{"title":"Radar Design for Electromagnetic Compatibility","authors":"R. Durham","doi":"10.1109/ISEMC.1982.7567786","DOIUrl":"https://doi.org/10.1109/ISEMC.1982.7567786","url":null,"abstract":"","PeriodicalId":280076,"journal":{"name":"1982 IEEE International Symposium on Electromagnetic Compatibility","volume":"173 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1982-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132216180","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Time Domain Sensors for Radiated Impulsive EMI Measurements","authors":"M. Kanda, F. Ries","doi":"10.1109/ISEMC.1982.7567761","DOIUrl":"https://doi.org/10.1109/ISEMC.1982.7567761","url":null,"abstract":"The purpose of t h i s paper i s to review various sensors and ra d ia to rs commonly used for time domain antenna measurements. For e l e c t r i c f i e l d s trength measurements, l in e a r antennas loaded nonuniformly and c ont inuously with r e s i s t a n c e , or both r e s i s t a n c e and capac i tan ce are d i sc u s se d . Also a conica l antenna and an asymptotic conica l antenna are d i scus sed from the standpoin t o f an improved c h a r a c t e r i s t i c . For an improved d i r e c t i v i t y , var ious types o f TEM horns are d i s c u s s e d , e . g . , a conducting TEM horn, a CALSPAN antenna, and a r e s i s t i v e l y loaded TEM horn. 1. In trod uc t ion . Elec tromagnetic in t e r f e r e n c e (EMI) measurements are among the most complicated and s o p h i s t i c a t e d th a t c h a l le n g e tech nology today s in c e some dev ices and systems are much more s u s c e p t ib l e to sh o rt -d ura t io n impulse i n t e r f e r e n c e than to common cw in t e r f e r e n c e . Therefore, a strong need e x i s t s to develop a small broadband sensor to d e t e c t and record impuls ive e lec trom agnet ic f i e l d s and to g ive alarm when th e se f i e l d s exceed predetermined hazardous l e v e l s . The purpose of t h i s paper i s to review various sensors and r ad ia tors commonly used for time domain antenna measurements. The sensors and ra d ia to rs discus sed here are p a s s iv e and analog dev ice s which convert the e lec trom agnet ic quant i ty o f i n t e r e s t to a v o l ta g e or current a t t h e i r terminal p o r t s . Moreover, they are primary standards in the sense tha t t h e i r t r a n s f e r fun c t io n s can be c a l c u l a t e d from t h e i r geometr ies and are f l a t ( cons tan t ) across a wide frequency range. One o f the major requirements for these sensors and r a d ia to rs i s tha t the e lec trom agnet ic far f i e l d , transm itted or r ec e iv e d , i s an accurate r e p l i c a or high f i d e l i t y d e r iv a t i v e o f the o r ig in a l p u l se . For e l e c t r i c f i e l d s trength measurements, l in e a r antennas loaded non-uniformly and cont inuous ly with r e s i s t a n c e , or both r e s i s t a n c e and capac itance are d isc u s se d . Also a con ica l antenna and an asymptot ic conica l antenna a r e .d i s c u s s e d from the standpoin t o f an improved c h a r a c t e r i s t i c . For an improved d i r e c t i v i t y , var ious types o f TEM horns are d i s c u s s e d , e . g . , a conducting TEM horn, a CALSPAN antenna, and a r e s i s t i v e l y loaded TEM horn. 2 . Transmitt ing and Receiving Transfer Function [ 1 ] . I t i s rather well known t h a t the tr a nsm it t ing t r a n s fe r funct ion o f an antenna i s proport ional to the t ime d e r iv a t i v e o f the r e c e iv in g t r a n s f e r funct ion o f the same antenna. For example, c o ns ide r an antenna designed to r ec e iv e an impulse with l i t t l e d i s t o r t i","PeriodicalId":280076,"journal":{"name":"1982 IEEE International Symposium on Electromagnetic Compatibility","volume":"27 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1982-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133488132","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Electromagnetic Environment in a PWR Power Plant","authors":"G. Champiot","doi":"10.1109/ISEMC.1982.7567777","DOIUrl":"https://doi.org/10.1109/ISEMC.1982.7567777","url":null,"abstract":"Electromagnetic disturbances have been measured in a 900 MW French nuclear power plant (34 plants of same type are being erected). Such a study is justified by the series of plants considered. The results presented have been obtained by syste matic measurements, in conducting and radiating modes, performed on the supply, control and measuring circuits at various operating powers of the plant. 1 INTRODUCTION Problems of electromagnetic compatibility we are faced with in nuclear power plants are particularly acute due to the intertwining of two factors : more powerful plants and greater number of distur bance-prone cut-off systems, higher sensitivity of measuring instruments and of monitoring/control systems. Actual tests have covered a span of four years to evidence all sources of disturbances in a nuclear plant and define them by a set of numerical values. They are justified by several facts : to take advantage of the notion of rating stage (34 similar power plants erected over about 10 years) to make a common map providing an overall view of a nuclear power plant on the EMC side, to know for each point the evolution of disturbances relative to the rating of the items of equipment installed by tests performed over a time interval of four years (from laying of first cables to 900 MW rated capacity), to obtain the data in order to determine the values within the equipment specifications and to define the typical disturbances for laboratory testing purposes. 2 CLASSIFICATION OF DISTURBANCES Disturbances may be divided into two classes, of different origin, and of different action on disturbed circuits together with the applicable protection means, but also by the measuring methods utilized. Such a classification breaks down to : Constant waves Such disturbances concern a given frequency wave which can be modulated, chopped or be assigned a slight frequency drift. They normally have a narrow frequency band spectrum. Impulse type disturbances Such disturbances generally originate in a sudden variation in the state of an electrical circuit, i.e. the opening of a contact. These sudden variations gene rate free oscillations in circuits, and the resulting disturbance is normally in the form of a highly damped wave. Such disturbances always have a very wide spectrum which can be from low frequencies up to several hundreds of MHz. According to their variation law versus time, two types of wideband disturbances must be distinguished : repetitive impulse type disturbances, recruring periodically within a certain repetition rate. Such are disturbances generated by rotating machines, at brush switching phases, non-repetitive impulse type disturbances, which, on the contrary, randomly appear at time ti. If the origin of such disturbances is known or not, times ti may be known beforehand or not, thus defining the applicable measuring methods to be used. Non-repeti tive impulse type disturbances maybe time-determined or random. Disturbances are exhibited via t","PeriodicalId":280076,"journal":{"name":"1982 IEEE International Symposium on Electromagnetic Compatibility","volume":"3 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1982-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131298812","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Technique for Controlling Radiated Emissions Due to Common-mode Noise in Electronic Data Processing Systems","authors":"E. Nakauchi, L. Brashear","doi":"10.1109/ISEMC.1982.7567727","DOIUrl":"https://doi.org/10.1109/ISEMC.1982.7567727","url":null,"abstract":"Most electronic data processing systems are composed of a central control unit and several peripheral units. The units cctnmunicate among each other by inter connecting cables. Because of ccirmon-mode noise prop agation, the interconnecting cables also become a major source of radiated noise in the higher frequen cies, 30 MHz. to 200 MHz. A camton-mode transformer is one technique to help solve the radiated problem, but most of the available theoretical information is based on lower frequency usage below 10 MHz. and for application to conducted emissions problems. There fore, a new set of equations must be generated for use in the higher frequency range and how to apply this information toward radiated emissions problems. These ccramon-mode transformers are usually wound on a toroidal core. However, alternate transformer techniques and alternate common-mode filtering methods are tested to compromise physical space limitation, ease of implementation and cost to performance.","PeriodicalId":280076,"journal":{"name":"1982 IEEE International Symposium on Electromagnetic Compatibility","volume":"165 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1982-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116552306","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Automated Component Level EMC Test Facility","authors":"T. Armfield, M. Howard, S. Walter","doi":"10.1109/ISEMC.1982.7567775","DOIUrl":"https://doi.org/10.1109/ISEMC.1982.7567775","url":null,"abstract":"An EMC test facility has been developed and constructed by John Deere at the Product Engineering Center, Waterloo, Iowa. This facili ty has fully automated the radiated emissions test and the radiated susceptibility test. With this capability and the centralized organiza tion of the equipment, the time to conduct a complete EMC test has been reduced by 70 percent compared with manual methods. A typical product can be fully tested for both emissions and susceptibility in seven hours. This paper will describe the hardware and software im plemented at this facility. Automated EMC Test Facility automated facility had become a reality. Although 2Vi years had pass ed, only 1 Vi man-years was expended to make the facility functional. Seven hours, that is how long it takes to conduct a complete EMC test from setup to report generation of a typical product. The facility shown in the block diagram of Figure 1 and in the photograph of Figure 2 has the following capabilities: 1. Frequency coverage of lOKHz to 1GHz 2. Real time monitoring and control of the RF fields and the device under test (DUT) via the IEEE-488 bus and the HP-3497A data ac quisition/control unit. Introduction The development of a large number of new electronic products to be offered by John Deere has required that EMC testing be done by a fully automated test facility. An internal specification was written to meet or exceed regulatory (FCC Part 15) as well as recommended (SAE standard J551 and SAE practice J1113) EMC requirements. Us ing this specification, the evolution of the EMC test facility began in the first quarter of 1979. By the second quarter of 1981, a fully 3. Centralized control from the HP-9845S desktop computer. 4. Automatic report generation and archiving using the HP-9872A plotter, a line printer and eight inch flexible disks for mass storage. 5. Storage of calibration data and correction factors. This has increas ed measurement accuracy and test repeatability. Figure 1. Automated EMC Test System Block Diagram 3 6 4 6. 16’ x 20’ x 8’ anechoic chamber with pyramidal cones on the walls, floor, and ceiling. The minimum reflection attenuation is 20 dB at 100 M Hz and 40 dB at 1 GHz. A 4’ x 10’ copper ground plane is provided to support the device under test (DUT). See Figure 3. 7. Two video monitors, both with zoom, pan and tilt capability. 8. Shielded or single plate stripline test cells for products which are less than 10 cm on any side. Most of the products tested are in this category. Figure 2. Automated E M C Test Facility Figure 3. Anechoic Test Chamber with a Shielded Stripline In Place Radiated Emission Testing The system used for automating EMI measurements and data col lection is an Ailtech (now Eaton) Series VII system. This system is comprised of two field intensity meters, the NM-17/27 A (10 KHz to 32 MHz) and the NM37-57A (30 MHz to 1.0 GHz). Selection of the pro per field intensity meter as well as a programmable attenuator between the meter and the se","PeriodicalId":280076,"journal":{"name":"1982 IEEE International Symposium on Electromagnetic Compatibility","volume":"58 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1982-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122696505","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Comparison of Semi-anechoic Chamber and Open-field site Attenuation Measurements","authors":"R. German","doi":"10.1109/ISEMC.1982.7567755","DOIUrl":"https://doi.org/10.1109/ISEMC.1982.7567755","url":null,"abstract":"The results of vertical and horizontal site atten uation measurements performed in a variety of semianechoic chambers over the 30-200 MHz frequency range are presented. In order to demonstrate the operation of these chambers below the frequency range where their RF absorber is completely effective, these measurements are compared to the site attenuations of an open-field. The effect of varying the location of the transmit antenna is included. The use of site attenuation mea surements for correlating semi-anechoic chamber and open-field EMI measurements is also discussed.","PeriodicalId":280076,"journal":{"name":"1982 IEEE International Symposium on Electromagnetic Compatibility","volume":"68 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1982-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125089311","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Testing of Large Systems for FCC Compliance on Radio Noise Emissions Using On-site Measurement Techniques","authors":"H. Hofmann, D. Shull","doi":"10.1109/ISEMC.1982.7567726","DOIUrl":"https://doi.org/10.1109/ISEMC.1982.7567726","url":null,"abstract":"The testing of large computing systems for compliance with new FCC regulations presents a number of unique problems not associated with the testing of small equipment. This paper describes measurements made on large telephone electronic switching systems at several central office sites, and the analysis of test results for verification of compliance. Problems encountered in making on-site measurements are discussed, and solutions to these problems are given.","PeriodicalId":280076,"journal":{"name":"1982 IEEE International Symposium on Electromagnetic Compatibility","volume":"32 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1982-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121635961","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Electrostatic Charging and Simulation of the Discharging Process","authors":"H. Kunz","doi":"10.1109/ISEMC.1982.7567746","DOIUrl":"https://doi.org/10.1109/ISEMC.1982.7567746","url":null,"abstract":"When two isolating materials with different dielectric constants are rubbed against each other, the materials charge up; i.e. one material gives up electrons to the other isolating material. Such an effect is des cribed as electrostatic charging. The same can happen to a person. If he moves in a dry atmosphere on a well insulated carpet he can charge himself to several thousand volts. Upon approaching a conducting object, his potential is discharged with intensive arcing via the conductor.","PeriodicalId":280076,"journal":{"name":"1982 IEEE International Symposium on Electromagnetic Compatibility","volume":"54 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1982-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121708027","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Calculating the Noise Voltages Induced in Telephone Lines by Electric Railways","authors":"R. Hannig","doi":"10.1109/ISEMC.1982.7567776","DOIUrl":"https://doi.org/10.1109/ISEMC.1982.7567776","url":null,"abstract":"","PeriodicalId":280076,"journal":{"name":"1982 IEEE International Symposium on Electromagnetic Compatibility","volume":"60 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1982-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124188327","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Polarization Error in Fieldstrength Measurements","authors":"T. Dvorak","doi":"10.1109/ISEMC.1982.7567734","DOIUrl":"https://doi.org/10.1109/ISEMC.1982.7567734","url":null,"abstract":"Especially in EMC testing, the fields to be measured are, however, far from being linearly polarized and the plane in which the field vector oscillates is not necessarily perpendicular to the direction of propa gation. in such instances, a measurement carried out according to the usual schemes, valid for linear po larization, results in an error, the value of which depends on the polarization mismatch between the fi eld and the antenna.","PeriodicalId":280076,"journal":{"name":"1982 IEEE International Symposium on Electromagnetic Compatibility","volume":"16 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1982-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124566907","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}