs of the other elements. Therefore, in this system, the nonlinear behavior of each PA cannot be fully described solely as a function of its input. In order to characterize a device that will operate in this arrangement, it is important to develop setups that are capable of exciting the PA at the input and output, synchronously at the RF carrier (phase control) and envelope (delay control) levels, with correlated or independent amplitude and phase modulations. In this paper we propose a setup for this type of characterization and show how it can be calibrated to correct the frequency response of the observation paths and the excitation paths in a simple way using broadband modulated signals, covering the full measurement bandwidth.","PeriodicalId":282023,"journal":{"name":"2017 89th ARFTG Microwave Measurement Conference (ARFTG)","volume":"35 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2017-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127258284","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
A new interferometric sensor for scanning near-field microwave microscopy 一种用于扫描近场微波显微镜的新型干涉传感器
2017 89th ARFTG Microwave Measurement Conference (ARFTG) Pub Date : 2017-06-01 DOI: 10.1109/ARFTG.2017.8000829
K. Hoffmann, A. Baskakova
{"title":"A new interferometric sensor for scanning near-field microwave microscopy","authors":"K. Hoffmann, A. Baskakova","doi":"10.1109/ARFTG.2017.8000829","DOIUrl":"https://doi.org/10.1109/ARFTG.2017.8000829","url":null,"abstract":"A new microstrip sensor using the transmission interferometric measurement principle for scanning near-field microwave microscopy is presented. The structure originates from a Wilkinson power divider but has a resistor removed. The wideband design was verified by simulation using AWR Microwave Office and experimentally in frequency band of 45 MHz to 20 GHz. Ten times suppression of measurement uncertainties due to noise of a vector network analyzer was achieved. The structure is simple, cheap and mechanically stable with no moveable part.","PeriodicalId":282023,"journal":{"name":"2017 89th ARFTG Microwave Measurement Conference (ARFTG)","volume":"3 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2017-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124717127","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Load-pull measurements using Centroidal Voronoi Tessellation 使用质心Voronoi镶嵌的负载-拉力测量
2017 89th ARFTG Microwave Measurement Conference (ARFTG) Pub Date : 2017-06-01 DOI: 10.1109/ARFTG.2017.8000848
P. Barmuta, Konstanty Lukasik, F. Ferranti, G. P. Gibiino, A. Lewandowski, D. Schreurs
{"title":"Load-pull measurements using Centroidal Voronoi Tessellation","authors":"P. Barmuta, Konstanty Lukasik, F. Ferranti, G. P. Gibiino, A. Lewandowski, D. Schreurs","doi":"10.1109/ARFTG.2017.8000848","DOIUrl":"https://doi.org/10.1109/ARFTG.2017.8000848","url":null,"abstract":"In this paper, we propose the Centroidal Voronoi Tessellation as a design of experiments for load-pull measurements. Contrary to other designs of experiments common in load-pull measurements, the Centroidal Voronoi Tessellation directly aims at the most uniform coverage of the input space of variables. This allows minimizing the mean and maximum distance from any point of the space to the closest sample, and as such, maximizing the information gain. The Centroidal Voronoi Tessellation is evaluated in the load-pull measurements of an amplifier. It is shown that employing Centroidal Voronoi Tessellation enables reaching higher model accuracies within less samples, which minimizes the total time of the load-pull measurements.","PeriodicalId":282023,"journal":{"name":"2017 89th ARFTG Microwave Measurement Conference (ARFTG)","volume":"86 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2017-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133884823","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
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