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2017 89th ARFTG Microwave Measurement Conference (ARFTG)最新文献

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A novel experimental method for microwave dielectric characterization of flexible or rigid thin sheets 一种柔性或刚性薄片微波介电特性的新实验方法
2017 89th ARFTG Microwave Measurement Conference (ARFTG) Pub Date : 2017-06-09 DOI: 10.1109/ARFTG.2017.8000838
Ehsan Hajisaeid, A. Dericioglu, A. Akyurtlu
{"title":"A novel experimental method for microwave dielectric characterization of flexible or rigid thin sheets","authors":"Ehsan Hajisaeid, A. Dericioglu, A. Akyurtlu","doi":"10.1109/ARFTG.2017.8000838","DOIUrl":"https://doi.org/10.1109/ARFTG.2017.8000838","url":null,"abstract":"This work demonstrates a novel experimental method coupled with analytical extraction codes to determine dielectric properties of flexible or rigid thin sheets in a waveguide measurement setup. This method is based on measuring the transmission phase shift with and without the material under test which is placed in the middle of two polymeric sample holder blocks. These blocks are 3D printed according to the thickness of the thin sheet sample and the complex dielectric properties are calculated by removing the unwanted sample holder block effects. The method was verified by measuring four commercially available thin sheets in an X-band rectangular waveguide.","PeriodicalId":282023,"journal":{"name":"2017 89th ARFTG Microwave Measurement Conference (ARFTG)","volume":"33 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2017-06-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134080612","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Performance comparisons between impedance analyzers and vector network analyzers for impedance measurement below 100 MHz frequency 阻抗分析仪和矢量网络分析仪在100mhz频率以下阻抗测量的性能比较
2017 89th ARFTG Microwave Measurement Conference (ARFTG) Pub Date : 2017-06-09 DOI: 10.1109/ARFTG.2017.8000837
M. Horibe
{"title":"Performance comparisons between impedance analyzers and vector network analyzers for impedance measurement below 100 MHz frequency","authors":"M. Horibe","doi":"10.1109/ARFTG.2017.8000837","DOIUrl":"https://doi.org/10.1109/ARFTG.2017.8000837","url":null,"abstract":"We have investigated equivalency of the measurement performance between LCR meter, impedance analyzers and vector network analyzers. Each instrument measures impedance/reflection characteristics based on different theory of measurement operation. We adopted the error correction (calibration) model of reflect meter (vector network analysis) in all measurement by LCR meter, impedance analyzer and vector network analyzer. In the study, all measurement instrument has PC7 connector as test port (adapter convert to PC7 connector from 4 terminal pair for LCR meter and impedance analyzer) and it has been calibrated by open, short and load standard devices with PC7 connector. Then, offset short and two different impedance (VSWR 1.05 and 2.00) were measured and measurement results by each instrument were compared. All measurement result agreed to each other within the uncertainty (equivalency) in frequency range from 30 kHz to 100 MHz.","PeriodicalId":282023,"journal":{"name":"2017 89th ARFTG Microwave Measurement Conference (ARFTG)","volume":"6 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2017-06-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129018403","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 9
Quantifying the error contribution of noise parameters on Y-factor noise figure measurements 量化噪声参数对y因子噪声系数测量的误差贡献
2017 89th ARFTG Microwave Measurement Conference (ARFTG) Pub Date : 2017-06-09 DOI: 10.1109/ARFTG.2017.8000821
Ken Wong, J. Gorin, Guoquan Lu
{"title":"Quantifying the error contribution of noise parameters on Y-factor noise figure measurements","authors":"Ken Wong, J. Gorin, Guoquan Lu","doi":"10.1109/ARFTG.2017.8000821","DOIUrl":"https://doi.org/10.1109/ARFTG.2017.8000821","url":null,"abstract":"Low noise receivers are critical in telecommunication systems. Lower the noise, the less transmission power is required to receive a signal within a given distance. This has a major impact on energy consumption and hence longer battery life. Noise contribution of a receiver is often specified by its noise figure. It is the ratio of the signal to noise power ratio at the input, Si/Ni, to the signal to noise power ratio at the output, So/No. The Y-factor method is the most common technique for determining the Noise Figure (NF) or effective input noise temperature (Te) of a Device Under Test (DUT). One of the reasons for its popularity is its simplicity. It is easy to do. An important assumption was made to allow this simplicity, the measurement system is well match or very low reflection interactions. When the assumption of the Y-factor measurement method is not met, significant error will occur. This paper will introduce a way to estimate the mismatch errors and in particular the noise parameter effect of the noise source output match. A new model for predicting the added uncertainty caused by the reflection coefficient of the noise source will be presented.","PeriodicalId":282023,"journal":{"name":"2017 89th ARFTG Microwave Measurement Conference (ARFTG)","volume":"28 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2017-06-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133130080","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
Measurement of scaled complex enclosures for EMI applications 电磁干扰应用中缩放复杂外壳的测量
2017 89th ARFTG Microwave Measurement Conference (ARFTG) Pub Date : 2017-06-01 DOI: 10.1109/ARFTG.2017.8000846
Bo Xiao, S. Anlage
{"title":"Measurement of scaled complex enclosures for EMI applications","authors":"Bo Xiao, S. Anlage","doi":"10.1109/ARFTG.2017.8000846","DOIUrl":"https://doi.org/10.1109/ARFTG.2017.8000846","url":null,"abstract":"It is a challenge to measure electromagnetic wave interference (EMI) and compatibility (EMC) issues in complex structures that are electrically large. We have built a scaled test facility by reducing the size of the enclosures by a factor of s, increased the frequency of measurement by a factor of s, and increased the conductivity of the walls of the enclosure also by a factor of s. This results in an invariance of Maxwell's equations. The facility allows us to conveniently test the scaled equivalent of complex interconnected enclosure networks and other large structures. We report on results of a cryogenically cooled scaled enclosure and illustrate its properties as a function of temperature.","PeriodicalId":282023,"journal":{"name":"2017 89th ARFTG Microwave Measurement Conference (ARFTG)","volume":"42 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2017-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116721223","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
A phase reference standard free setup for two-path memory model identification of wideband power amplifier 一种用于宽带功率放大器双路存储器模型识别的无相位参考标准装置
2017 89th ARFTG Microwave Measurement Conference (ARFTG) Pub Date : 2017-06-01 DOI: 10.1109/ARFTG.2017.8000841
K. El-Akhdar, D. Gapillout, C. Mazière, S. Mons, E. Ngoya
{"title":"A phase reference standard free setup for two-path memory model identification of wideband power amplifier","authors":"K. El-Akhdar, D. Gapillout, C. Mazière, S. Mons, E. Ngoya","doi":"10.1109/ARFTG.2017.8000841","DOIUrl":"https://doi.org/10.1109/ARFTG.2017.8000841","url":null,"abstract":"This paper presents a measurement scenario for the indirect identification of long term memory kernel of the two-path memory behavioral model. The measurement principle is based on the use of a regular VNA setup and is applied here for the characterization and modeling of a LDMOS power amplifier. It has been experimentally demonstrated that this measurement principle allows an accurate model identification by performing a simple set of measurements. Extracted model proves the ability to provide a good prediction for complex communication signals.","PeriodicalId":282023,"journal":{"name":"2017 89th ARFTG Microwave Measurement Conference (ARFTG)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2017-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"117189753","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
Experimental testbed for PA characterization and pre-distortion with relaxed sampling rate requirements 具有放松采样率要求的PA特性和预失真实验测试平台
2017 89th ARFTG Microwave Measurement Conference (ARFTG) Pub Date : 2017-06-01 DOI: 10.1109/ARFTG.2017.8000819
P. Bagot, Souheil Ben Smida, O. Hammi
{"title":"Experimental testbed for PA characterization and pre-distortion with relaxed sampling rate requirements","authors":"P. Bagot, Souheil Ben Smida, O. Hammi","doi":"10.1109/ARFTG.2017.8000819","DOIUrl":"https://doi.org/10.1109/ARFTG.2017.8000819","url":null,"abstract":"This paper explores an interleaving approach to expand the effective sampling rate of analog-to-digital converters (ADCs) with application to power amplifier characterization and digital pre-distortion. By interleaving a known test signal, it is shown that a 250 MSPS ADC can be used to effectively sample at 2 GSPS, providing 1 GHz of observational bandwidth. A 200 MHz “stretched” LTE signal is then acquired using this technique, and digital pre-distortion is successfully applied to an amplifier under test to prove the concept.","PeriodicalId":282023,"journal":{"name":"2017 89th ARFTG Microwave Measurement Conference (ARFTG)","volume":"247 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2017-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123390234","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Mismatch uncertainty in RF & microwave power measurements 射频和微波功率测量中的失配不确定度
2017 89th ARFTG Microwave Measurement Conference (ARFTG) Pub Date : 2017-06-01 DOI: 10.1109/ARFTG.2017.8000847
H. Silva, G. Monasterios, A. Henze
{"title":"Mismatch uncertainty in RF & microwave power measurements","authors":"H. Silva, G. Monasterios, A. Henze","doi":"10.1109/ARFTG.2017.8000847","DOIUrl":"https://doi.org/10.1109/ARFTG.2017.8000847","url":null,"abstract":"In this paper we show the treatment of mismatch error terms in common RF & microwave measurements schemes. Uncertainty analysis is based on analytical methods and on GUM guidelines. Both approaches show significant differences due to linearization in the GUM method. Special Probability Density Functions (PDFs) must be asigned if the phase of the reflection coefficient is unknown.","PeriodicalId":282023,"journal":{"name":"2017 89th ARFTG Microwave Measurement Conference (ARFTG)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2017-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129217057","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Independent component analysis for multi-carrier transmission for 4G/5G power amplifiers 4G/5G功率放大器多载波传输的独立分量分析
2017 89th ARFTG Microwave Measurement Conference (ARFTG) Pub Date : 2017-06-01 DOI: 10.1109/ARFTG.2017.8000817
Praveen Jaruat, Girish Chandra Tripathi, M. Rawat, P. Roblin
{"title":"Independent component analysis for multi-carrier transmission for 4G/5G power amplifiers","authors":"Praveen Jaruat, Girish Chandra Tripathi, M. Rawat, P. Roblin","doi":"10.1109/ARFTG.2017.8000817","DOIUrl":"https://doi.org/10.1109/ARFTG.2017.8000817","url":null,"abstract":"This paper investigates the issues related to numerical stability and complexity of models for multi-carrier and carrier aggregated transmitted signal using wideband power amplifier and proposes independent component analysis (ICA) technique as a solution. It has been reported that ICA provides better numerical stability and lower dispersion of coefficients in established polynomial based models. The impact of this technique can be perceived in terms of reduction in memory requirement of FPGA while applying the DPD, as model coefficients can be represented in lower resolution (lesser bits) while maintaining model performance.","PeriodicalId":282023,"journal":{"name":"2017 89th ARFTG Microwave Measurement Conference (ARFTG)","volume":"25 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2017-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123620495","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 12
An accurate calibration method of microwave noise sources using noise wave de-embedding techniques 基于噪声波去嵌入技术的微波噪声源精确标定方法
2017 89th ARFTG Microwave Measurement Conference (ARFTG) Pub Date : 2017-06-01 DOI: 10.1109/ARFTG.2017.8000822
C. Tong, J. Connors, E. Garcia
{"title":"An accurate calibration method of microwave noise sources using noise wave de-embedding techniques","authors":"C. Tong, J. Connors, E. Garcia","doi":"10.1109/ARFTG.2017.8000822","DOIUrl":"https://doi.org/10.1109/ARFTG.2017.8000822","url":null,"abstract":"We present a rigorous procedure for calibrating the Excess Noise Ratio (ENR) of microwave noise sources based on noise wave de-embedding techniques. The test and reference sources are connected to a wideband power combiner feeding a low noise amplifier preceded by an attenuator. The expressions for the measured Y-factors are derived from the noise correlation matrices and the S-parameters of the power combiner and attenuator. The power combiner is expected to limit any measurement uncertainties because of its symmetry. A cyclical calibration procedure is used to demonstrate that this calibration method introduces ENR calibration uncertainties below 0.025 dB.","PeriodicalId":282023,"journal":{"name":"2017 89th ARFTG Microwave Measurement Conference (ARFTG)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2017-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130462104","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Complex permittivity measurement for a low loss dielectric rod using a novel 50 GHz band TM010 mode cavity 采用新型50 GHz频段TM010模腔测量低损耗介质杆的复介电常数
2017 89th ARFTG Microwave Measurement Conference (ARFTG) Pub Date : 2017-06-01 DOI: 10.1109/ARFTG.2017.8000840
Takashi Shimizu, Hikaru Inada, Y. Kogami
{"title":"Complex permittivity measurement for a low loss dielectric rod using a novel 50 GHz band TM010 mode cavity","authors":"Takashi Shimizu, Hikaru Inada, Y. Kogami","doi":"10.1109/ARFTG.2017.8000840","DOIUrl":"https://doi.org/10.1109/ARFTG.2017.8000840","url":null,"abstract":"Complex permittivity of a low loss dielectric rod are often evaluated by a perturbation method using a TM010 mode cavity in microwave region, since the method is an extremely simple and easy treatment for not only experts but also non-experts. However, there are few reported to apply the perturbation method using millimeter wave band because a cavity dimension of the scale model is too small and is not realistic for material evaluation. In this paper, a simple and easy measurement technique for a dielectric rod is proposed using novel 50-GHz band TM010 cavities based on an improved perturbation method. The measured results validate the accuracy and the usefulness for the proposed method and cavity.","PeriodicalId":282023,"journal":{"name":"2017 89th ARFTG Microwave Measurement Conference (ARFTG)","volume":"7 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2017-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124637785","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
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