低温测试夹具,用于在4.2 K及以上的双端口校准

D. Oates, R. Slattery, D. Hover
{"title":"低温测试夹具,用于在4.2 K及以上的双端口校准","authors":"D. Oates, R. Slattery, D. Hover","doi":"10.1109/ARFTG.2017.8000842","DOIUrl":null,"url":null,"abstract":"A test fixture for full 2-port-calibrated, error-corrected measurements at cryogenic temperatures has been built and tested. Through-reflect-line (TRL) calibrations have been demonstrated at frequencies up to 4.5 GHz and at temperatures as low as 4.2 K. Calibrated measurements of both passive filters and active devices, amplifiers have been demonstrated. The calibration standards are collocated with the device under test. The calibration and device measurement can be accomplished in a single cooldown. Mechanical switches at the cold stage are used to switch in the TRL standards and the device under test. Measurements of the repeatability of the calibration will be discussed. The amplitude accuracy is approximately ± 0.03 dB.","PeriodicalId":282023,"journal":{"name":"2017 89th ARFTG Microwave Measurement Conference (ARFTG)","volume":"2 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2017-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":"{\"title\":\"Cryogenic test fixture for two-port calibration at 4.2 K and above\",\"authors\":\"D. Oates, R. Slattery, D. Hover\",\"doi\":\"10.1109/ARFTG.2017.8000842\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A test fixture for full 2-port-calibrated, error-corrected measurements at cryogenic temperatures has been built and tested. Through-reflect-line (TRL) calibrations have been demonstrated at frequencies up to 4.5 GHz and at temperatures as low as 4.2 K. Calibrated measurements of both passive filters and active devices, amplifiers have been demonstrated. The calibration standards are collocated with the device under test. The calibration and device measurement can be accomplished in a single cooldown. Mechanical switches at the cold stage are used to switch in the TRL standards and the device under test. Measurements of the repeatability of the calibration will be discussed. The amplitude accuracy is approximately ± 0.03 dB.\",\"PeriodicalId\":282023,\"journal\":{\"name\":\"2017 89th ARFTG Microwave Measurement Conference (ARFTG)\",\"volume\":\"2 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2017-06-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"4\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2017 89th ARFTG Microwave Measurement Conference (ARFTG)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ARFTG.2017.8000842\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2017 89th ARFTG Microwave Measurement Conference (ARFTG)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ARFTG.2017.8000842","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 4

摘要

一个完整的2端口校准的测试夹具,在低温下的误差校正测量已经建立和测试。通过反射线(TRL)校准已经在高达4.5 GHz的频率和低至4.2 K的温度下进行了演示。对无源滤波器和有源器件、放大器的校准测量进行了演示。校准标准与待测设备配套使用。校准和设备测量可以在一次冷却时间内完成。冷阶段的机械开关用于TRL标准和被测设备的切换。将讨论校准的可重复性的测量。振幅精度约为±0.03 dB。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Cryogenic test fixture for two-port calibration at 4.2 K and above
A test fixture for full 2-port-calibrated, error-corrected measurements at cryogenic temperatures has been built and tested. Through-reflect-line (TRL) calibrations have been demonstrated at frequencies up to 4.5 GHz and at temperatures as low as 4.2 K. Calibrated measurements of both passive filters and active devices, amplifiers have been demonstrated. The calibration standards are collocated with the device under test. The calibration and device measurement can be accomplished in a single cooldown. Mechanical switches at the cold stage are used to switch in the TRL standards and the device under test. Measurements of the repeatability of the calibration will be discussed. The amplitude accuracy is approximately ± 0.03 dB.
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