Radiation characterization of COTS MicroSD Memories for CERN applications

Abstract

MicroSD Cards are a low-cost, simple and fast method to have a non-volatile memory on an embedded system. In this work several MicroSD Cards have been tested to measure their performances and life time under proton induced radiation. The MicroSD cards have been tested in order to verify their suitability to be used in a particle accelerator such as the Large Hadron Collider (LHC) at CERN. The Single Event Effects (SEE) and Total Ionizing Dose (TID) effects of each MicroSD Card will be presented.