1982 IEEE International Symposium on Electromagnetic Compatibility最新文献

{"title":"Personnel Electrostatic Discharge: Impulse Waveforms Resulting from ESD of Humans Through Metallic-Mobile Furnishings Intervening in the Discharge Path","authors":"W. M. King, D. Reynolds","doi":"10.1109/ISEMC.1982.7567748","DOIUrl":"https://doi.org/10.1109/ISEMC.1982.7567748","url":null,"abstract":"This study represents an extension of an effort that was originated by King and Reynolds in 1980, and presented to the 1981 IEEE EMC Symposium (1) held at Boulder, CO. In the 1981 presentation, ESD impulse waveforms were re­ ported as measured from two conditions: Human-direct; and, human through small hand-held metallic objects that were intervening in the discharge path. Using a co m ­ patible measurement approach, this effort expands the study to be inclusive of metallic-mobile furnishings found typically in the office and/or data processi.ng environment, such as desk chairs and push-carts. Cursory sample measurements were additionally taken to illustrate impulse waveform variability at selected amplitudes, describing different effects due to different Electrostatic Discharge locations on the surfaces of a desk chair. Other sample measurements provide indication of other impulse results if the desk chair were to be replaced by a stool-type \"lab chair\". As in the previous publication, the conceptual goal of this effort was to develop information derived from actual ESD events that would facilitate the design of an ESD test generator which could produce impulse waveforms in reasonable but realistic simulation of actual ESD events for these ESD \"furnishings\" event conditions. Retrospective Overview As reported in the 1981 publication, the impulse charac­ teristics of ESD dynamically varied as the initializing (charge) amplitude was varied. The dramatic alterations encountered in the waveshapes as the initializing level was incrementally increased confirmed the hypothesis that waveform measurements derived from incrementally varied amplitudes were required to fully characterize the ESD event continuum. Generally, it was found that the impulse waveforms derived from lower-level initial amplitudes exhibited ultra-fast risetimes between 200 picoseconds (the limit of the measurement capability) and 500 picoseconds, while the impulse waveforms derived from higher static levels exhibited risetimes in the approximate range between one nanosecond and several tens of nanoseconds. The waveform components providing the ultra-fast risetimes were also found to be confined to exceptionally small pulse widths, typically in the area of a few hundred picoseconds, developing intense currents between the general range of a few tens of Amperes to over 100 Amperes. The more-conventional ionization-based impulses developing risetimes of one nanosecond (or more) exhibited peak currents up to a few tens of Amperes with base widths up to approximately 500 nanoseconds, although typical values were usually less than 200 nano­ seconds. The development o f multiple impulses within the framework of what was considered a 'single' ESD event was investigated in the previous effort, as was the duty cycle (or, periodicity) among events within the time envelope of 'one' event. Although the suggestion that ESD events were encountered with risetimes as fast as 200 picoseconds was reco","PeriodicalId":280076,"journal":{"name":"1982 IEEE International Symposium on Electromagnetic Compatibility","volume":"154 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1982-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128201436","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"A Model for Direct-Strike Lightning Excitation of a Conducting Body","authors":"D. Auckland, C. Cha","doi":"10.1109/ISEMC.1982.7567783","DOIUrl":"https://doi.org/10.1109/ISEMC.1982.7567783","url":null,"abstract":"A methpd is presented for simulating the electromagnetic excitation of a conducting body when it lies in the path of a lightning strike. A frequency domain analysis is used where an electric field integral equation is solved by the method of moments. The unknown surface current on the body is partitioned into two types, one for the junctions defining the lightning attachment points and one for the rest of the body. Pictures of the body surface current induced on a triangular patch model of an F-14 aircraft are presented for a nose-to-tail and nose-to-wingtlp attachment. Some time domain results are obtained using the simple double exponential model of a return stroke current waveform and numerical inversion of the frequency domain results obtained by matrix inversion.","PeriodicalId":280076,"journal":{"name":"1982 IEEE International Symposium on Electromagnetic Compatibility","volume":" 24","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1982-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"120834466","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"MIL-STD-220A Versus Classical Measurement of Filter Insertion Loss in a 50-ohm System","authors":"S. Vakil","doi":"10.1109/ISEMC.1982.7567769","DOIUrl":"https://doi.org/10.1109/ISEMC.1982.7567769","url":null,"abstract":"Discrep anc ie s have been observed in the data obtained from measurement of i n s e r t io n l o s s us ing MILSTD-220A and other c l a s s i c a l and more t r a d i t io n a l t e ch n iq u e s . This has r e s u l t e d in confus ion fo r des ig ners o f in t e r f e r e n c e suppress ion components, r a i s in g doubts regarding the v a l i d i t y o f MIL-STD-220A and c o r r e c t n e s s of the t e s t procedures s p e c i f i e d t h e r e i n . In t h i s paper, a complete a n a l y s i s o f the t e s t c i r c u i t descr ib ed by MIL-STD-220A i s performed. Using the c i r c u i t c h a r a c t e r i s t i c s o f the matched i s o l a t i o n a t t e n u a t o r s , an equat ion i s d e r i v e d f o r the f i l t e r i n s e r t i o n l o s s . I t i s shown tha t fo r large va lues of a t te n u a t io n provided by matched i s o l a t i o n a t t e n u a t o r s , the va lues o f i n s e r t i o n l o s s obta ined become nearly equal t o the va lues obtained from the c l a s s i c a l equat ion o f the i n s e r t io n l o s s , which agree with experimental r e s u l t s .","PeriodicalId":280076,"journal":{"name":"1982 IEEE International Symposium on Electromagnetic Compatibility","volume":"60 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1982-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121951977","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Conductive Elastomers for EMI/RFI Shielding Based on Silver-Plated Aluminum Filler","authors":"A. E. Booth, J. F. Broderick","doi":"10.1109/ISEMC.1982.7567741","DOIUrl":"https://doi.org/10.1109/ISEMC.1982.7567741","url":null,"abstract":"Electrically conductive elastomers for EMI shield­ ing applications have been in use since the early 1960's. Three main generic types have evolved, based on filler particles comprising silver, silver-plated copper and silver-plated glass. The paper reports the development of a new class of conductive elastomer based on silver-plated aluminum and characterizes it in terms of its physical and electrical properties. Shielding performance and gasket resistance data under aircraft vibration and simulated nuclear weapon EMP conditions are included.","PeriodicalId":280076,"journal":{"name":"1982 IEEE International Symposium on Electromagnetic Compatibility","volume":"33 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1982-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123594517","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"The U.S. Navy Combat Readiness Electromagnetic Analysis and Measurement (CREAM) Program","authors":"Robert B. Windle, J. Garrett, R. Haislmaier","doi":"10.1109/ISEMC.1982.7567789","DOIUrl":"https://doi.org/10.1109/ISEMC.1982.7567789","url":null,"abstract":"The Combat Readiness Electromagnetic Analysis and Measurement program was established in 1977 as part of the total US Navy electro- magnetic interference control programme. The CREAM programme has the aims of reducing shipboard EMI by developing improved test equipment, and testing methodology for EMI detection, measurement and analysis together with training in their application by operational personnel. Brief details of the four test sets now under development via the CREAM programme are given.","PeriodicalId":280076,"journal":{"name":"1982 IEEE International Symposium on Electromagnetic Compatibility","volume":"37 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1982-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127615963","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"A New Method for Determining the Emission Characteristics of an Unknown Interference Source","authors":"G. Koepke, M. Ma","doi":"10.1109/ISEMC.1982.7567737","DOIUrl":"https://doi.org/10.1109/ISEMC.1982.7567737","url":null,"abstract":"There has been considerable interest in developing a practical method to determine quantitatively the ra­ diation characteristics of unintentional electromagne­ tic emitters [1,2,3]. The objective of this paper is to describe such a method developed recently at the National Bureau of Standards, Boulder, Colorado. Basically, an unintentional leakage source is con­ sidered to be electrically small, and may be charac­ terized by three equivalent orthogonal electric and magnetic dipole moments as shown in figure 1. When an unknown source object is placed at the center of a transverse electromagnetic (TEM) cell shown in figure 2 , its radiated energy couples into the fundamental waveguide mode and propagates toward the two output ports of the TEM cell. With a hybrid junction inserted into a loop connecting the cell output ports such as that given in figure 3, one is able to measure the sum and difference powers and the relative phase between the sum and difference outputs. Systematic measure­ ments of these powers and phases at six different source object positions, based on a wel 1-developed theory, are sufficient to determine the amplitude and phases of the unknown component dipole moments, from which the detailed free-space radiation pattern of the unknown source and the total radiated power can be de­ termined. Results of an experiment using a spherical dipole radiator are given to illustrate the theory and measurement procedure. ENEIECTWC raUlfHEKT w m m","PeriodicalId":280076,"journal":{"name":"1982 IEEE International Symposium on Electromagnetic Compatibility","volume":"27 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1982-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"120956686","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Elements of a Topological Barrier for Electromagnetic Interference Control","authors":"W. Graf, E. Vance","doi":"10.1109/ISEMC.1982.7567718","DOIUrl":"https://doi.org/10.1109/ISEMC.1982.7567718","url":null,"abstract":"Although an ideal, topologically closed barrier cannot be achieved, compromises in a barrier can be identified and minimized. This paper discusses the construction of a practial barrier. Untreated pene­ trations are the most serious compromise, followed by apertures and a usually negligible amount of diffu­ sion. In the application of topology to interference control, the establishment of a barrier that is effec­ tively impervious to electromagnetic energy is pos­ sible.","PeriodicalId":280076,"journal":{"name":"1982 IEEE International Symposium on Electromagnetic Compatibility","volume":"72 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1982-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126844924","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"EMC Aspects of Phased Array Radars with Multiple Final Amplifiers","authors":"L. Lieb","doi":"10.1109/ISEMC.1982.7567787","DOIUrl":"https://doi.org/10.1109/ISEMC.1982.7567787","url":null,"abstract":"EMC ASPECTS OF PHASED ARRAY RADARS WITH MULTIPLE FINAL AMPLIFIERS L Lieb, ECAC, Annapolis, MD. Corporate feed phased array radars with multiple final ampli­ fiers have certain unique characteristics which affect their EMC performance. These characteristics present special problems in defining and performing measurements required by military and civilian standards. The frequency-dependence of the mainbeam direction and multiple spurious emission patterns must be con­ sidered when assessing compliancy with MIL-STD-469. The problems encountered in proving the compliance of phased arrays with multiple final amplifiers are discussed.","PeriodicalId":280076,"journal":{"name":"1982 IEEE International Symposium on Electromagnetic Compatibility","volume":"26 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1982-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128517422","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Semcap Analysis of Arc Discharge Effects on Spacecraft","authors":"D. Ying, G. Inouye","doi":"10.1109/ISEMC.1982.7567721","DOIUrl":"https://doi.org/10.1109/ISEMC.1982.7567721","url":null,"abstract":"An analytical approach has been developed to determine the effects of the arc discharge on the space­ craft and to predict the spacecraft electromagnetic interference safety margins. The analysis tool is the Specification and Electromagnetic Compatibility Anal­ ysis Program (SEMCAP) computer code, originally devel­ oped by TRW for analyzing intrasystem and intersystem electromagnetic compatibility. The present paper demonstrates the use of SEMCAP to analyze spacecraft electromagnetic compatibility with respect to arc dis­ charges and also shows how the arc discharges can be modeled as SEMCAP sources.","PeriodicalId":280076,"journal":{"name":"1982 IEEE International Symposium on Electromagnetic Compatibility","volume":"42 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1982-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132114491","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Making Changes to Commercial Computing Devices Under the FCC's Computing Devices Rules - Guidelines for the EMC Professional","authors":"Lawrence J. Movshin","doi":"10.1109/ISEMC.1982.7567708","DOIUrl":"https://doi.org/10.1109/ISEMC.1982.7567708","url":null,"abstract":"Perhaps no single regulatory program over the last two decades has so effectively promoted electromagnetic compatibility (EMC) engineering to a prominent position within the private sector as the Federal Communications Commission's new \"computing devices\" regulations (47 C.F.R. § 15.801 et seq.). Broadly applicable to virtually every device utiliz­ ing digital circuitry, these regulations, which limit the levels of radio frequency emanations from comput­ ing devices, have forced designers, manufacturers and vendors of digital equipment to consider EMC as a primary element in bringing a device to the market­ place .","PeriodicalId":280076,"journal":{"name":"1982 IEEE International Symposium on Electromagnetic Compatibility","volume":"349 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1982-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132164926","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}