G. Avolio, D. Williams, S. Streett, M. Frey, D. Schreurs, A. Ferrero, M. Dieudonne
{"title":"VNA测量中不确定度评估的软件工具:比较研究","authors":"G. Avolio, D. Williams, S. Streett, M. Frey, D. Schreurs, A. Ferrero, M. Dieudonne","doi":"10.1109/ARFTG.2017.8000820","DOIUrl":null,"url":null,"abstract":"We compared three software tools designed for scattering-parameter measurement uncertainty evaluation. These tools propagate uncertainty to calibrated S-parameters by means of a sensitivity analysis. We also validated the sensitivity analysis with Monte-Carlo simulations performed with one of the software tools and the Keysight ADS circuit simulator.","PeriodicalId":282023,"journal":{"name":"2017 89th ARFTG Microwave Measurement Conference (ARFTG)","volume":"29 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2017-06-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"12","resultStr":"{\"title\":\"Software tools for uncertainty evaluation in VNA measurements: A comparative study\",\"authors\":\"G. Avolio, D. Williams, S. Streett, M. Frey, D. Schreurs, A. Ferrero, M. Dieudonne\",\"doi\":\"10.1109/ARFTG.2017.8000820\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"We compared three software tools designed for scattering-parameter measurement uncertainty evaluation. These tools propagate uncertainty to calibrated S-parameters by means of a sensitivity analysis. We also validated the sensitivity analysis with Monte-Carlo simulations performed with one of the software tools and the Keysight ADS circuit simulator.\",\"PeriodicalId\":282023,\"journal\":{\"name\":\"2017 89th ARFTG Microwave Measurement Conference (ARFTG)\",\"volume\":\"29 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2017-06-09\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"12\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2017 89th ARFTG Microwave Measurement Conference (ARFTG)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ARFTG.2017.8000820\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2017 89th ARFTG Microwave Measurement Conference (ARFTG)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ARFTG.2017.8000820","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Software tools for uncertainty evaluation in VNA measurements: A comparative study
We compared three software tools designed for scattering-parameter measurement uncertainty evaluation. These tools propagate uncertainty to calibrated S-parameters by means of a sensitivity analysis. We also validated the sensitivity analysis with Monte-Carlo simulations performed with one of the software tools and the Keysight ADS circuit simulator.