{"title":"Near-Junction Thermal Management for Wide Bandgap Devices","authors":"A. Bar-Cohen, J. Albrecht, J. Maurer","doi":"10.1109/CSICS.2011.6062454","DOIUrl":"https://doi.org/10.1109/CSICS.2011.6062454","url":null,"abstract":"Near-junction thermal management is critical to achieving the promise of electronic and photonic devices using wide bandgap materials. In such devices, including GaN HEMTs in PAs, the thermal resistance associated with the \"near-junction\" region dominates the heat removal path and is often as large as the thermal resistance of all the other elements in the resistance chain. As part of DARPA's portfolio in Thermal Management Technologies (TMT), efforts are underway to develop transformative, paradigm-changing cooling techniques. This paper will briefly review the thermal management needs of WBG devices and DARPA's Thermal Management Technologies portfolio, with emphasis on the goals and status of these efforts relative to the current State-of-the-Art. Attention will then turn to promising options in near-junction cooling and the challenges inherent in realizing their potential for WBG device thermal management.","PeriodicalId":275064,"journal":{"name":"2011 IEEE Compound Semiconductor Integrated Circuit Symposium (CSICS)","volume":"154 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123258990","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
O. Inac, B. Cetinoneri, M. Uzunkol, Y. Atesal, Gabriel M. Rebeiz
{"title":"Millimeter-Wave and THz Circuits in 45-nm SOI CMOS","authors":"O. Inac, B. Cetinoneri, M. Uzunkol, Y. Atesal, Gabriel M. Rebeiz","doi":"10.1109/CSICS.2011.6062430","DOIUrl":"https://doi.org/10.1109/CSICS.2011.6062430","url":null,"abstract":"This paper presents low-noise amplifiers (LNA) at 45¿C95 GHz, a frequency doubler at 180 GHz, active and passive mixers at 130¿C180 GHz fabricated in 45-nm Semiconductor-On-Insulator (SOI) CMOS process for digital and mixed-signal applications. The measured ft and fmax of a 30¡A1-¿Im transistor are 200 GHz at 0.3 mA/¿Im current density, referenced to the top metal layer. The measured gain and NF of LNAs are 15¿C11 dB and 3.3¿C6.0 dB at 45¿C95 GHz. The balanced doubler results in an output power of 1 mW and 8 dB conversion loss at 180 GHz. Passive double-balanced and active single-balanced mixers achieve conversion loss of 12¿C13 dB at 130¿C180 GHz, and 4 dB with 3-dB bandwidth of 145¿C161 GHz, respectively. This work shows that 45-nm SOI CMOS process results in state-of-the-art performance for millimeter-wave applications.","PeriodicalId":275064,"journal":{"name":"2011 IEEE Compound Semiconductor Integrated Circuit Symposium (CSICS)","volume":"285 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123095812","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
A. Tessmann, H. Massler, U. Lewark, S. Wagner, I. Kallfass, A. Leuther
{"title":"Fully Integrated 300 GHz Receiver S-MMICs in 50 nm Metamorphic HEMT Technology","authors":"A. Tessmann, H. Massler, U. Lewark, S. Wagner, I. Kallfass, A. Leuther","doi":"10.1109/CSICS.2011.6062496","DOIUrl":"https://doi.org/10.1109/CSICS.2011.6062496","url":null,"abstract":"Two fully integrated H-band (220-325 GHz) submillimeter-wave monolithic integrated circuit (S-MMIC) heterodyne receivers have been successfully developed, based on a 50 nm metamorphic high electron mobility transistor (mHEMT) technology. A fabricated fundamental down-conversion receiver achieved a conversion gain of more than 11 dB in the frequency range from 270 to 310 GHz with an LO power of only 12 dBm. Furthermore, a subharmonic receiver S-MMIC was developed, consisting of an active frequency multiplier by three, a two stage driver amplifier, a single-ended resistive mixer, and a four-stage low-noise amplifier, demonstrating a conversion gain of more than 12 dB from 290 to 320 GHz with a subharmonic LO-power of 8 dBm. Grounded coplanar waveguide (GCPW) topology in combination with cascode transistors resulted in a very compact die size of less than 1.25 mm^2.","PeriodicalId":275064,"journal":{"name":"2011 IEEE Compound Semiconductor Integrated Circuit Symposium (CSICS)","volume":"16 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122328506","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"High-Order Multi-Level Optical Transmission for beyond 100 Gb/s Using High-Speed DACs","authors":"S. Yamanaka, Takayuki Kobayashi, M. Nagatani","doi":"10.1109/CSICS.2011.6062478","DOIUrl":"https://doi.org/10.1109/CSICS.2011.6062478","url":null,"abstract":"This paper describes high-speed and high-spectral efficiency optical transmission technologies that focus on channel rates beyond 100 Gb/s. Quadrature amplitude modulation (QAM) is adopted to achieve high spectral efficiency. First, we review recent progress in optical QAM transmission technologies. High-speed digital-to-analog converters (DACs) are key components for generating optical QAM signals. We recently developed a high-speed DAC fabricated by indium phosphide (InP) heterojunction bipolar transistors (HBTs) technology. It has a resolution of 6 bits and operates at up to 28 Gs/s. We performed a 25 GHz-spaced eleven-channel 171 Gb/s 16-QAM transmission experiment using our DAC. We achieved the record spectral efficiency-distance product of 9216 b/s/Hz-km (6.4 b/s/Hz x 1440 km) using the optical 16-QAM format.","PeriodicalId":275064,"journal":{"name":"2011 IEEE Compound Semiconductor Integrated Circuit Symposium (CSICS)","volume":"36 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126037661","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"DC - 10GHz RF Digital to Analog Converter","authors":"M. Choe, Kang-Jin Lee, M. Seo, M. Teshome","doi":"10.1109/CSICS.2011.6062442","DOIUrl":"https://doi.org/10.1109/CSICS.2011.6062442","url":null,"abstract":"Abstract- In this work we present recent results on high-speed, multi-Nyquist Digital-to-Analog Converter (DAC) capable of RF signal generation well above 10GHz. The DAC is implemented Teledyne's InP double heterojunction bipolar transistor (DHBT) with 0.5im emitter width. The technology offers four level of gold interconnect with BCB dielectric, and thin-film resistor and MIM capacitor are available. Return-to-Zero (RZ) current switches are added to current steering DAC for high frequency wideband applications to achieve higher than 1GHz bandwidth. When clocked at 2.3GHz, the DAC output measures better than 60dB spurious-free dynamic range (SFDR) at 1GHz output frequency. With 2.7GHz data clock and 8.1GHz RZ clock, the measured performance is >50dBc SFDR at 8GHz output frequency. The chip measures 1450 x 2100im including bonding pads and dissipates 1.6 watt power.","PeriodicalId":275064,"journal":{"name":"2011 IEEE Compound Semiconductor Integrated Circuit Symposium (CSICS)","volume":"6 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132368314","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Novel HEMT Models with Improved Higher-Order Derivatives and Extracting Their Parameters Using Multibias S-Parameters","authors":"J. Dobes, M. Grábner","doi":"10.1109/CSICS.2011.6062468","DOIUrl":"https://doi.org/10.1109/CSICS.2011.6062468","url":null,"abstract":"Novel two HEMT models are suggested in the paper with improved accuracy of higher-order derivatives, which is very important for modeling radio-frequency devices as mixers, etc. The proposed modifications of the models are based on empirical relations for the transconductance dependence on gate-source voltage. Moreover, a way is suggested how to extract the model parameters of various nonlinear HEMT models from a measured multibias s-parameter data set. The proposed extraction procedure is based on a three-step identification procedure that uses robust optimization methods. Finally, various HEMT models -- including the proposed ones -- are compared in terms of the root-mean-square error of DC characteristics and multibias s-parameters.","PeriodicalId":275064,"journal":{"name":"2011 IEEE Compound Semiconductor Integrated Circuit Symposium (CSICS)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131184383","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
S. Piotrowicz, E. Chartier, O. Jardel, J. Dufraisse, G. Callet, J. Jacquet, D. Lancereau, E. Morvan, R. Aubry, N. Sarazin, C. Dua, M. Oualli, M. A. Di-Forte Poisson, S. Delage
{"title":"Development of InAlN/GaN HEMTs Power Devices in S-Band","authors":"S. Piotrowicz, E. Chartier, O. Jardel, J. Dufraisse, G. Callet, J. Jacquet, D. Lancereau, E. Morvan, R. Aubry, N. Sarazin, C. Dua, M. Oualli, M. A. Di-Forte Poisson, S. Delage","doi":"10.1109/CSICS.2011.6062455","DOIUrl":"https://doi.org/10.1109/CSICS.2011.6062455","url":null,"abstract":"We report on AlInN/GaN HEMTs fabricated using 0.7µm gate length on SiC substrate by Low Pressure Metal Organic Vapor Phase Epitaxy. Static and pulsed DC characteristics show a maximum dc transconductance of 275mS/mm and drain current of 0.9A/mm. Small signal characterizations show Ft and Fmag of 15 and 40 GHz respectively. Load-pull power measurements were performed at S-Band. At 3.5 GHz, an output power of 13W (41.2dBm) corresponding to 6.6W/mm of power density with a PAE of 70% is reached in pulse mode on 2mm devices. 19.2mm power dies allow us to achieve an output power of 56W with 54% of PAE at 2 GHz. To our knowledge, this result represents the highest output power ever reported for AlInN-based HEMT technology.","PeriodicalId":275064,"journal":{"name":"2011 IEEE Compound Semiconductor Integrated Circuit Symposium (CSICS)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134488946","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"III-V Quantum Well Field Effect Transistors on Silicon for Future High Performance and Low Power Logic Applications","authors":"G. Dewey, M. Radosavljevic, N. Mukherjee","doi":"10.1109/CSICS.2011.6062431","DOIUrl":"https://doi.org/10.1109/CSICS.2011.6062431","url":null,"abstract":"This work summarizes the advantages and challenges of III-V channel transistors for high performance and low power logic applications with respect to Si CMOS. The challenge of heterogeneous integration of III-V on Si is addressed by integration of In0.7Ga0.3As QWFETs on Si substrates with a total composite buffer thickness successfully scaled down to 1.3um. The main advantages are demonstrated with Schottky-Gate In0.7Ga0.3As QWFET on Si substrate showing 4.6X to 3.3X effective velocity gain over Si n-MOSFET for a VCC range of 0.5V to 1.0V, and 65% intrinsic drive current gain over Si nMOSFET at VCC = 0.5V. In addition, the challenge of further scaling and reduction of the high gate leakage that occurs in Schottky-gate devices is addressed by successful integration of an advanced composite high-K gate stack in the In0.7Ga0.3As QWFET.","PeriodicalId":275064,"journal":{"name":"2011 IEEE Compound Semiconductor Integrated Circuit Symposium (CSICS)","volume":"35 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114915408","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
H. T. Than, G. Sun, G. S. Cuellar, J. Zeng, N. T. Schultz, M. E. Moya, Y. Chung, B. Deckman, M. DeLisio
{"title":"A 600-W C-Band Amplifier Using Spatially Combined GaAs FETs","authors":"H. T. Than, G. Sun, G. S. Cuellar, J. Zeng, N. T. Schultz, M. E. Moya, Y. Chung, B. Deckman, M. DeLisio","doi":"10.1109/CSICS.2011.6062434","DOIUrl":"https://doi.org/10.1109/CSICS.2011.6062434","url":null,"abstract":"This paper describes the design and performance of a C-band amplifier with over 600 Watts of saturated output power. This amplifier is intended for use in commercial broadcast satellite uplink base stations. The amplifier uses spatial power combining to combine the output powers of sixteen internally matched 45-W GaAs FETs. The amplifier also comprises pre-amplification and driver amplification stages, a level control variable attenuator, and a predistortion linearizer. The unit also includes a power supply as well as a user monitor and control interface. We will present various measures of this amplifier's linearity performance, demonstrating its suitability for use in broadcast applications.","PeriodicalId":275064,"journal":{"name":"2011 IEEE Compound Semiconductor Integrated Circuit Symposium (CSICS)","volume":"59 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114611533","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
M. Schroter, A. Pawlak, P. Sakalas, J. Krause, T. Nardmann
{"title":"SiGeC and InP HBT Compact Modeling for mm-Wave and THz Applications","authors":"M. Schroter, A. Pawlak, P. Sakalas, J. Krause, T. Nardmann","doi":"10.1109/CSICS.2011.6062466","DOIUrl":"https://doi.org/10.1109/CSICS.2011.6062466","url":null,"abstract":"An overview on compact transistor modeling for mm-wave HBT technologies is provided. Using HICUM as a vehicle, a comparison to experimental DC, AC and large-signal data is performed. Selected examples are shown for advanced SiGeC and InP HBTs with operating frequencies (fT, fmax) of (300, 500) GHz and (350, 450) GHz, respectively. Good agreement between model and measurements is obtained for all characteristics","PeriodicalId":275064,"journal":{"name":"2011 IEEE Compound Semiconductor Integrated Circuit Symposium (CSICS)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129605689","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}