{"title":"改进高阶导数的新型HEMT模型及多偏置s参数提取方法","authors":"J. Dobes, M. Grábner","doi":"10.1109/CSICS.2011.6062468","DOIUrl":null,"url":null,"abstract":"Novel two HEMT models are suggested in the paper with improved accuracy of higher-order derivatives, which is very important for modeling radio-frequency devices as mixers, etc. The proposed modifications of the models are based on empirical relations for the transconductance dependence on gate-source voltage. Moreover, a way is suggested how to extract the model parameters of various nonlinear HEMT models from a measured multibias s-parameter data set. The proposed extraction procedure is based on a three-step identification procedure that uses robust optimization methods. Finally, various HEMT models -- including the proposed ones -- are compared in terms of the root-mean-square error of DC characteristics and multibias s-parameters.","PeriodicalId":275064,"journal":{"name":"2011 IEEE Compound Semiconductor Integrated Circuit Symposium (CSICS)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2011-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"6","resultStr":"{\"title\":\"Novel HEMT Models with Improved Higher-Order Derivatives and Extracting Their Parameters Using Multibias S-Parameters\",\"authors\":\"J. Dobes, M. Grábner\",\"doi\":\"10.1109/CSICS.2011.6062468\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Novel two HEMT models are suggested in the paper with improved accuracy of higher-order derivatives, which is very important for modeling radio-frequency devices as mixers, etc. The proposed modifications of the models are based on empirical relations for the transconductance dependence on gate-source voltage. Moreover, a way is suggested how to extract the model parameters of various nonlinear HEMT models from a measured multibias s-parameter data set. The proposed extraction procedure is based on a three-step identification procedure that uses robust optimization methods. Finally, various HEMT models -- including the proposed ones -- are compared in terms of the root-mean-square error of DC characteristics and multibias s-parameters.\",\"PeriodicalId\":275064,\"journal\":{\"name\":\"2011 IEEE Compound Semiconductor Integrated Circuit Symposium (CSICS)\",\"volume\":\"1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2011-11-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"6\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2011 IEEE Compound Semiconductor Integrated Circuit Symposium (CSICS)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/CSICS.2011.6062468\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2011 IEEE Compound Semiconductor Integrated Circuit Symposium (CSICS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CSICS.2011.6062468","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Novel HEMT Models with Improved Higher-Order Derivatives and Extracting Their Parameters Using Multibias S-Parameters
Novel two HEMT models are suggested in the paper with improved accuracy of higher-order derivatives, which is very important for modeling radio-frequency devices as mixers, etc. The proposed modifications of the models are based on empirical relations for the transconductance dependence on gate-source voltage. Moreover, a way is suggested how to extract the model parameters of various nonlinear HEMT models from a measured multibias s-parameter data set. The proposed extraction procedure is based on a three-step identification procedure that uses robust optimization methods. Finally, various HEMT models -- including the proposed ones -- are compared in terms of the root-mean-square error of DC characteristics and multibias s-parameters.