1982 IEEE International Symposium on Electromagnetic Compatibility最新文献

{"title":"Equivalent Circuit for Coupling Through an Annular Slot in a Thick Conducting Screen","authors":"C. Cha","doi":"10.1109/ISEMC.1982.7567715","DOIUrl":"https://doi.org/10.1109/ISEMC.1982.7567715","url":null,"abstract":"The electromagnetic coupling through a small hole in a screen is of interest to investigators in many areas. The thickness of the screen usually causes the reduction of the transmission except when a TEM mode exists. In such a case the transmission coefficient is a periodic function of the thickness and exhibits a resonant behavior at certain thicknesses. This paper presents the analysis for an annular slot in a thick screen and a rigorously derived equivalent circuit for the problem. function for the slot region is constructed using the eigen modes of a coaxial waveguide. Because of the rotational symmetry of the geometry, both types of operators can be decomposed into a sequence of Fourier modes (with respect to the azimuth angle). A sequence of simultaneous equations for the Fourier coefficients of the unknown magnetic currents are the result. The most important of them are the integral equations of the lowest order (no ^-dependence) since the TEM mode is of prime concern.","PeriodicalId":280076,"journal":{"name":"1982 IEEE International Symposium on Electromagnetic Compatibility","volume":"9 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1982-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133364898","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"EMC Measurement Considerations for Millimeter Wave Systems","authors":"J. C. Mantovani, E. E. Donaldson, P. Major","doi":"10.1109/ISEMC.1982.7567754","DOIUrl":"https://doi.org/10.1109/ISEMC.1982.7567754","url":null,"abstract":"","PeriodicalId":280076,"journal":{"name":"1982 IEEE International Symposium on Electromagnetic Compatibility","volume":"77 S1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1982-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114096803","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Electromagnetic Compatibility Management in the 1980s","authors":"D. H. Simons","doi":"10.1109/ISEMC.1982.7567710","DOIUrl":"https://doi.org/10.1109/ISEMC.1982.7567710","url":null,"abstract":"T he present administration in W ashington has a monumental task in maintaining a super power military status within tight budget constraints. T he President has asked for cooperation from all areas, and each individ­ ual, each discipline, must consider what contribution can be made to this endeavor. M uch can be done in the electromagnetic compatiblity (E M C ) community to minimize costs o f prime weapon systems without compro­ mising electromagnetic compatibility (E M C ) concerns. A plan is presented in this paper to place proper emphasis, and associated monies, in the critical areas of a total E M C program. T h e entire relationship of electromagnetic interference (E M I) design and test, fol­ lowed by E M C design and test, w ill be evaluated from a fresh viewpoint. T his report presents a critical look at E M I test methods and specification limits in relation to the attainment of E M C . Introduction T he ultimate goal of this paper is a new management approach to the work pertinent to attaining E M C . T he misuse o f funds chasing unrealistic E M I specification requirements must be modified. T his author has witnessed E M I test results from several manufactur­ ers’ products wherein emission levels tens o f dB above specification limits have typically not presented an E M C problem in field use. T oo often a manufacturer is pressured by the customer to redesign a system into specification compliance, or at least partial compliance, when the system in its original configuration may have been electromagnetically compatible with its operational environment. T h e E M I results should, to a large degree, be viewed as system characteristics to be used as data for an E M C analysis. Critically low thresholds in susceptibility testing certainly de­ mand immediate corrective action, but this area o f test performance re­ quires further study and evaluation. T he above argument is illustrated in Figure 1, which plots the narrowband (N B ) radiated emission limits of M IL -S T D -4 6 1 A, Notice 4. T h e two radiated susceptibility field levels stipulated in the same specification are also plotted. An 85 dB minimum safety margin exists between the emission and susceptibility test limits; nevertheless, only a 6 dB safety margin is required in the E M C specifica­ tion, M IL -E -6 0 5 1 D .","PeriodicalId":280076,"journal":{"name":"1982 IEEE International Symposium on Electromagnetic Compatibility","volume":"18 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1982-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121816058","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Light Weight Shielding for Aegis Cables","authors":"Albert R. Martin, Mark D. Mendenhall, Neal Stetson","doi":"10.1109/ISEMC.1982.7567788","DOIUrl":"https://doi.org/10.1109/ISEMC.1982.7567788","url":null,"abstract":"A rule of thumb that has been developed from expe­ rience and experiment! -jS t hat shielding effec­ tiveness of a double braided cable is roughly 15-20dB more than that of a single braided cable. We were thus interested to find that by careful attention to braid design, a cable could be pro­ duced with a single braid that actually had better shielding effectiveness than a similar existing cable with a double braid. This fact was confirmed by two different laboratories, using a frequency domain technique in one case, and a time domain (EMP) technique in the other. The result was that the single braided cable could replace the double braided cable with no sacrifice in shield per­ formance, but with a considerable saving in size and weight.","PeriodicalId":280076,"journal":{"name":"1982 IEEE International Symposium on Electromagnetic Compatibility","volume":"61 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1982-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127794062","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Electrostatic Furniture Discharge Event Rates for Metallic-Covered, Floor-Standing Information Processing Machines","authors":"Richard B. Simonic","doi":"10.1109/ISEMC.1982.7567744","DOIUrl":"https://doi.org/10.1109/ISEMC.1982.7567744","url":null,"abstract":"Electrostatic discharge (ESD) event rates were measured for a sample of metallic-covered, floorstanding information processing machines. Monitoring was done during periods of low humidity when the maximum electrostatic charges on people and furniture would naturally occur. The results are given in terms of events per machine per 8-hour shift as a function of a reference furniture waveform. With knowledge of the machine error response to ESD events, the event rate information can be used to estimate error rates of machines. INTRODUCTION Low impedance Electrostatic Discharge (ESD) of furniture is a major contributor to electromagnetic (EM) stress on electronic equipment. The random charging and subsequent abrupt discharging of office furniture often occurs unnoticed by the people in­ volved. If the discharge point happens to be the cover of a sensitive machine, unexplained errors may occur on a random basis that are recorded in system logs as \"no trouble found.\" In addition, rather remote dis­ charges occurring to unrelated equipment may also contribute to errors of even greater perplexity. The association of equipment power and input/output cables may be such that common propagation paths are provided for the ESD impulse. metallic, \"conductive\" floors and humidity control involving 10 sites, 11 machines and 3360 shifts (one shift is defined as an 8-hour operating period). (2) The carpeted office or terminal room with little or no humidity control involving 8 sites, 8 machines and 282 shifts. Measurements were made on floor-standing, metallic-covered machines during periods of normally high static generation in the northeast and midwest.","PeriodicalId":280076,"journal":{"name":"1982 IEEE International Symposium on Electromagnetic Compatibility","volume":"21 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1982-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126055538","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"A Probabilistic Approach to EMC Modeling and Analysis","authors":"A. Ephreth, D. Weiner, G. Capraro, C. Paludi","doi":"10.1109/ISEMC.1982.7567724","DOIUrl":"https://doi.org/10.1109/ISEMC.1982.7567724","url":null,"abstract":"EMC modeling and analysis is commonly carried out using a deterministic point of view in which the sign­ als, coupling paths, and equipment characteristics are assumed to be known. Uncertainties are accounted for by utilizing \"worst-case\" models. However, many modern electromagnetic environments and electronic equipments have become so complex they no longer can be modeled either realistically or efficiently using a determinis­ tic approach. In reality, the electromagnetic environ­ ment and equipment susceptibility are random in nature. Not only does the probabilistic approach provide a natural vehicle for describing the resulting uncertain­ ties, but statistical models can be developed which may simplify the problem of characterizing complicated signals and equipments. This paper presents a probabi­ listic EMC model which can be used when the determinis­ tic approach to EMC' modeling and analysis is inappro­ priate .","PeriodicalId":280076,"journal":{"name":"1982 IEEE International Symposium on Electromagnetic Compatibility","volume":"207 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1982-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114968643","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Wideband Measurements of Medium-Frequency Atmospheric Radio Noise","authors":"K. Marzotto, X. A. DeAngelis, J. Herman, A. Giordano","doi":"10.1109/ISEMC.1982.7567757","DOIUrl":"https://doi.org/10.1109/ISEMC.1982.7567757","url":null,"abstract":"Wideband measurements of radio noise in the medium frequency (400-500 KHz) band have been made in the southwestern USA at. a remote site well removed from sources of man-made interference. To perform these measurements, a sophisticated noise recording system was designed and built to simultaneously record radio noise from two independent antennas in 100 kHz bandwidth, and the software required for processing and analysis of the data was developed. Three successful field missions in Nevada yielded a data, base consisting of approximately 575 high density tape recordings and 1800 magnetic computer tapes containing the transcribed noise data. Computeraided analysis of the tape-recorded noise provides new information regarding the characteristics of wideband atmospheric noise and the effects of bandwidth on them. First-order statistics (average power; amplitude probability distribution; Vd) are calculated and compared with CCIR 322 values. Higher order statistics (autocorrelation function; pulse duration and pulse spacing distributions; average positive crossing rates) are also derived. I t is found that increasing the bandwidth increases Vd far less than would be anticipated by CCIR 322. Also, characteristic changes are introduced into the pulse statistics by varying the bandwidth. The results of 4 weeks of daytime and nighttime measurements in early autumn will be discussed, and a brief description of the wideband noise recording equipment and analysis technique will be given.","PeriodicalId":280076,"journal":{"name":"1982 IEEE International Symposium on Electromagnetic Compatibility","volume":"9 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1982-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"117021757","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Evaluation of Coupling Between Adjacent Circuits","authors":"J. Osburn","doi":"10.1109/ISEMC.1982.7567765","DOIUrl":"https://doi.org/10.1109/ISEMC.1982.7567765","url":null,"abstract":"Analysis of coupling between adjacent circuits begins with evaluation of wire—to—wire coupling for all internal and external cable configurations between sources and loads of circuits. Models for additional radiated coupling from circuits on the same and adjacent printed circuits boards is developed and evaluated. Total coupling is the summation of interference signals from both sources. Analytical examples are presented and discussed. A description of the conditions when this more-in-depth analysis might be used closes the discussion.","PeriodicalId":280076,"journal":{"name":"1982 IEEE International Symposium on Electromagnetic Compatibility","volume":"16 ","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1982-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"120971943","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"MOSFET Nonlinear Incremental Model for NCAP","authors":"Kun-Nau Chen, J. Whalen","doi":"10.1109/ISEMC.1982.7567722","DOIUrl":"https://doi.org/10.1109/ISEMC.1982.7567722","url":null,"abstract":"A four-terminal nonlinear incremental MOSFET model for EMI analysis is described. For normal MOSFET opera­ tion the model simplifies to a three-terminal model. A BiMOS op amp circuit was investigated to determine how well the model could predict how API-modulated RF sig­ nals are demodulated in MOS circuits to cause undesired low frequency responses. The experimental and calcu­ lated values for demodulation RFI agreed quite well over the RF frequency range 50 kHz to 100 MHz. The agreement demonstrates the usefulness of the nonlinear incremental MOSFET model described in the paper.","PeriodicalId":280076,"journal":{"name":"1982 IEEE International Symposium on Electromagnetic Compatibility","volume":"41 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1982-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115893695","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Shielding Effectiveness of Typical Cables from 1 MHz to 1000 MHz","authors":"M. Dinallo, L. Hoeft, J. Hofstra, D. Thomas","doi":"10.1109/ISEMC.1982.7567798","DOIUrl":"https://doi.org/10.1109/ISEMC.1982.7567798","url":null,"abstract":"Cable shields frequently have two specifica­ tions: one for EMP, and one for EMC. From 0 to 100 MHz, the total transfer impedance of a cable can be measured in a straightforward manner since the cable is electrically small over most of this range. Consequently, transfer impedance is frequently used as the measure of shielding quality of a cable for EMP shielding analysis. Beyond 100 MHz the cable length is not electrically small and it becomes dif­ ficult to reduce measured data. Consequently, some form of shielding effectiveness is often used to specify the shielding quality of cables forEMC analysis. Two alternative definitions of shielding effectiveness (the ratio of power flow out of the interior of the cable to the power flowing on the shield (SEP) and the ratio of current flowing out of the interior of the cable to that flowing on the shield (SEI)), transmission line theory, Ohm's Taw and the transfer impedance parameters (resistance and mutual inductance) were used to calculate shielding effectiveness Up to 10 GHz, The results show that, below a few MHz, the shielding effectiveness was independent of frequency and dependent on cable length. Above a few tens of MHz, when the cable becomes electrically long, the shielding effective­ ness reaches a minimum value which is directly pro­ portional to the shield's mutual inductance and becomes a maximum at the cable electrical length resonances. The high frequency limit of the shield­ ing effectiveness is independent of cable length. The two definitions of shield effectiveness differ by a factor related to the external impedance. Measured data for the shielding effectiveness (the ratio of center conductor to shield current) of several shielded twisted pairs and cable assemblies, from 1 MHz to 1000 MHz using a quadraxial test fixture, will be presented. The measured results agree reasonably well with the theory. The effect of a single aperture was also studied, and measurements show the shielding effectiveness of cables with this type of leakage is particularly poor at the UHF frequencies.","PeriodicalId":280076,"journal":{"name":"1982 IEEE International Symposium on Electromagnetic Compatibility","volume":"63 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1982-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"117333417","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}