1982 IEEE International Symposium on Electromagnetic Compatibility最新文献

{"title":"Power Sag/Surge Testing for Equipment Reliability Improvement","authors":"Ron Moser","doi":"10.1109/ISEMC.1982.7567732","DOIUrl":"https://doi.org/10.1109/ISEMC.1982.7567732","url":null,"abstract":"The need for testing military and non-military subsystems for their ability to tolerate inevitable transient variations in the electrical bus voltage powering them is established. Various military and non-military standards defining AC and DC powerline sag and surge limits for durations greater than 1 millisecond are compared. Arguments are put forth for simulating such transient conditions in the EMC Test Laboratory, both during equipment development tests and as part of the equipment production qualification tests. Laboratory production of powerline sag and surge conditions is discussed, with a detailed compar­ ison of off-line power amplifiers and on-line thyristor controllers test equipments being made.","PeriodicalId":280076,"journal":{"name":"1982 IEEE International Symposium on Electromagnetic Compatibility","volume":"46 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1982-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116092816","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"The Measurement of Electrical Conductivity in Carbon/Epoxy Composite Materials at UHF","authors":"W. Walker","doi":"10.1109/ISEMC.1982.7567738","DOIUrl":"https://doi.org/10.1109/ISEMC.1982.7567738","url":null,"abstract":"","PeriodicalId":280076,"journal":{"name":"1982 IEEE International Symposium on Electromagnetic Compatibility","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1982-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129401675","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Development of an Electrostatic Discharge Model for Electronic Systems","authors":"W. Byrne","doi":"10.1109/ISEMC.1982.7567745","DOIUrl":"https://doi.org/10.1109/ISEMC.1982.7567745","url":null,"abstract":"Electrostatic Discharge (ESD), as discussed in this paper, is limited to the buildup and flow, or redistribution of charge between a human being, an electronic system, and earth. Like lightning, it is really an electrostatic/electrodynamic event. The background includes electrostatics or charges at rest on the sur­ faces of a system of conductors, consisting of a person, an elec­ tronic system, and earth. These charges have a surface density from which the electric field intensity is derived using the Gauss Law of electrostatics, provided the charged surfaces are suffi­ ciently isolated from each other so that the surface charge density is uniform over the.surfaces of the bodies. The actual charge distrubution is discussed later. Flow of the charges (current) takes place slowly during the charging phase, and very rapidly during the charge redistribution phase. Charges are built up on the per­ son usually as a result of triboelectric action between the shoe soles and the floor covering. The sudden release of built-up elec­ trostatic energy in the person, machine, and earth system causes potentially devastating voltages, currents, and electromagnetic fields to occur in vulnerable components in the electronic system. Upon ionization and air dielectric breakdown (arcing), the rapid redistribution currents easily propagate down interconnecting cables and other units before finally bleeding off through the higher RF impedance of the ground connection. The person has a strong capability to retain the built-up charge due to his high degree of insulation from the floor covering and earth. Also, there is a significant capacitance between his body and earth, and a potentially larger capacitance (depending upon separation) to the usually grounded electronic enclosure or enclosures. There­ fore, a large amount of energy may be available for discharge. Depending on the condition, potentials in the order of 30,000 volts may be present on the person. Potentials higher than this value are usually discharged into the atmosphere by corona effects. This occurs when the electric field exceeds approximately 3 x 106 volts per meter. The problems with ESD are as follows:","PeriodicalId":280076,"journal":{"name":"1982 IEEE International Symposium on Electromagnetic Compatibility","volume":"21 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1982-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130187027","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"An Introduction to Shield Joint Evaluation Using EMI Gasket Transfer Impedance Data","authors":"A. Faught","doi":"10.1109/ISEMC.1982.7567716","DOIUrl":"https://doi.org/10.1109/ISEMC.1982.7567716","url":null,"abstract":"The application of transfer impedance measurement techniques to characterize EMI shielding gasket mate­ rials produces data more useful to designers than do traditional shielded room techniques. Transfer imped­ ance, which is free of variations due to geometry and incident fields, allows more detailed evaluation of the roles played by shielding gaskets and their mating surfaces.","PeriodicalId":280076,"journal":{"name":"1982 IEEE International Symposium on Electromagnetic Compatibility","volume":"40 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1982-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122812835","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Power Line EMI Filter Insertion Loss","authors":"Lon M. Schneider","doi":"10.1109/ISEMC.1982.7567772","DOIUrl":"https://doi.org/10.1109/ISEMC.1982.7567772","url":null,"abstract":"Most manufacturers of power line EMI filters provide some form of insertion loss specification for these filters as an indication of their performance. However, the significance and usefulness of these data are often unclear. Also, measurement configura­ tions and the resulting data may differ markedly between manufacturers as well as users of these devi­ ces. And none of these techniques precisely repre­ sent the EMI reduction performance provided by the filter in its intended application.","PeriodicalId":280076,"journal":{"name":"1982 IEEE International Symposium on Electromagnetic Compatibility","volume":"17 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1982-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130439911","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Analysis of Intermodulation Between Broadband Frequency Transmitters on Mobile Radio Networks","authors":"J. Gavan","doi":"10.1109/ISEMC.1982.7567713","DOIUrl":"https://doi.org/10.1109/ISEMC.1982.7567713","url":null,"abstract":"In the state of the art of mobile radio systems in­ cluding broadband frequency solid state transmitters, the intermodulation products generated in the final power stage become influent. Their disturbing effects may become stronger than those of the intermodulation products generated inside the receiver front end, and of the other important mutual interference sources. A qualitative analysis of the intermodulation products ge­ neration in transmitters and a computerized method are developed. A realistic worse case scenario is computed. The conclusions include some methods to reduce and opti­ mize the IM interferences in the system.","PeriodicalId":280076,"journal":{"name":"1982 IEEE International Symposium on Electromagnetic Compatibility","volume":"316 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1982-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133336209","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Development of the NBS Isotropic Magnetic-field Meter [MFM-10], 300 kHZ to 100 MHz","authors":"L. D. Driver, J. E. Cruz","doi":"10.1109/ISEMC.1982.7567793","DOIUrl":"https://doi.org/10.1109/ISEMC.1982.7567793","url":null,"abstract":"","PeriodicalId":280076,"journal":{"name":"1982 IEEE International Symposium on Electromagnetic Compatibility","volume":"9 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1982-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131577469","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"The Origins, the Effects and the Simulation of Transients, as well as their International Standardization","authors":"O. Frey","doi":"10.1109/ISEMC.1982.7567779","DOIUrl":"https://doi.org/10.1109/ISEMC.1982.7567779","url":null,"abstract":"","PeriodicalId":280076,"journal":{"name":"1982 IEEE International Symposium on Electromagnetic Compatibility","volume":"41 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1982-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127797652","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Transfer Impedance for One-and-Two-Layer Shielding Topologies with Backshells","authors":"L. Hoeft, J. Hofstra, M. Dinallo","doi":"10.1109/ISEMC.1982.7567773","DOIUrl":"https://doi.org/10.1109/ISEMC.1982.7567773","url":null,"abstract":"","PeriodicalId":280076,"journal":{"name":"1982 IEEE International Symposium on Electromagnetic Compatibility","volume":"14 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1982-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128335420","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"A Magnetic Shield for Magnetic Testing of Spacecraft Subassemblies","authors":"K. DeGraffenreid, J. M. Bodeau, N. Dao","doi":"10.1109/ISEMC.1982.7567796","DOIUrl":"https://doi.org/10.1109/ISEMC.1982.7567796","url":null,"abstract":"Magnetic specifications on spacecraft subassemblies often require the subassemblies be tested in a field free region. This is because an ambient field such as that of the earth's would induce magnetic moments in the test object causing erroneous results in measurements. Magnetic shielding calculations indicate very high per­ meability materials are normally needed to achieve sig­ nificant shielding factors. A technique for obtaining an effectively high shielding factor with low permea­ bility material is described,","PeriodicalId":280076,"journal":{"name":"1982 IEEE International Symposium on Electromagnetic Compatibility","volume":"51 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1982-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132932537","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}