G. Avolio, D. Williams, S. Streett, M. Frey, D. Schreurs, A. Ferrero, M. Dieudonne
{"title":"Software tools for uncertainty evaluation in VNA measurements: A comparative study","authors":"G. Avolio, D. Williams, S. Streett, M. Frey, D. Schreurs, A. Ferrero, M. Dieudonne","doi":"10.1109/ARFTG.2017.8000820","DOIUrl":null,"url":null,"abstract":"We compared three software tools designed for scattering-parameter measurement uncertainty evaluation. These tools propagate uncertainty to calibrated S-parameters by means of a sensitivity analysis. We also validated the sensitivity analysis with Monte-Carlo simulations performed with one of the software tools and the Keysight ADS circuit simulator.","PeriodicalId":282023,"journal":{"name":"2017 89th ARFTG Microwave Measurement Conference (ARFTG)","volume":"29 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2017-06-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"12","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2017 89th ARFTG Microwave Measurement Conference (ARFTG)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ARFTG.2017.8000820","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 12
Abstract
We compared three software tools designed for scattering-parameter measurement uncertainty evaluation. These tools propagate uncertainty to calibrated S-parameters by means of a sensitivity analysis. We also validated the sensitivity analysis with Monte-Carlo simulations performed with one of the software tools and the Keysight ADS circuit simulator.