八十年代的电磁兼容管理

D. H. Simons
{"title":"八十年代的电磁兼容管理","authors":"D. H. Simons","doi":"10.1109/ISEMC.1982.7567710","DOIUrl":null,"url":null,"abstract":"T he present administration in W ashington has a monumental task in maintaining a super power military status within tight budget constraints. T he President has asked for cooperation from all areas, and each individ­ ual, each discipline, must consider what contribution can be made to this endeavor. M uch can be done in the electromagnetic compatiblity (E M C ) community to minimize costs o f prime weapon systems without compro­ mising electromagnetic compatibility (E M C ) concerns. A plan is presented in this paper to place proper emphasis, and associated monies, in the critical areas of a total E M C program. T h e entire relationship of electromagnetic interference (E M I) design and test, fol­ lowed by E M C design and test, w ill be evaluated from a fresh viewpoint. T his report presents a critical look at E M I test methods and specification limits in relation to the attainment of E M C . Introduction T he ultimate goal of this paper is a new management approach to the work pertinent to attaining E M C . T he misuse o f funds chasing unrealistic E M I specification requirements must be modified. T his author has witnessed E M I test results from several manufactur­ ers’ products wherein emission levels tens o f dB above specification limits have typically not presented an E M C problem in field use. T oo often a manufacturer is pressured by the customer to redesign a system into specification compliance, or at least partial compliance, when the system in its original configuration may have been electromagnetically compatible with its operational environment. T h e E M I results should, to a large degree, be viewed as system characteristics to be used as data for an E M C analysis. Critically low thresholds in susceptibility testing certainly de­ mand immediate corrective action, but this area o f test performance re­ quires further study and evaluation. T he above argument is illustrated in Figure 1, which plots the narrowband (N B ) radiated emission limits of M IL -S T D -4 6 1 A, Notice 4. T h e two radiated susceptibility field levels stipulated in the same specification are also plotted. An 85 dB minimum safety margin exists between the emission and susceptibility test limits; nevertheless, only a 6 dB safety margin is required in the E M C specifica­ tion, M IL -E -6 0 5 1 D .","PeriodicalId":280076,"journal":{"name":"1982 IEEE International Symposium on Electromagnetic Compatibility","volume":"18 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1982-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"Electromagnetic Compatibility Management in the 1980s\",\"authors\":\"D. H. Simons\",\"doi\":\"10.1109/ISEMC.1982.7567710\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"T he present administration in W ashington has a monumental task in maintaining a super power military status within tight budget constraints. T he President has asked for cooperation from all areas, and each individ­ ual, each discipline, must consider what contribution can be made to this endeavor. M uch can be done in the electromagnetic compatiblity (E M C ) community to minimize costs o f prime weapon systems without compro­ mising electromagnetic compatibility (E M C ) concerns. A plan is presented in this paper to place proper emphasis, and associated monies, in the critical areas of a total E M C program. T h e entire relationship of electromagnetic interference (E M I) design and test, fol­ lowed by E M C design and test, w ill be evaluated from a fresh viewpoint. T his report presents a critical look at E M I test methods and specification limits in relation to the attainment of E M C . Introduction T he ultimate goal of this paper is a new management approach to the work pertinent to attaining E M C . T he misuse o f funds chasing unrealistic E M I specification requirements must be modified. T his author has witnessed E M I test results from several manufactur­ ers’ products wherein emission levels tens o f dB above specification limits have typically not presented an E M C problem in field use. T oo often a manufacturer is pressured by the customer to redesign a system into specification compliance, or at least partial compliance, when the system in its original configuration may have been electromagnetically compatible with its operational environment. T h e E M I results should, to a large degree, be viewed as system characteristics to be used as data for an E M C analysis. Critically low thresholds in susceptibility testing certainly de­ mand immediate corrective action, but this area o f test performance re­ quires further study and evaluation. T he above argument is illustrated in Figure 1, which plots the narrowband (N B ) radiated emission limits of M IL -S T D -4 6 1 A, Notice 4. T h e two radiated susceptibility field levels stipulated in the same specification are also plotted. An 85 dB minimum safety margin exists between the emission and susceptibility test limits; nevertheless, only a 6 dB safety margin is required in the E M C specifica­ tion, M IL -E -6 0 5 1 D .\",\"PeriodicalId\":280076,\"journal\":{\"name\":\"1982 IEEE International Symposium on Electromagnetic Compatibility\",\"volume\":\"18 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1982-09-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"1982 IEEE International Symposium on Electromagnetic Compatibility\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISEMC.1982.7567710\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"1982 IEEE International Symposium on Electromagnetic Compatibility","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISEMC.1982.7567710","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2

摘要

在预算紧张的情况下保持超级大国的军事地位,这是现任华盛顿政府的一项艰巨任务。总统要求所有领域的合作,每个人、每个学科都必须考虑能为这项努力作出什么贡献。这可以在电磁兼容性(E M C)社区中完成,在不影响电磁兼容性(E M C)问题的情况下,将主要武器系统的成本降至最低。本文提出了一个计划,以适当的强调和相关的资金,在整个机电一体化计划的关键领域。本文将从一个全新的角度来评估电磁干扰设计与测试的整个关系,以及随后的电磁干扰设计与测试。本报告对机电一体化测试方法和与机电一体化实现相关的规范限制进行了批判性的分析。本文的最终目标是为实现机电一体化提供一种新的管理方法。必须修改将资金滥用于追逐不切实际的机电一体化规范需求的情况。本文作者目睹了几个制造商产品的电磁辐射测试结果,其中排放水平高于规范限值数十dB,在现场使用中通常不会出现电磁辐射问题。制造商经常受到客户的压力,要求重新设计系统,使其符合规范,或者至少部分符合规范,而系统在其原始配置中可能已经与其操作环境具有电磁兼容性。e - M - I结果在很大程度上应被视为系统特征,用作e - M - C分析的数据。药敏试验的临界低阈值当然要求立即采取纠正措施,但这方面的试验性能需要进一步的研究和评价。图1显示了上述论点,图1绘制了M IL -S T D -4 6 1 A的窄带(N B)辐射发射限值,通知4。并绘制了同一规范中规定的两个辐射磁化率场水平。在发射和敏感性测试限值之间存在85 dB的最小安全裕度;然而,只有一个6分贝的安全余量是要求在emc规范,mil -E - 651 D。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Electromagnetic Compatibility Management in the 1980s
T he present administration in W ashington has a monumental task in maintaining a super power military status within tight budget constraints. T he President has asked for cooperation from all areas, and each individ­ ual, each discipline, must consider what contribution can be made to this endeavor. M uch can be done in the electromagnetic compatiblity (E M C ) community to minimize costs o f prime weapon systems without compro­ mising electromagnetic compatibility (E M C ) concerns. A plan is presented in this paper to place proper emphasis, and associated monies, in the critical areas of a total E M C program. T h e entire relationship of electromagnetic interference (E M I) design and test, fol­ lowed by E M C design and test, w ill be evaluated from a fresh viewpoint. T his report presents a critical look at E M I test methods and specification limits in relation to the attainment of E M C . Introduction T he ultimate goal of this paper is a new management approach to the work pertinent to attaining E M C . T he misuse o f funds chasing unrealistic E M I specification requirements must be modified. T his author has witnessed E M I test results from several manufactur­ ers’ products wherein emission levels tens o f dB above specification limits have typically not presented an E M C problem in field use. T oo often a manufacturer is pressured by the customer to redesign a system into specification compliance, or at least partial compliance, when the system in its original configuration may have been electromagnetically compatible with its operational environment. T h e E M I results should, to a large degree, be viewed as system characteristics to be used as data for an E M C analysis. Critically low thresholds in susceptibility testing certainly de­ mand immediate corrective action, but this area o f test performance re­ quires further study and evaluation. T he above argument is illustrated in Figure 1, which plots the narrowband (N B ) radiated emission limits of M IL -S T D -4 6 1 A, Notice 4. T h e two radiated susceptibility field levels stipulated in the same specification are also plotted. An 85 dB minimum safety margin exists between the emission and susceptibility test limits; nevertheless, only a 6 dB safety margin is required in the E M C specifica­ tion, M IL -E -6 0 5 1 D .
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