发布求助
文献互助 智能选刊 最新文献

2019 19th European Conference on Radiation and Its Effects on Components and Systems (RADECS)最新文献

筛选
英文 中文
Dosimetric characterization of an irradiation set-up for electronic components testing at the TOP-IMPLART proton linear accelerator TOP-IMPLART质子直线加速器电子元件测试辐照装置的剂量学表征
2019 19th European Conference on Radiation and Its Effects on Components and Systems (RADECS) Pub Date : 2019-09-01 DOI: 10.1109/radecs47380.2019.9745701
G. Bazzano, A. Ampollini, L. Blasi, F. Cardelli, E. Cisbani, C. De Angelis, S. Monache, A. Mastrandrea, F. Menichelli, P. Nenzi, M. Olivieri, G. Palmerini, L. Picardi, M. Piccinini, C. Ronsivalle, M. Sabatini, F. Vigli
{"title":"Dosimetric characterization of an irradiation set-up for electronic components testing at the TOP-IMPLART proton linear accelerator","authors":"G. Bazzano, A. Ampollini, L. Blasi, F. Cardelli, E. Cisbani, C. De Angelis, S. Monache, A. Mastrandrea, F. Menichelli, P. Nenzi, M. Olivieri, G. Palmerini, L. Picardi, M. Piccinini, C. Ronsivalle, M. Sabatini, F. Vigli","doi":"10.1109/radecs47380.2019.9745701","DOIUrl":"https://doi.org/10.1109/radecs47380.2019.9745701","url":null,"abstract":"This contribution describes the irradiation set-up for electronic and space components testing with pulsed 30 MeV proton beam of high instantaneous dose rate provided by the TOP-IMPLART linear accelerator at ENEA Frascati Research Centre.","PeriodicalId":269018,"journal":{"name":"2019 19th European Conference on Radiation and Its Effects on Components and Systems (RADECS)","volume":"65 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128468922","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Voltage Supervisors Post Heavy Ion Irradiation Behavior After Holding in SEL 电压监控器后的重离子辐照行为后，保持在SEL
2019 19th European Conference on Radiation and Its Effects on Components and Systems (RADECS) Pub Date : 2019-09-01 DOI: 10.1109/radecs47380.2019.9745652
Sergey L. Vorobiev, Oleg A. Bakhirko, L. Bakirov, P. Chubunov, V. Anashin, Alexandr E. Koziukov, Sergey A. Iakovlev
{"title":"Voltage Supervisors Post Heavy Ion Irradiation Behavior After Holding in SEL","authors":"Sergey L. Vorobiev, Oleg A. Bakhirko, L. Bakirov, P. Chubunov, V. Anashin, Alexandr E. Koziukov, Sergey A. Iakovlev","doi":"10.1109/radecs47380.2019.9745652","DOIUrl":"https://doi.org/10.1109/radecs47380.2019.9745652","url":null,"abstract":"In this study we performed the radiation tests on the TPS3305-18DGN and MAX6755UKLD3+T voltage supervisors to characterize its resistance to heavy ion irradiation. The paper provides the test conditions, results of parametric and functional checks and tests during and after irradiation and estimation of samples behavior after they holding in SEL state.","PeriodicalId":269018,"journal":{"name":"2019 19th European Conference on Radiation and Its Effects on Components and Systems (RADECS)","volume":"283 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134098240","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Impact of High-Energy Proton Irradiation on MoS2 Films and Its Field Effect Transistors 高能质子辐照对MoS2薄膜及其场效应晶体管的影响
2019 19th European Conference on Radiation and Its Effects on Components and Systems (RADECS) Pub Date : 2019-09-01 DOI: 10.1109/radecs47380.2019.9745685
Huiping Zhu, Lei Wang, Jingyuan Shi, Xin-nan Huang, Z. Zheng, Guodong Xiong, Bo Li, Q. Gao, Bin Yang, Jiajun Luo, Zhengsheng Han, Xinyu Liu
{"title":"Impact of High-Energy Proton Irradiation on MoS2 Films and Its Field Effect Transistors","authors":"Huiping Zhu, Lei Wang, Jingyuan Shi, Xin-nan Huang, Z. Zheng, Guodong Xiong, Bo Li, Q. Gao, Bin Yang, Jiajun Luo, Zhengsheng Han, Xinyu Liu","doi":"10.1109/radecs47380.2019.9745685","DOIUrl":"https://doi.org/10.1109/radecs47380.2019.9745685","url":null,"abstract":"Sulfur vacancies introduced by proton irradiation in the MoS<inf>2</inf> film cause the multilayer MoS<inf>2</inf> to be decoupled, resulting in a indirect-to-direct bandgap transition. Unlike the irradiation-introduced interface states, sulfur vacancies can improve the performance of MoS<inf>2</inf> FET devices.","PeriodicalId":269018,"journal":{"name":"2019 19th European Conference on Radiation and Its Effects on Components and Systems (RADECS)","volume":"27 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134147897","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
The RADECS2019 Awards Committee RADECS2019颁奖委员会
2019 19th European Conference on Radiation and Its Effects on Components and Systems (RADECS) Pub Date : 2019-09-01 DOI: 10.1109/radecs47380.2019.9745648
{"title":"The RADECS2019 Awards Committee","authors":"","doi":"10.1109/radecs47380.2019.9745648","DOIUrl":"https://doi.org/10.1109/radecs47380.2019.9745648","url":null,"abstract":"","PeriodicalId":269018,"journal":{"name":"2019 19th European Conference on Radiation and Its Effects on Components and Systems (RADECS)","volume":"34 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128829544","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Radiation characterization of COTS MicroSD Memories for CERN applications 用于CERN应用的COTS MicroSD存储器的辐射特性
2019 19th European Conference on Radiation and Its Effects on Components and Systems (RADECS) Pub Date : 2019-09-01 DOI: 10.1109/radecs47380.2019.9745717
G. Piscopo, C. McAllister, G. Tsiligiannis, S. Danzeca, A. Masi
{"title":"Radiation characterization of COTS MicroSD Memories for CERN applications","authors":"G. Piscopo, C. McAllister, G. Tsiligiannis, S. Danzeca, A. Masi","doi":"10.1109/radecs47380.2019.9745717","DOIUrl":"https://doi.org/10.1109/radecs47380.2019.9745717","url":null,"abstract":"MicroSD Cards are a low-cost, simple and fast method to have a non-volatile memory on an embedded system. In this work several MicroSD Cards have been tested to measure their performances and life time under proton induced radiation. The MicroSD cards have been tested in order to verify their suitability to be used in a particle accelerator such as the Large Hadron Collider (LHC) at CERN. The Single Event Effects (SEE) and Total Ionizing Dose (TID) effects of each MicroSD Card will be presented.","PeriodicalId":269018,"journal":{"name":"2019 19th European Conference on Radiation and Its Effects on Components and Systems (RADECS)","volume":"111 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"117231881","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Highlight of Total Ionizing Dose Effects on RF Front-ends by means of Microwave Nonlinear Characterization 用微波非线性表征方法研究射频前端总电离剂量效应
2019 19th European Conference on Radiation and Its Effects on Components and Systems (RADECS) Pub Date : 2019-09-01 DOI: 10.1109/radecs47380.2019.9745729
J. Raoult, S. Jarrix, L. Chusseau, T. Maraine, J. Boch
{"title":"Highlight of Total Ionizing Dose Effects on RF Front-ends by means of Microwave Nonlinear Characterization","authors":"J. Raoult, S. Jarrix, L. Chusseau, T. Maraine, J. Boch","doi":"10.1109/radecs47380.2019.9745729","DOIUrl":"https://doi.org/10.1109/radecs47380.2019.9745729","url":null,"abstract":"High frequency front-ends are X-ray irradiated in biased and unbiased configurations. The high-frequency nonlinear response of the integrated PAs and LNAs to harmonic and two-tone excitations are studied. The impact of the bias configuration with respect to irradiation is highlighted. Considering high frequency characterization, measurements of the reflected IM3 tone at the input as well as the power response to a single tone excitement are implemented. They are shown interesting tools for predicting dysfunctionalities in high frequency circuits with respect to TID.","PeriodicalId":269018,"journal":{"name":"2019 19th European Conference on Radiation and Its Effects on Components and Systems (RADECS)","volume":"34 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125692925","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Six-Faces Induced Margins on Dose Calculation and Proposal for a New Satellite Geometry Exchange method 剂量计算中的六面诱导余量及一种新的卫星几何交换方法的提出
2019 19th European Conference on Radiation and Its Effects on Components and Systems (RADECS) Pub Date : 2019-09-01 DOI: 10.1109/radecs47380.2019.9745666
A. Varotsou, P. Pourrouquet, R. Benacquista, R. Mangeret, Lee Pater, G. Santin, Hugh Evans, D. Standarovski, R. Ecoffet
{"title":"Six-Faces Induced Margins on Dose Calculation and Proposal for a New Satellite Geometry Exchange method","authors":"A. Varotsou, P. Pourrouquet, R. Benacquista, R. Mangeret, Lee Pater, G. Santin, Hugh Evans, D. Standarovski, R. Ecoffet","doi":"10.1109/radecs47380.2019.9745666","DOIUrl":"https://doi.org/10.1109/radecs47380.2019.9745666","url":null,"abstract":"Very often the satellite platform geometry as well as the equipment one are confidential and cannot be shared between partners in a space project. In order to perform radiation analysis at electronic component level, the 6-faces method is commonly used for geometry information exchange between primes and subcontractors. However, this method is known to be quite conservative. In the frame of the ESA funded project GTREFF the margins induced by the use of the 6-faces method were identified and analyzed for a typical geostationary mission. Following this, a new method was proposed and studied in the frame of a CNES funded project, with promising results.","PeriodicalId":269018,"journal":{"name":"2019 19th European Conference on Radiation and Its Effects on Components and Systems (RADECS)","volume":"14 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131917849","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Temperature Response on NPN and PNP Bipolar Junction Transistors after Total Ionizing Dose Irradiation Exposure 总电离剂量照射后NPN和PNP双极结晶体管的温度响应
2019 19th European Conference on Radiation and Its Effects on Components and Systems (RADECS) Pub Date : 2019-09-01 DOI: 10.1109/radecs47380.2019.9745653
A. Privat, H. Barnaby, B. Tolleson, K. Muthuseenu, P. Adell
{"title":"Temperature Response on NPN and PNP Bipolar Junction Transistors after Total Ionizing Dose Irradiation Exposure","authors":"A. Privat, H. Barnaby, B. Tolleson, K. Muthuseenu, P. Adell","doi":"10.1109/radecs47380.2019.9745653","DOIUrl":"https://doi.org/10.1109/radecs47380.2019.9745653","url":null,"abstract":"A temperature-dependent analytical model for total-ionizing-dose-induced excess base current in BJTs is proposed. Model captures base current evolution with temperature on irradiated parts. In this work, BJTs are irradiated at room temperature. Base currents are obtained and the concentrations of oxide defects created during irradiation are calculated. Both base current and defect densities resulting from room temperature irradiations are used as inputs to SPICE simulations and the analytical model. Experimental data obtained from measurements at both low and high temperatures on parts irradiated at room temperature are shown to compare well to the simulation results and analytical model over a range of temperatures.","PeriodicalId":269018,"journal":{"name":"2019 19th European Conference on Radiation and Its Effects on Components and Systems (RADECS)","volume":"39 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130592664","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
An Approximate Error-Detection Technique for Multi-Core Real-Time Systems 多核实时系统的近似错误检测技术
2019 19th European Conference on Radiation and Its Effects on Components and Systems (RADECS) Pub Date : 2019-09-01 DOI: 10.1109/radecs47380.2019.9745688
G. Rodrigues, Adria Barros, Israel C. Lopes, V. Pouget, A. Bosio, F. Kastensmidt
{"title":"An Approximate Error-Detection Technique for Multi-Core Real-Time Systems","authors":"G. Rodrigues, Adria Barros, Israel C. Lopes, V. Pouget, A. Bosio, F. Kastensmidt","doi":"10.1109/radecs47380.2019.9745688","DOIUrl":"https://doi.org/10.1109/radecs47380.2019.9745688","url":null,"abstract":"This paper presents a parallel error detection method evaluated using laser fault injection on a dual-core ARM processor. It exploits approximation to improve performance. Results are satisfactory, especially with algorithms that are not memory-intensive.","PeriodicalId":269018,"journal":{"name":"2019 19th European Conference on Radiation and Its Effects on Components and Systems (RADECS)","volume":"38 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130538035","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Cross-Calibration of Various SEE Test Methods Including Pulsed X-rays and Application to SEL and SEU 包括脉冲x射线在内的各种SEE测试方法的交叉校准及其在SEL和SEU中的应用
2019 19th European Conference on Radiation and Its Effects on Components and Systems (RADECS) Pub Date : 2019-09-01 DOI: 10.1109/radecs47380.2019.9745662
G. Augustin, M. Mauguet, N. Andrianjohany, N. Chatry, F. Bezerra, E. Capria, M. Sander, K. Voss
{"title":"Cross-Calibration of Various SEE Test Methods Including Pulsed X-rays and Application to SEL and SEU","authors":"G. Augustin, M. Mauguet, N. Andrianjohany, N. Chatry, F. Bezerra, E. Capria, M. Sander, K. Voss","doi":"10.1109/radecs47380.2019.9745662","DOIUrl":"https://doi.org/10.1109/radecs47380.2019.9745662","url":null,"abstract":"This work is a contribution to the use of alternative SEE test methods. We first report collected charge measurements and simulations in a p-i-n photodiode. The main purpose was to evaluate parameters leading to the correlation between heavy ion broadbeam and microbeam, pulsed X-rays and laser pulses. This study also relies on coupled and analytical simulation to further understand the physical phenomena involved. SEL current shape acquired on a CMOS ASIC were also analyzed and confirm the correlation of these test methods at the temporal scale. These results were then used to study SEU bursts in an SRAM with pulsed X-rays and heavy ions.","PeriodicalId":269018,"journal":{"name":"2019 19th European Conference on Radiation and Its Effects on Components and Systems (RADECS)","volume":"24 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115079327","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
首页 上一页 下一页 尾页
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整，为了账户安全，请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
请完成安全验证×
相关产品
×
本文献相关产品
联系我们：info@booksci.cn Book学术提供免费学术资源搜索服务，方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号：481959085
Book学术官方微信