{"title":"使用带有集成噪声接收器的矢量网络分析仪获得噪声参数的方法","authors":"R. D. Hayward","doi":"10.1109/ARFTG.2012.6422439","DOIUrl":null,"url":null,"abstract":"Agilent Technologies PNA-X Option 029 provides capability for noise figure measurements in a 50 Ohm environment. This paper describes a method for extending the analyzer's capability to obtain measurements for noise parameter extraction. A source tuner is characterized at various tuner states. Each tuner state is de-embedded into the network analyzer dynamically. High sensitivity noise and in-situ gain measurements provide accurate noise figure to be captured at any reflection coefficient. Noise parameters may then be extracted from the subsequent measurements.","PeriodicalId":262198,"journal":{"name":"80th ARFTG Microwave Measurement Conference","volume":"15 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2012-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"Method for obtaining noise parameters using a vector network analyzer with an integrated noise receiver\",\"authors\":\"R. D. Hayward\",\"doi\":\"10.1109/ARFTG.2012.6422439\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Agilent Technologies PNA-X Option 029 provides capability for noise figure measurements in a 50 Ohm environment. This paper describes a method for extending the analyzer's capability to obtain measurements for noise parameter extraction. A source tuner is characterized at various tuner states. Each tuner state is de-embedded into the network analyzer dynamically. High sensitivity noise and in-situ gain measurements provide accurate noise figure to be captured at any reflection coefficient. Noise parameters may then be extracted from the subsequent measurements.\",\"PeriodicalId\":262198,\"journal\":{\"name\":\"80th ARFTG Microwave Measurement Conference\",\"volume\":\"15 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2012-11-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"80th ARFTG Microwave Measurement Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ARFTG.2012.6422439\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"80th ARFTG Microwave Measurement Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ARFTG.2012.6422439","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Method for obtaining noise parameters using a vector network analyzer with an integrated noise receiver
Agilent Technologies PNA-X Option 029 provides capability for noise figure measurements in a 50 Ohm environment. This paper describes a method for extending the analyzer's capability to obtain measurements for noise parameter extraction. A source tuner is characterized at various tuner states. Each tuner state is de-embedded into the network analyzer dynamically. High sensitivity noise and in-situ gain measurements provide accurate noise figure to be captured at any reflection coefficient. Noise parameters may then be extracted from the subsequent measurements.
求助内容：
应助结果提醒方式：
京公网安备 11010802042870号
