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2017 89th ARFTG Microwave Measurement Conference (ARFTG)最新文献

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Mutual interference in calibration line configurations 校准线配置中的相互干扰
2017 89th ARFTG Microwave Measurement Conference (ARFTG) Pub Date : 2017-06-01 DOI: 10.1109/ARFTG.2017.8000823
F. Schmückle, T. Probst, U. Arz, G. Phung, R. Doerner, W. Heinrich
{"title":"Mutual interference in calibration line configurations","authors":"F. Schmückle, T. Probst, U. Arz, G. Phung, R. Doerner, W. Heinrich","doi":"10.1109/ARFTG.2017.8000823","DOIUrl":"https://doi.org/10.1109/ARFTG.2017.8000823","url":null,"abstract":"When using multiline TRL calibrations for correcting on-wafer measurements, the accuracy of the result depends crucially on the consistency of the calibration set. For example, each line standard used in the calibration process must allow unambiguous measurements, i.e., the only difference between the various transmission-line elements should be line length. To this end, the pad structure for the probes, the probe mechanical contact properties and the environment including other structures, wafer or chip boundary and backside structures (metallization, chuck material) should be the same for each element. If this condition is not fulfilled, errors in the multiline TRL calibration process occur. This paper discusses the resulting deviations and presents some first rules for a proper layout of the calibration standards.","PeriodicalId":282023,"journal":{"name":"2017 89th ARFTG Microwave Measurement Conference (ARFTG)","volume":"32 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2017-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128116605","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 15
Measurement-based analysis of the throughput-power level trade-off with modulated multisine signals in a SWIPT system SWIPT系统中调制多正弦信号的吞吐量-功率权衡的基于测量的分析
2017 89th ARFTG Microwave Measurement Conference (ARFTG) Pub Date : 1900-01-01 DOI: 10.1109/ARFTG.2017.8000825
Steven Claessens, Mohammad Rajabi, Ning Pan, S. Pollin, D. Schreurs
{"title":"Measurement-based analysis of the throughput-power level trade-off with modulated multisine signals in a SWIPT system","authors":"Steven Claessens, Mohammad Rajabi, Ning Pan, S. Pollin, D. Schreurs","doi":"10.1109/ARFTG.2017.8000825","DOIUrl":"https://doi.org/10.1109/ARFTG.2017.8000825","url":null,"abstract":"Simultaneous wireless information and power transfer (SWIPT) has gained interest, especially due to its applicability in the world of Internet of Things. For pure wireless power transfer (WPT), multisine signals have already been shown to increase RF-to-DC power conversion efficiency (PCE) at the receiver which is key in WPT research. In a SWIPT system where the waveforms are modulated for information transfer, however, we expect the modulation scheme to impact both data transmission quality and WPT subsystem efficiency. This paper quantifies by means of an experimental study the impact of QAM and PSK modulated multisine signals, on the power and data transfer efficiency of a SWIPT system, taking into account the often neglected transmitter distortion. Error vector magnitude (EVM) is used as figure of merit for the impact of data transfer efficiency, output voltage ripple for the modulation's impact on WPT.","PeriodicalId":282023,"journal":{"name":"2017 89th ARFTG Microwave Measurement Conference (ARFTG)","volume":"4 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133470886","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 13
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