{"title":"A Probabilistic Approach to EMC Modeling and Analysis","authors":"A. Ephreth, D. Weiner, G. Capraro, C. Paludi","doi":"10.1109/ISEMC.1982.7567724","DOIUrl":null,"url":null,"abstract":"EMC modeling and analysis is commonly carried out using a deterministic point of view in which the sign als, coupling paths, and equipment characteristics are assumed to be known. Uncertainties are accounted for by utilizing \"worst-case\" models. However, many modern electromagnetic environments and electronic equipments have become so complex they no longer can be modeled either realistically or efficiently using a determinis tic approach. In reality, the electromagnetic environ ment and equipment susceptibility are random in nature. Not only does the probabilistic approach provide a natural vehicle for describing the resulting uncertain ties, but statistical models can be developed which may simplify the problem of characterizing complicated signals and equipments. This paper presents a probabi listic EMC model which can be used when the determinis tic approach to EMC' modeling and analysis is inappro priate .","PeriodicalId":280076,"journal":{"name":"1982 IEEE International Symposium on Electromagnetic Compatibility","volume":"207 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1982-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"1982 IEEE International Symposium on Electromagnetic Compatibility","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISEMC.1982.7567724","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 3
Abstract
EMC modeling and analysis is commonly carried out using a deterministic point of view in which the sign als, coupling paths, and equipment characteristics are assumed to be known. Uncertainties are accounted for by utilizing "worst-case" models. However, many modern electromagnetic environments and electronic equipments have become so complex they no longer can be modeled either realistically or efficiently using a determinis tic approach. In reality, the electromagnetic environ ment and equipment susceptibility are random in nature. Not only does the probabilistic approach provide a natural vehicle for describing the resulting uncertain ties, but statistical models can be developed which may simplify the problem of characterizing complicated signals and equipments. This paper presents a probabi listic EMC model which can be used when the determinis tic approach to EMC' modeling and analysis is inappro priate .