{"title":"一种用于扫描近场微波显微镜的新型干涉传感器","authors":"K. Hoffmann, A. Baskakova","doi":"10.1109/ARFTG.2017.8000829","DOIUrl":null,"url":null,"abstract":"A new microstrip sensor using the transmission interferometric measurement principle for scanning near-field microwave microscopy is presented. The structure originates from a Wilkinson power divider but has a resistor removed. The wideband design was verified by simulation using AWR Microwave Office and experimentally in frequency band of 45 MHz to 20 GHz. Ten times suppression of measurement uncertainties due to noise of a vector network analyzer was achieved. The structure is simple, cheap and mechanically stable with no moveable part.","PeriodicalId":282023,"journal":{"name":"2017 89th ARFTG Microwave Measurement Conference (ARFTG)","volume":"3 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2017-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"A new interferometric sensor for scanning near-field microwave microscopy\",\"authors\":\"K. Hoffmann, A. Baskakova\",\"doi\":\"10.1109/ARFTG.2017.8000829\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A new microstrip sensor using the transmission interferometric measurement principle for scanning near-field microwave microscopy is presented. The structure originates from a Wilkinson power divider but has a resistor removed. The wideband design was verified by simulation using AWR Microwave Office and experimentally in frequency band of 45 MHz to 20 GHz. Ten times suppression of measurement uncertainties due to noise of a vector network analyzer was achieved. The structure is simple, cheap and mechanically stable with no moveable part.\",\"PeriodicalId\":282023,\"journal\":{\"name\":\"2017 89th ARFTG Microwave Measurement Conference (ARFTG)\",\"volume\":\"3 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2017-06-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2017 89th ARFTG Microwave Measurement Conference (ARFTG)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ARFTG.2017.8000829\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2017 89th ARFTG Microwave Measurement Conference (ARFTG)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ARFTG.2017.8000829","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A new interferometric sensor for scanning near-field microwave microscopy
A new microstrip sensor using the transmission interferometric measurement principle for scanning near-field microwave microscopy is presented. The structure originates from a Wilkinson power divider but has a resistor removed. The wideband design was verified by simulation using AWR Microwave Office and experimentally in frequency band of 45 MHz to 20 GHz. Ten times suppression of measurement uncertainties due to noise of a vector network analyzer was achieved. The structure is simple, cheap and mechanically stable with no moveable part.
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