{"title":"N型精密同轴终端长期稳定性的随机模型及漂移依赖性","authors":"Y. Lee","doi":"10.1109/ARFTG.2012.6422436","DOIUrl":null,"url":null,"abstract":"This paper discusses a stochastic model fitting process for the determining the calibration interval of precision Type N coaxial terminations. The measurements were taken weekly and over a six month period. The calibration of the vector network analyzer employs one-port error correction model using a sliding load. The observed drift rate is computed using linear regression. A second-order drift was observed. This paper describes possible causes of this mechanism by analyzing the partial differential equations of the one-port error correction model. Discussions on the dependence of long term stability and calibration model are provided.","PeriodicalId":262198,"journal":{"name":"80th ARFTG Microwave Measurement Conference","volume":"76 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2012-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Stochastic model and drift dependence of long term stability of type N precision coaxial terminations\",\"authors\":\"Y. Lee\",\"doi\":\"10.1109/ARFTG.2012.6422436\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper discusses a stochastic model fitting process for the determining the calibration interval of precision Type N coaxial terminations. The measurements were taken weekly and over a six month period. The calibration of the vector network analyzer employs one-port error correction model using a sliding load. The observed drift rate is computed using linear regression. A second-order drift was observed. This paper describes possible causes of this mechanism by analyzing the partial differential equations of the one-port error correction model. Discussions on the dependence of long term stability and calibration model are provided.\",\"PeriodicalId\":262198,\"journal\":{\"name\":\"80th ARFTG Microwave Measurement Conference\",\"volume\":\"76 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2012-11-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"80th ARFTG Microwave Measurement Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ARFTG.2012.6422436\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"80th ARFTG Microwave Measurement Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ARFTG.2012.6422436","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Stochastic model and drift dependence of long term stability of type N precision coaxial terminations
This paper discusses a stochastic model fitting process for the determining the calibration interval of precision Type N coaxial terminations. The measurements were taken weekly and over a six month period. The calibration of the vector network analyzer employs one-port error correction model using a sliding load. The observed drift rate is computed using linear regression. A second-order drift was observed. This paper describes possible causes of this mechanism by analyzing the partial differential equations of the one-port error correction model. Discussions on the dependence of long term stability and calibration model are provided.