A phase reference standard free setup for two-path memory model identification of wideband power amplifier

Abstract

This paper presents a measurement scenario for the indirect identification of long term memory kernel of the two-path memory behavioral model. The measurement principle is based on the use of a regular VNA setup and is applied here for the characterization and modeling of a LDMOS power amplifier. It has been experimentally demonstrated that this measurement principle allows an accurate model identification by performing a simple set of measurements. Extracted model proves the ability to provide a good prediction for complex communication signals.