{"title":"使用VNA完成功率传感器校准","authors":"Ken Wong","doi":"10.1109/ARFTG.2012.6422420","DOIUrl":null,"url":null,"abstract":"Typically, power sensors are calibrated for input reflection coefficient, calibration efficiency factor and linearity. Some new power sensors also need absolute power calibration. Multiple systems are used to measure each of the parameters. With an appropriately configured VNA, all the measurements can be performed with a single connection and set up. This paper shows how it is done and expected uncertainties.","PeriodicalId":262198,"journal":{"name":"80th ARFTG Microwave Measurement Conference","volume":"80 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2012-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":"{\"title\":\"Complete power sensor calibration using a VNA\",\"authors\":\"Ken Wong\",\"doi\":\"10.1109/ARFTG.2012.6422420\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Typically, power sensors are calibrated for input reflection coefficient, calibration efficiency factor and linearity. Some new power sensors also need absolute power calibration. Multiple systems are used to measure each of the parameters. With an appropriately configured VNA, all the measurements can be performed with a single connection and set up. This paper shows how it is done and expected uncertainties.\",\"PeriodicalId\":262198,\"journal\":{\"name\":\"80th ARFTG Microwave Measurement Conference\",\"volume\":\"80 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2012-11-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"5\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"80th ARFTG Microwave Measurement Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ARFTG.2012.6422420\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"80th ARFTG Microwave Measurement Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ARFTG.2012.6422420","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Typically, power sensors are calibrated for input reflection coefficient, calibration efficiency factor and linearity. Some new power sensors also need absolute power calibration. Multiple systems are used to measure each of the parameters. With an appropriately configured VNA, all the measurements can be performed with a single connection and set up. This paper shows how it is done and expected uncertainties.
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