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2017 89th ARFTG Microwave Measurement Conference (ARFTG)最新文献

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TRL-based measurement of active antennas and other more complex microwave structures 基于trl的有源天线和其他更复杂微波结构的测量
2017 89th ARFTG Microwave Measurement Conference (ARFTG) Pub Date : 2017-06-09 DOI: 10.1109/ARFTG.2017.8000834
P. Ourednik, Viktor Adler, P. Hudec
{"title":"TRL-based measurement of active antennas and other more complex microwave structures","authors":"P. Ourednik, Viktor Adler, P. Hudec","doi":"10.1109/ARFTG.2017.8000834","DOIUrl":"https://doi.org/10.1109/ARFTG.2017.8000834","url":null,"abstract":"A common approach to active antenna design consists of a passive radiator (intrinsic antenna) and an output or input amplifier; all situated on a single microwave board. Such designs show higher radiated power or lower noise floor resulting from low interconnecting line losses. However, since more microwave circuits are connected directly together on a single board, their testing is more difficult. In the given case, this concerns measurement of reflection coefficient of the passive radiator. Methods developed in frames of this work employ the VNA measurement and TRL cahbration, and enable one to evaluate radiator input reflection coefficient in a complete structure without need of any disconnecting or switching. Performed practical measurements show that results can be satisfactorily precise. Generally, the method can be applied for measurement of individual microwave circuits embedded in more complex system PCBs.","PeriodicalId":282023,"journal":{"name":"2017 89th ARFTG Microwave Measurement Conference (ARFTG)","volume":"5 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2017-06-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122123728","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Software tools for uncertainty evaluation in VNA measurements: A comparative study VNA测量中不确定度评估的软件工具:比较研究
2017 89th ARFTG Microwave Measurement Conference (ARFTG) Pub Date : 2017-06-09 DOI: 10.1109/ARFTG.2017.8000820
G. Avolio, D. Williams, S. Streett, M. Frey, D. Schreurs, A. Ferrero, M. Dieudonne
{"title":"Software tools for uncertainty evaluation in VNA measurements: A comparative study","authors":"G. Avolio, D. Williams, S. Streett, M. Frey, D. Schreurs, A. Ferrero, M. Dieudonne","doi":"10.1109/ARFTG.2017.8000820","DOIUrl":"https://doi.org/10.1109/ARFTG.2017.8000820","url":null,"abstract":"We compared three software tools designed for scattering-parameter measurement uncertainty evaluation. These tools propagate uncertainty to calibrated S-parameters by means of a sensitivity analysis. We also validated the sensitivity analysis with Monte-Carlo simulations performed with one of the software tools and the Keysight ADS circuit simulator.","PeriodicalId":282023,"journal":{"name":"2017 89th ARFTG Microwave Measurement Conference (ARFTG)","volume":"29 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2017-06-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121408909","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 12
SLIC EVM — Error vector magnitude without demodulation 无解调的误差矢量幅度
2017 89th ARFTG Microwave Measurement Conference (ARFTG) Pub Date : 2017-06-09 DOI: 10.1109/ARFTG.2017.8000826
Karl Freiberger, H. Enzinger, C. Vogel
{"title":"SLIC EVM — Error vector magnitude without demodulation","authors":"Karl Freiberger, H. Enzinger, C. Vogel","doi":"10.1109/ARFTG.2017.8000826","DOIUrl":"https://doi.org/10.1109/ARFTG.2017.8000826","url":null,"abstract":"We present a method for measuring a communication signal's inband error caused by a non-ideal device under test (DUT). In contrast to the established error vector magnitude (EVM), we do not demodulate the data symbols. Rather, we subtract linearly correlated (SLIC) parts from the DUT output and analyze the power spectral density of the remaining error signal. Consequently, we do not require in-depth knowledge of the modulation standard. This makes our method well suited for measurements with cutting-edge communication signals, without the need to purchase or implement a dedicated EVM analyzer. We show that our SLIC-EVM approach allows for estimating the subcarrier-dependent EVM for typical transceiver impairments like IQ mismatch, phase noise, and power amplifier (PA) nonlinearity. We present measurement results of a WLAN PA, showing less than 0.2 dB absolute deviation from the regular EVM with demodulation.","PeriodicalId":282023,"journal":{"name":"2017 89th ARFTG Microwave Measurement Conference (ARFTG)","volume":"67 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2017-06-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133276093","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
Coherent multi-tone stimulus-response measurements with a VNA 用VNA进行相干多音刺激反应测量
2017 89th ARFTG Microwave Measurement Conference (ARFTG) Pub Date : 2017-06-09 DOI: 10.1109/ARFTG.2017.8000824
J. Teyssier, J. Dunsmore, J. Verspecht, Jim Kerr
{"title":"Coherent multi-tone stimulus-response measurements with a VNA","authors":"J. Teyssier, J. Dunsmore, J. Verspecht, Jim Kerr","doi":"10.1109/ARFTG.2017.8000824","DOIUrl":"https://doi.org/10.1109/ARFTG.2017.8000824","url":null,"abstract":"Fast spectrum analysis in FFT mode is simultaneously performed with a modern VNA at the input and output ports of a DUT. The stimulus signal is a wideband repetitive multi-tone. The Spectrum Analyzer coherent mode of the VNA takes into account the repetition rate of the test signal. It adjusts its Fourier transform grid to match the stimulus tones. This coherent mode allows deterministic image rejection. The consequence is faster and more accurate multi tones measurements. Practical examples of NPR and ACPR measurements are given.","PeriodicalId":282023,"journal":{"name":"2017 89th ARFTG Microwave Measurement Conference (ARFTG)","volume":"52 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2017-06-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121452858","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
An automated fault detection program for multichannel bandwidth-limited system 多通道有限带宽系统故障自动检测程序
2017 89th ARFTG Microwave Measurement Conference (ARFTG) Pub Date : 2017-06-09 DOI: 10.1109/ARFTG.2017.8000835
Chi Van Pham, Benjamin Sawtelle, Stephen Imbach, A. Pham, Jironghe
{"title":"An automated fault detection program for multichannel bandwidth-limited system","authors":"Chi Van Pham, Benjamin Sawtelle, Stephen Imbach, A. Pham, Jironghe","doi":"10.1109/ARFTG.2017.8000835","DOIUrl":"https://doi.org/10.1109/ARFTG.2017.8000835","url":null,"abstract":"This paper develops a real-time automated fault detection interface and set-up for a multichannel bandwidth-limited system. This interface integrates both time domain reflectometry (TDR) and time domain transform (TDT) gating techniques which are combined with a signal analysis algorithm. Using a database of signal responses, the interface software can identify, locate and visualize positions of open, short and mismatched faults on a multiple-output system. In other words, the interface can simultaneously check the fault in the multichannel system with one step. Automated measurements were performed for a prototype of antenna system, which operates from 720 MHz to 960 MHz with one input channel and six output channels. Thus, it is possible that the testing solution can be replicated for similar multiple port systems.","PeriodicalId":282023,"journal":{"name":"2017 89th ARFTG Microwave Measurement Conference (ARFTG)","volume":"92 26 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2017-06-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125017581","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Ultra-wideband electromagnetic detection of biological cells 生物细胞的超宽带电磁检测
2017 89th ARFTG Microwave Measurement Conference (ARFTG) Pub Date : 2017-06-09 DOI: 10.1109/ARFTG.2017.8000831
N. Gholizadeh, X. Ma, H. Li, X. Du, Y. Ning, V. Gholizadeh, X. Cheng, J. Hwang
{"title":"Ultra-wideband electromagnetic detection of biological cells","authors":"N. Gholizadeh, X. Ma, H. Li, X. Du, Y. Ning, V. Gholizadeh, X. Cheng, J. Hwang","doi":"10.1109/ARFTG.2017.8000831","DOIUrl":"https://doi.org/10.1109/ARFTG.2017.8000831","url":null,"abstract":"Traditionally, electromagnetic detection of biological cells was conducted at either radio or microwave frequencies, which was sensitive to either cellular or subcellular properties, respectively. This paper reports for the first time a single sweep from megahertz to gigahertz frequencies so that cell viability, membrane capacitance, cytoplasm resistance, and cytoplasm capacitance could be determined simultaneously. These parameters were determined with the aid of simple cell model and equivalent circuit, despite great challenges in ultra-wideband measurement and analysis. Although the extracted parameter values for Jurkat T-lymphocytes human cells, live or dead, were consistent with that reported in the literature, more careful measurement and analysis are required in the future, especially for electromagnetic detection over an even wider bandwidth. In any case, the present analysis confirmed that it was easier to assess cell viability around 100 MHz but cytoplasm characteristics around 10 GHz.","PeriodicalId":282023,"journal":{"name":"2017 89th ARFTG Microwave Measurement Conference (ARFTG)","volume":"24 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2017-06-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125358151","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Digital predistortion for 5G wideband power amplifiers using multiple band-limited feedback signals 基于多带限反馈信号的5G宽带功率放大器的数字预失真
2017 89th ARFTG Microwave Measurement Conference (ARFTG) Pub Date : 2017-06-09 DOI: 10.1109/ARFTG.2017.8000818
Qian Zhang, Wen-hua Chen
{"title":"Digital predistortion for 5G wideband power amplifiers using multiple band-limited feedback signals","authors":"Qian Zhang, Wen-hua Chen","doi":"10.1109/ARFTG.2017.8000818","DOIUrl":"https://doi.org/10.1109/ARFTG.2017.8000818","url":null,"abstract":"This paper presents a digital predistortion (DPD) solution using multiple band-limited feedback signals for the characterization of wideband power amplifiers (PAs). By acquiring the feedback signals with band-limited filter and several different local oscillator frequencies, the feedback bandwidth is constrained to be much less than the bandwidth of input signal. Then the PA's forward model is extracted with these feedback signals jointly without spectrum combination, and the complete PA output without information loss can be restored based on the model parameters. Experimental results validate satisfied linearization performance on a 20GHz amplifier with 200MHz input signal, when the feedback bandwidth is constrained to 98.304 MHz. Thus, the bandwidth of the feedback loop can be reduced drastically in the presented method, which may be a linearization solution for the future 5G wideband scenarios.","PeriodicalId":282023,"journal":{"name":"2017 89th ARFTG Microwave Measurement Conference (ARFTG)","volume":"5 3 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2017-06-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116544858","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 7
VNA tools II: Calibrations involving eigenvalue problems VNA工具II:涉及特征值问题的校准
2017 89th ARFTG Microwave Measurement Conference (ARFTG) Pub Date : 2017-06-09 DOI: 10.1109/ARFTG.2017.8000832
M. Wollensack, J. Hoffmann, D. Stalder, J. Ruefenacht, M. Zeier
{"title":"VNA tools II: Calibrations involving eigenvalue problems","authors":"M. Wollensack, J. Hoffmann, D. Stalder, J. Ruefenacht, M. Zeier","doi":"10.1109/ARFTG.2017.8000832","DOIUrl":"https://doi.org/10.1109/ARFTG.2017.8000832","url":null,"abstract":"Many calibration algorithms for vector network analyzers using partially unknown standards can be stated as an eigenvalue problem. The construction of the eigenvalue problem is described and examples for line reflect match (LRM) and thru reflect line (TRL) calibrations are given. Advantages of the new algorithm are that all uncertainties can be taken into account and that it is fully analytic. A further advantage is that the same approach can be used for different calibration schemes. The algorithm is implemented in METAS VNA Tools II and METAS UncLib is used for the linear propagation of uncertainties.","PeriodicalId":282023,"journal":{"name":"2017 89th ARFTG Microwave Measurement Conference (ARFTG)","volume":"55 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2017-06-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121809551","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 6
Trends for computing VNA uncertainties 计算VNA不确定性的趋势
2017 89th ARFTG Microwave Measurement Conference (ARFTG) Pub Date : 2017-06-09 DOI: 10.1109/ARFTG.2017.8000833
D. Blackham
{"title":"Trends for computing VNA uncertainties","authors":"D. Blackham","doi":"10.1109/ARFTG.2017.8000833","DOIUrl":"https://doi.org/10.1109/ARFTG.2017.8000833","url":null,"abstract":"An understanding of measurement uncertainties is a critical element in evaluating the performance of a device under test (DUT). For a vector network analyzer (VNA), the measurement process includes a calibration process that significantly impacts and also complicates the estimation of DUT measurement uncertainty. This lead to the creation of software to assist in the estimation of measurement accuracy. This article discusses the legacy approach that was developed for the 8510 vector network analyzer and compares it to recent advances in VNA uncertainty computation which enable a better estimate of VNA measurement errors.","PeriodicalId":282023,"journal":{"name":"2017 89th ARFTG Microwave Measurement Conference (ARFTG)","volume":"279 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2017-06-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134344404","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
A method for improving high-insertion-loss measurements with a vector network analyzer 一种改进矢量网络分析仪高插入损耗测量的方法
2017 89th ARFTG Microwave Measurement Conference (ARFTG) Pub Date : 2017-06-09 DOI: 10.1109/ARFTG.2017.8000839
J. Jargon, Dylan F. Williams
{"title":"A method for improving high-insertion-loss measurements with a vector network analyzer","authors":"J. Jargon, Dylan F. Williams","doi":"10.1109/ARFTG.2017.8000839","DOIUrl":"https://doi.org/10.1109/ARFTG.2017.8000839","url":null,"abstract":"We present a method for improving high-insertion-loss measurements with a calibrated vector network analyzer (VNA) requiring only two additional pieces of hardware. By utilizing an amplifier and an attenuator, and measuring wave-parameters rather than scattering-parameters, we are able to increase the dynamic range of our measurements while decreasing uncertainties due to the noise floor of the VNA. We compare the results of our technique to standard methods for insertion-loss values up to 110 dB.","PeriodicalId":282023,"journal":{"name":"2017 89th ARFTG Microwave Measurement Conference (ARFTG)","volume":"26 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2017-06-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127612413","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
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