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Comparison of power ratio and vector network analyzer techniques for measuring attenuation 功率比和矢量网络分析仪测量衰减技术的比较
80th ARFTG Microwave Measurement Conference Pub Date : 2012-11-01 DOI: 10.1109/ARFTG.2012.6422438
C. Chirgwin, T. Crowley, W. Fang, D. LeGolvan
{"title":"Comparison of power ratio and vector network analyzer techniques for measuring attenuation","authors":"C. Chirgwin, T. Crowley, W. Fang, D. LeGolvan","doi":"10.1109/ARFTG.2012.6422438","DOIUrl":"https://doi.org/10.1109/ARFTG.2012.6422438","url":null,"abstract":"By using a power ratio technique, we have lowered our uncertainty for attenuation measurements by a factor of about 4 (typical) when compared to our vector network analyzer uncertainty analysis. The power ratio technique is applicable to insertable 2-port devices with low reflection coefficients such as airlines and attenuators. The method is illustrated with 3 coaxial devices over a frequency range of 2-18 GHz and 2 rectangular waveguide devices over a frequency range of 50-75 GHz. Our results suggest that a significantly lower attenuation uncertainty could be justified by a re-analysis of the vector network analyzer measurements.","PeriodicalId":262198,"journal":{"name":"80th ARFTG Microwave Measurement Conference","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2012-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128321613","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
High power nonlinear measurements: Calibration issues, real time loadpull, and other RF data 高功率非线性测量:校准问题、实时负载拉力和其他射频数据
80th ARFTG Microwave Measurement Conference Pub Date : 2012-11-01 DOI: 10.1109/ARFTG.2012.6422435
C. Setzer
{"title":"High power nonlinear measurements: Calibration issues, real time loadpull, and other RF data","authors":"C. Setzer","doi":"10.1109/ARFTG.2012.6422435","DOIUrl":"https://doi.org/10.1109/ARFTG.2012.6422435","url":null,"abstract":"Effective high power microwave amplifier design and system modeling require accurate nonlinear models, which, in turn, require measurement of at least 3 harmonics with NIST traceable phase reference between them. Exceeding a decade of measurement bandwidth at microwave frequencies can be problematic, and a fraction of a dB of calibration error can lead to 10's of percentage points of “disappointment” in performance for the physical prototype[1]-[2]. Issues related to calibration and accurate wideband measurements for building an S Function model are presented. Pre-measurements required for efficient model extraction can include real time loadpull and “design” of the power amplifier.","PeriodicalId":262198,"journal":{"name":"80th ARFTG Microwave Measurement Conference","volume":"67 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2012-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127111733","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
An innovative waveguide interface and quarter-wavelength shim for the 220∓325 GHz band 创新的波导接口和四分之一波长垫片，可用于220 - 325 GHz频段
80th ARFTG Microwave Measurement Conference Pub Date : 2012-11-01 DOI: 10.1109/ARFTG.2012.6422431
Y. Lau, D. Vondran
{"title":"An innovative waveguide interface and quarter-wavelength shim for the 220∓325 GHz band","authors":"Y. Lau, D. Vondran","doi":"10.1109/ARFTG.2012.6422431","DOIUrl":"https://doi.org/10.1109/ARFTG.2012.6422431","url":null,"abstract":"An innovative waveguide flange offers superior alignment based on a concentric mating mechanism consisting of a boss and jack interface. Above 100 GHz, this flange interface improves repeatability and precision of S-parameters measurements by eliminating the mechanical tolerance build-up associated with separate alignment pins. By simplifying the build-up of tolerance to only the boss and jack interface, the alignment improves match, precision, repeatability and residual calibration performance for mm-wave and sub-mm-wave S-parameter measurements. This flange is entirely compatible with the MIL-DTL-3922/67D standard. This paper presents connection repeatability for 220-325 GHz (WR-03 band). This flange is awaiting standardization in the P1785 working group of IEEE.","PeriodicalId":262198,"journal":{"name":"80th ARFTG Microwave Measurement Conference","volume":"3 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2012-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129392889","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 9
Hybrid multi-harmonic load- and source-pull system 混合多谐负载-源-拉系统
80th ARFTG Microwave Measurement Conference Pub Date : 2012-11-01 DOI: 10.1109/ARFTG.2012.6422433
J. Essing, F. A. Malekzadeh, A. V. van Roermund, R. Mahmoudi
{"title":"Hybrid multi-harmonic load- and source-pull system","authors":"J. Essing, F. A. Malekzadeh, A. V. van Roermund, R. Mahmoudi","doi":"10.1109/ARFTG.2012.6422433","DOIUrl":"https://doi.org/10.1109/ARFTG.2012.6422433","url":null,"abstract":"This paper describes a novel broadband hybrid load- and source-pull system. It eliminates the need for a variable attenuator and variable phase-shifter and it employs the conventional passive tuner calibration procedure. It is established around a Gamma Boosting Unit (GBU), which is composed of two directional couplers and an auxiliary amplifier and which resembles a positive feedback loop. Device measurements at 900MHz and 30GHz demonstrate a significant improvement for the measured output efficiency and transducer gain.","PeriodicalId":262198,"journal":{"name":"80th ARFTG Microwave Measurement Conference","volume":"18 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2012-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124453455","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Method for obtaining noise parameters using a vector network analyzer with an integrated noise receiver 使用带有集成噪声接收器的矢量网络分析仪获得噪声参数的方法
80th ARFTG Microwave Measurement Conference Pub Date : 2012-11-01 DOI: 10.1109/ARFTG.2012.6422439
R. D. Hayward
{"title":"Method for obtaining noise parameters using a vector network analyzer with an integrated noise receiver","authors":"R. D. Hayward","doi":"10.1109/ARFTG.2012.6422439","DOIUrl":"https://doi.org/10.1109/ARFTG.2012.6422439","url":null,"abstract":"Agilent Technologies PNA-X Option 029 provides capability for noise figure measurements in a 50 Ohm environment. This paper describes a method for extending the analyzer's capability to obtain measurements for noise parameter extraction. A source tuner is characterized at various tuner states. Each tuner state is de-embedded into the network analyzer dynamically. High sensitivity noise and in-situ gain measurements provide accurate noise figure to be captured at any reflection coefficient. Noise parameters may then be extracted from the subsequent measurements.","PeriodicalId":262198,"journal":{"name":"80th ARFTG Microwave Measurement Conference","volume":"15 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2012-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115433856","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
A neural network approach to smooth calibrated data corrupted from switching errors 一种神经网络方法来平滑因切换错误而损坏的校准数据
80th ARFTG Microwave Measurement Conference Pub Date : 2012-11-01 DOI: 10.1109/ARFTG.2012.6422428
A. Z. Landa, M. Pulido-Gaytán, J. Reynoso‐Hernández, P. Roblin, J. R. Loo-Yau
{"title":"A neural network approach to smooth calibrated data corrupted from switching errors","authors":"A. Z. Landa, M. Pulido-Gaytán, J. Reynoso‐Hernández, P. Roblin, J. R. Loo-Yau","doi":"10.1109/ARFTG.2012.6422428","DOIUrl":"https://doi.org/10.1109/ARFTG.2012.6422428","url":null,"abstract":"A reliable calibration of the vector network analyzer is needed in order to characterize microwave devices. For some VNAs, such as HP8510, solving the 8 error model is not enough to accurately compute the device under test (DUT) S-parameters, but also, a correction of the switching errors inherent to the measurement must be performed. In this paper, a neural network is used to find the S-parameters of the DUT free from switching errors instead of calculating the well-known equations used for that matter.","PeriodicalId":262198,"journal":{"name":"80th ARFTG Microwave Measurement Conference","volume":"12 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2012-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134399967","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
On improving mm-wave noise figure measurements 改进毫米波噪声系数测量
80th ARFTG Microwave Measurement Conference Pub Date : 2012-11-01 DOI: 10.1109/ARFTG.2012.6422440
J. Martens
{"title":"On improving mm-wave noise figure measurements","authors":"J. Martens","doi":"10.1109/ARFTG.2012.6422440","DOIUrl":"https://doi.org/10.1109/ARFTG.2012.6422440","url":null,"abstract":"The increasing prevalence of E-band, W-band, and higher mm-wave applications has led to an increased need for noise figure measurements at these frequencies. As usual, the measurement complexities increase with frequency and among those of note for noise figure are power/noise level calibration issues, and larger numbers of image conversions both within the receiver and potentially within the DUT itself. A better understanding of the uncertainty mechanisms associated with these issues, which can dominate over traditional concerns of linearity and match handling, can help to improve measurement results. This paper will use measurement data to analyze these effects semi-quantitatively and look at impacts on measurements at W-band and beyond.","PeriodicalId":262198,"journal":{"name":"80th ARFTG Microwave Measurement Conference","volume":"17 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2012-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134515640","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Characterizing WR-8 waveguide-to-CPW probes using two methods implemented within the NIST Uncertainty Framework 使用NIST不确定性框架内实现的两种方法表征WR-8波导到cpw探头
80th ARFTG Microwave Measurement Conference Pub Date : 2012-11-01 DOI: 10.1109/ARFTG.2012.6422429
J. Jargon, U. Arz, D. Williams
{"title":"Characterizing WR-8 waveguide-to-CPW probes using two methods implemented within the NIST Uncertainty Framework","authors":"J. Jargon, U. Arz, D. Williams","doi":"10.1109/ARFTG.2012.6422429","DOIUrl":"https://doi.org/10.1109/ARFTG.2012.6422429","url":null,"abstract":"We individually characterize and provide uncertainties for a pair of WR-8 rectangular waveguide-to-coplanar waveguide (CPW) probes over a frequency range of 90 to 140 GHz utilizing two methods implemented within the NIST Microwave Uncertainty Framework. The first method consists of a two-tier approach, where a vector network analyzer (VNA) calibration is first performed in rectangular waveguide, and then a second-tier calibration is performed on-wafer. The second method determines the scattering parameters of the probes from two one-tier calibrations. We show that the two methods yield nearly equivalent results and uncertainties.","PeriodicalId":262198,"journal":{"name":"80th ARFTG Microwave Measurement Conference","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2012-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130937491","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 14
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