用微波非线性表征方法研究射频前端总电离剂量效应

2019 19th European Conference on Radiation and Its Effects on Components and Systems (RADECS) Pub Date : 2019-09-01 DOI:10.1109/radecs47380.2019.9745729

J. Raoult, S. Jarrix, L. Chusseau, T. Maraine, J. Boch

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引用次数: 0

摘要

高频前端以偏置和无偏置构型进行x射线照射。研究了集成PAs和LNAs在谐波和双音激励下的高频非线性响应。偏置结构对辐照的影响是突出的。考虑到高频特性，测量了输入处反射的IM3音调以及单音激励的功率响应。它们被证明是预测高频电路中与TID相关的功能障碍的有趣工具。

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Highlight of Total Ionizing Dose Effects on RF Front-ends by means of Microwave Nonlinear Characterization

High frequency front-ends are X-ray irradiated in biased and unbiased configurations. The high-frequency nonlinear response of the integrated PAs and LNAs to harmonic and two-tone excitations are studied. The impact of the bias configuration with respect to irradiation is highlighted. Considering high frequency characterization, measurements of the reflected IM3 tone at the input as well as the power response to a single tone excitement are implemented. They are shown interesting tools for predicting dysfunctionalities in high frequency circuits with respect to TID.

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2019 19th European Conference on Radiation and Its Effects on Components and Systems (RADECS)

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