{"title":"改进毫米波噪声系数测量","authors":"J. Martens","doi":"10.1109/ARFTG.2012.6422440","DOIUrl":null,"url":null,"abstract":"The increasing prevalence of E-band, W-band, and higher mm-wave applications has led to an increased need for noise figure measurements at these frequencies. As usual, the measurement complexities increase with frequency and among those of note for noise figure are power/noise level calibration issues, and larger numbers of image conversions both within the receiver and potentially within the DUT itself. A better understanding of the uncertainty mechanisms associated with these issues, which can dominate over traditional concerns of linearity and match handling, can help to improve measurement results. This paper will use measurement data to analyze these effects semi-quantitatively and look at impacts on measurements at W-band and beyond.","PeriodicalId":262198,"journal":{"name":"80th ARFTG Microwave Measurement Conference","volume":"17 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2012-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"On improving mm-wave noise figure measurements\",\"authors\":\"J. Martens\",\"doi\":\"10.1109/ARFTG.2012.6422440\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The increasing prevalence of E-band, W-band, and higher mm-wave applications has led to an increased need for noise figure measurements at these frequencies. As usual, the measurement complexities increase with frequency and among those of note for noise figure are power/noise level calibration issues, and larger numbers of image conversions both within the receiver and potentially within the DUT itself. A better understanding of the uncertainty mechanisms associated with these issues, which can dominate over traditional concerns of linearity and match handling, can help to improve measurement results. This paper will use measurement data to analyze these effects semi-quantitatively and look at impacts on measurements at W-band and beyond.\",\"PeriodicalId\":262198,\"journal\":{\"name\":\"80th ARFTG Microwave Measurement Conference\",\"volume\":\"17 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2012-11-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"80th ARFTG Microwave Measurement Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ARFTG.2012.6422440\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"80th ARFTG Microwave Measurement Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ARFTG.2012.6422440","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
The increasing prevalence of E-band, W-band, and higher mm-wave applications has led to an increased need for noise figure measurements at these frequencies. As usual, the measurement complexities increase with frequency and among those of note for noise figure are power/noise level calibration issues, and larger numbers of image conversions both within the receiver and potentially within the DUT itself. A better understanding of the uncertainty mechanisms associated with these issues, which can dominate over traditional concerns of linearity and match handling, can help to improve measurement results. This paper will use measurement data to analyze these effects semi-quantitatively and look at impacts on measurements at W-band and beyond.