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Complete power sensor calibration using a VNA 使用VNA完成功率传感器校准
80th ARFTG Microwave Measurement Conference Pub Date : 2012-11-01 DOI: 10.1109/ARFTG.2012.6422420
Ken Wong
{"title":"Complete power sensor calibration using a VNA","authors":"Ken Wong","doi":"10.1109/ARFTG.2012.6422420","DOIUrl":"https://doi.org/10.1109/ARFTG.2012.6422420","url":null,"abstract":"Typically, power sensors are calibrated for input reflection coefficient, calibration efficiency factor and linearity. Some new power sensors also need absolute power calibration. Multiple systems are used to measure each of the parameters. With an appropriately configured VNA, all the measurements can be performed with a single connection and set up. This paper shows how it is done and expected uncertainties.","PeriodicalId":262198,"journal":{"name":"80th ARFTG Microwave Measurement Conference","volume":"80 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2012-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115766706","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 5
A procedure for measurement of s-parameters and eye-diagram of backplane using two-port VNA 用双端口VNA测量背板s参数和眼图的程序
80th ARFTG Microwave Measurement Conference Pub Date : 2012-11-01 DOI: 10.1109/ARFTG.2012.6422421
K. Hoffmann, M. Randus
{"title":"A procedure for measurement of s-parameters and eye-diagram of backplane using two-port VNA","authors":"K. Hoffmann, M. Randus","doi":"10.1109/ARFTG.2012.6422421","DOIUrl":"https://doi.org/10.1109/ARFTG.2012.6422421","url":null,"abstract":"A procedure for measurement of eye-diagram of a backplane based on single-ended two port s-parameters was designed and experimentally verified. Eye-diagram was derived using impulse response corresponding to calculated differential s-parameters of backplane pair lines. FCI AirMax VS connectors were used to connect the backplane. The procedure was verified in frequency band up to 5 GHz and transmission rate 1.25 Gbits/s.","PeriodicalId":262198,"journal":{"name":"80th ARFTG Microwave Measurement Conference","volume":"85 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2012-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116675365","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Folded planar Marchand balun with improved isolation for radio frequency Automated Test Equipment applications 折叠平面马尔尚平衡与改进隔离射频自动化测试设备的应用
80th ARFTG Microwave Measurement Conference Pub Date : 2012-11-01 DOI: 10.1109/ARFTG.2012.6422426
C. Montiel
{"title":"Folded planar Marchand balun with improved isolation for radio frequency Automated Test Equipment applications","authors":"C. Montiel","doi":"10.1109/ARFTG.2012.6422426","DOIUrl":"https://doi.org/10.1109/ARFTG.2012.6422426","url":null,"abstract":"This paper describes a folded planar Marchand balun with an isolation circuit. The circuit is proposed for use in efficient, low-cost, high-volume Automated Test Equipment (ATE) solutions. Many radio designs use radio-frequency integrated circuits (RFICs) with differential inputs or outputs to reduce the effects of common-mode noise or interference. Most RF ATEs, however, only provide single-ended inputs and outputs; consequently a balun is necessary in the device interface board (DIB). The Marchand balun has been a popular circuit since its introduction because it has larger bandwidth than other types of combiners and because it can be simultaneously be used as an impedance transformer. Unfortunately, the Marchand balun suffers from poor isolation and impedance matching at the output port. To improve the performance of the Marchand balun, a compact isolation circuit was designed. The balun shows improved impedance match at the output port with a slight reduction in bandwidth.","PeriodicalId":262198,"journal":{"name":"80th ARFTG Microwave Measurement Conference","volume":"120 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2012-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123552132","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
Comparison of equivalent source match measurements of a 40 GHz power splitter using scalar and vector network analyzers 用标量和矢量网络分析仪比较40ghz功率分配器的等效源匹配测量
80th ARFTG Microwave Measurement Conference Pub Date : 2012-11-01 DOI: 10.1109/ARFTG.2012.6422424
Y. Lee
{"title":"Comparison of equivalent source match measurements of a 40 GHz power splitter using scalar and vector network analyzers","authors":"Y. Lee","doi":"10.1109/ARFTG.2012.6422424","DOIUrl":"https://doi.org/10.1109/ARFTG.2012.6422424","url":null,"abstract":"This paper describes a procedure to measure the equivalent source match of a 40 GHz power splitter using a vector network analyzer. A detailed procedure based on the method proposed by Shimaoka is described. An uncertainty budget of this measurement setup is also developed. We then determine the metrological compatibility by comparing the data derived from two different VNA models to a reference measurement reported by the National Institute of Standards and Technology. A good agreement is confirmed.","PeriodicalId":262198,"journal":{"name":"80th ARFTG Microwave Measurement Conference","volume":"30 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2012-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133312661","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
60 GHz mixed signal active load-pull system for millimeter wave devices characterization 60ghz混合信号主动负载-拉系统的毫米波器件特性
80th ARFTG Microwave Measurement Conference Pub Date : 2012-11-01 DOI: 10.1109/ARFTG.2012.6422434
L. Galatro, M. Marchetti, M. Spirito
{"title":"60 GHz mixed signal active load-pull system for millimeter wave devices characterization","authors":"L. Galatro, M. Marchetti, M. Spirito","doi":"10.1109/ARFTG.2012.6422434","DOIUrl":"https://doi.org/10.1109/ARFTG.2012.6422434","url":null,"abstract":"In this work we present an active load-pull system dedicated to the characterization of mm-wave devices and integrated circuits operating in the frequency band 50-65 GHz, which enables the use of ultra-broadband modulated signals, up to 1 GHz. The system operation is based on the mixed-signal concept and its test-set and up-conversion/down-conversion signal paths are implemented entirely using WR-15 waveguides, providing high accuracy and system stability in the active load-pull configuration. The proposed system allows for real-time CW and modulated signal (i.e., up to 100 MHz) source and load-pull for model validation and linearity characterization, in the entire system bandwidth. Moreover, through the use of a wide-band arbitrary waveform generator and external wideband oscilloscope the system provides the capability for accurate inband signal characterization of integrated circuits with a modulation bandwidth up to 1 GHz. A preliminary set of measurements are presented reporting the capability of the proposed signal to properly control the load reflection coefficient, on a calibration thru, for power levels up to 11dBm in the entire frequency band. Moreover the broadband capability of the system in both up and down conversion is reported by showing the spectrum and time domain signal of a 1 GHz QPSK signal.","PeriodicalId":262198,"journal":{"name":"80th ARFTG Microwave Measurement Conference","volume":"2017 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2012-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129974984","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 7
Stochastic model and drift dependence of long term stability of type N precision coaxial terminations N型精密同轴终端长期稳定性的随机模型及漂移依赖性
80th ARFTG Microwave Measurement Conference Pub Date : 2012-11-01 DOI: 10.1109/ARFTG.2012.6422436
Y. Lee
{"title":"Stochastic model and drift dependence of long term stability of type N precision coaxial terminations","authors":"Y. Lee","doi":"10.1109/ARFTG.2012.6422436","DOIUrl":"https://doi.org/10.1109/ARFTG.2012.6422436","url":null,"abstract":"This paper discusses a stochastic model fitting process for the determining the calibration interval of precision Type N coaxial terminations. The measurements were taken weekly and over a six month period. The calibration of the vector network analyzer employs one-port error correction model using a sliding load. The observed drift rate is computed using linear regression. A second-order drift was observed. This paper describes possible causes of this mechanism by analyzing the partial differential equations of the one-port error correction model. Discussions on the dependence of long term stability and calibration model are provided.","PeriodicalId":262198,"journal":{"name":"80th ARFTG Microwave Measurement Conference","volume":"76 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2012-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132050339","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Sensitivity analysis of wafer-level over-temperature RF calibration 晶圆级超温射频校准灵敏度分析
80th ARFTG Microwave Measurement Conference Pub Date : 2012-11-01 DOI: 10.1109/ARFTG.2012.6422427
A. Rumiantsev, G. Fisher, R. Doerner
{"title":"Sensitivity analysis of wafer-level over-temperature RF calibration","authors":"A. Rumiantsev, G. Fisher, R. Doerner","doi":"10.1109/ARFTG.2012.6422427","DOIUrl":"https://doi.org/10.1109/ARFTG.2012.6422427","url":null,"abstract":"This paper analyzes the commonly used wafer-level S-parameter calibration methods LRRM, multiline TRL and LRM+ for the sensitivity to the thermal variation of electrical characteristics of planar calibration standards. We demonstrate that the calibration error of lumped-standard based methods can be significantly reduced by taking into account the variation of Load standard resistance over the temperature. The obtained results proved that for the evaluated commercially available calibration standards and for a given frequency range, the overall calibration error due to the temperature variation is in order of magnitude of repeatability of the manual system calibration. The proposed method can be successfully applied for different calibration substrates, temperature and frequency ranges, as well as to the in-situ calibration element.","PeriodicalId":262198,"journal":{"name":"80th ARFTG Microwave Measurement Conference","volume":"96 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2012-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132182376","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
Pulsed RF calibration for NVNA measurements NVNA测量的脉冲射频校准
80th ARFTG Microwave Measurement Conference Pub Date : 2012-11-01 DOI: 10.1109/ARFTG.2012.6422437
P. Roblin, Y. Ko, Haedong Jang, J. Teyssier
{"title":"Pulsed RF calibration for NVNA measurements","authors":"P. Roblin, Y. Ko, Haedong Jang, J. Teyssier","doi":"10.1109/ARFTG.2012.6422437","DOIUrl":"https://doi.org/10.1109/ARFTG.2012.6422437","url":null,"abstract":"This paper presents a new calibration theory for pulsed-RF large-signal measurement which relies on a new pulsed HPR and new pulsed power calibration besides the conventional relative linear calibration. The methodology used is based on the multiharmonic characterization of the RF pulser under pulsed-operation. The pulsed-RF calibration technique is facilitated by the fast switching and settling of the pulser which must have reached quasi-steady state when the RF signals are sampled. Experimental results for the new pulsed-RF calibration are presented for an LSNA. A small calibration correction is found to be required due to the dispersion of the buffer stage between the LSNA samplers and ADCs. The technique which is demonstrated for an LSNA operating using the multiple recording technique could be used with other NVNAs.","PeriodicalId":262198,"journal":{"name":"80th ARFTG Microwave Measurement Conference","volume":"54 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2012-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130925606","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 5
Characterizing artefact standards for use with coaxial vector network analyzers at millimeter-wave frequencies 鉴定毫米波频率下与同轴矢量网络分析仪配合使用的伪差标准
80th ARFTG Microwave Measurement Conference Pub Date : 2012-11-01 DOI: 10.1109/ARFTG.2012.6422430
D. Shelton, M. Salter, N. Ridler, M. Horibe
{"title":"Characterizing artefact standards for use with coaxial vector network analyzers at millimeter-wave frequencies","authors":"D. Shelton, M. Salter, N. Ridler, M. Horibe","doi":"10.1109/ARFTG.2012.6422430","DOIUrl":"https://doi.org/10.1109/ARFTG.2012.6422430","url":null,"abstract":"Traceability for vector network analyzer (VNA) measurements in coaxial lines smaller than 2.4 mm is problematic. The common method for traceability is to use precision coaxial air lines as primary standards. Since slotless lines are not commercially available in lines of this size, the air lines used are difficult to connect, extremely delicate, and expensive to replace. This paper describes a method of characterizing artefacts to use as standards, including specially designed and manufactured air-dielectric shielded open-circuits of various offset lengths as well as offset short-circuits and well-matched loads available in commercial VNA calibration kits. This will provide traceability using more robust and easier to use standards for calibration of the VNA. The proposed method is illustrated by measurement results obtained in 1.85 mm coaxial line (to 65 GHz.).","PeriodicalId":262198,"journal":{"name":"80th ARFTG Microwave Measurement Conference","volume":"28 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2012-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126522063","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Large signal characterization of GaN HEMT transistor by multi-harmonic source & load pull tuner system 多谐波源负载拉调谐系统对GaN HEMT晶体管大信号特性的影响
80th ARFTG Microwave Measurement Conference Pub Date : 2012-11-01 DOI: 10.1109/ARFTG.2012.6422432
Shengjie Gao, Chan-Wang Park
{"title":"Large signal characterization of GaN HEMT transistor by multi-harmonic source & load pull tuner system","authors":"Shengjie Gao, Chan-Wang Park","doi":"10.1109/ARFTG.2012.6422432","DOIUrl":"https://doi.org/10.1109/ARFTG.2012.6422432","url":null,"abstract":"In this paper, a GaN HEMT transistor is characterized at 3.5 GHz by passive multi-harmonic source & load pull tuner system in large signal. In order to analyze the effect on PAE and output power from the source and load impedance at fundamental, 2nd and 3rd harmonic frequencies, multi-harmonic source and load pull tuner are used. By using this source & load pull tuner system, Cree's GaN HEMT CGH40010 transistor is characterized at 3.5 GHz with considering the source and load impedances at 2nd and 3rd harmonic frequencies. The characterization result shows that maximum PAE could reach 74.21% with 39.92 dBm output power.","PeriodicalId":262198,"journal":{"name":"80th ARFTG Microwave Measurement Conference","volume":"31 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2012-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128805715","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 5
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