{"title":"相邻电路之间耦合的评估","authors":"J. Osburn","doi":"10.1109/ISEMC.1982.7567765","DOIUrl":null,"url":null,"abstract":"Analysis of coupling between adjacent circuits begins with evaluation of wire—to—wire coupling for all internal and external cable configurations between sources and loads of circuits. Models for additional radiated coupling from circuits on the same and adjacent printed circuits boards is developed and evaluated. Total coupling is the summation of interference signals from both sources. Analytical examples are presented and discussed. A description of the conditions when this more-in-depth analysis might be used closes the discussion.","PeriodicalId":280076,"journal":{"name":"1982 IEEE International Symposium on Electromagnetic Compatibility","volume":"16 ","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1982-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Evaluation of Coupling Between Adjacent Circuits\",\"authors\":\"J. Osburn\",\"doi\":\"10.1109/ISEMC.1982.7567765\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Analysis of coupling between adjacent circuits begins with evaluation of wire—to—wire coupling for all internal and external cable configurations between sources and loads of circuits. Models for additional radiated coupling from circuits on the same and adjacent printed circuits boards is developed and evaluated. Total coupling is the summation of interference signals from both sources. Analytical examples are presented and discussed. A description of the conditions when this more-in-depth analysis might be used closes the discussion.\",\"PeriodicalId\":280076,\"journal\":{\"name\":\"1982 IEEE International Symposium on Electromagnetic Compatibility\",\"volume\":\"16 \",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1982-09-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"1982 IEEE International Symposium on Electromagnetic Compatibility\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISEMC.1982.7567765\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"1982 IEEE International Symposium on Electromagnetic Compatibility","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISEMC.1982.7567765","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Analysis of coupling between adjacent circuits begins with evaluation of wire—to—wire coupling for all internal and external cable configurations between sources and loads of circuits. Models for additional radiated coupling from circuits on the same and adjacent printed circuits boards is developed and evaluated. Total coupling is the summation of interference signals from both sources. Analytical examples are presented and discussed. A description of the conditions when this more-in-depth analysis might be used closes the discussion.
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