{"title":"计算VNA不确定性的趋势","authors":"D. Blackham","doi":"10.1109/ARFTG.2017.8000833","DOIUrl":null,"url":null,"abstract":"An understanding of measurement uncertainties is a critical element in evaluating the performance of a device under test (DUT). For a vector network analyzer (VNA), the measurement process includes a calibration process that significantly impacts and also complicates the estimation of DUT measurement uncertainty. This lead to the creation of software to assist in the estimation of measurement accuracy. This article discusses the legacy approach that was developed for the 8510 vector network analyzer and compares it to recent advances in VNA uncertainty computation which enable a better estimate of VNA measurement errors.","PeriodicalId":282023,"journal":{"name":"2017 89th ARFTG Microwave Measurement Conference (ARFTG)","volume":"279 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2017-06-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":"{\"title\":\"Trends for computing VNA uncertainties\",\"authors\":\"D. Blackham\",\"doi\":\"10.1109/ARFTG.2017.8000833\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"An understanding of measurement uncertainties is a critical element in evaluating the performance of a device under test (DUT). For a vector network analyzer (VNA), the measurement process includes a calibration process that significantly impacts and also complicates the estimation of DUT measurement uncertainty. This lead to the creation of software to assist in the estimation of measurement accuracy. This article discusses the legacy approach that was developed for the 8510 vector network analyzer and compares it to recent advances in VNA uncertainty computation which enable a better estimate of VNA measurement errors.\",\"PeriodicalId\":282023,\"journal\":{\"name\":\"2017 89th ARFTG Microwave Measurement Conference (ARFTG)\",\"volume\":\"279 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2017-06-09\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"4\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2017 89th ARFTG Microwave Measurement Conference (ARFTG)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ARFTG.2017.8000833\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2017 89th ARFTG Microwave Measurement Conference (ARFTG)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ARFTG.2017.8000833","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
An understanding of measurement uncertainties is a critical element in evaluating the performance of a device under test (DUT). For a vector network analyzer (VNA), the measurement process includes a calibration process that significantly impacts and also complicates the estimation of DUT measurement uncertainty. This lead to the creation of software to assist in the estimation of measurement accuracy. This article discusses the legacy approach that was developed for the 8510 vector network analyzer and compares it to recent advances in VNA uncertainty computation which enable a better estimate of VNA measurement errors.
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