{"title":"Stochastic model and drift dependence of long term stability of type N precision coaxial terminations","authors":"Y. Lee","doi":"10.1109/ARFTG.2012.6422436","DOIUrl":null,"url":null,"abstract":"This paper discusses a stochastic model fitting process for the determining the calibration interval of precision Type N coaxial terminations. The measurements were taken weekly and over a six month period. The calibration of the vector network analyzer employs one-port error correction model using a sliding load. The observed drift rate is computed using linear regression. A second-order drift was observed. This paper describes possible causes of this mechanism by analyzing the partial differential equations of the one-port error correction model. Discussions on the dependence of long term stability and calibration model are provided.","PeriodicalId":262198,"journal":{"name":"80th ARFTG Microwave Measurement Conference","volume":"76 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2012-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"80th ARFTG Microwave Measurement Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ARFTG.2012.6422436","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
This paper discusses a stochastic model fitting process for the determining the calibration interval of precision Type N coaxial terminations. The measurements were taken weekly and over a six month period. The calibration of the vector network analyzer employs one-port error correction model using a sliding load. The observed drift rate is computed using linear regression. A second-order drift was observed. This paper describes possible causes of this mechanism by analyzing the partial differential equations of the one-port error correction model. Discussions on the dependence of long term stability and calibration model are provided.