Proceedings 17th IEEE VLSI Test Symposium (Cat. No.PR00146)最新文献_第6页

Maximal diagnosis of interconnects of random access memories 随机存取记忆互连的最大诊断

Proceedings 17th IEEE VLSI Test Symposium (Cat. No.PR00146) Pub Date : 1999-04-26 DOI: 10.1109/VTEST.1999.766692

Jun Zhao, F. Meyer, F. Lombardi, N. Park

引用次数: 5

Specification back-propagation and its application to DC fault simulation for analog/mixed-signal circuits 规范反向传播及其在模拟/混合信号电路直流故障仿真中的应用

Proceedings 17th IEEE VLSI Test Symposium (Cat. No.PR00146) Pub Date : 1999-04-26 DOI: 10.1109/VTEST.1999.766669

Jiun-Lang Huang, Chen-Yang Pan, K. Cheng

引用次数: 17

Test metrics for analog parametric faults 模拟参数故障的测试指标

Proceedings 17th IEEE VLSI Test Symposium (Cat. No.PR00146) Pub Date : 1999-04-26 DOI: 10.1109/VTEST.1999.766670

S. Sunter, N. Nagi

引用次数: 98

A test vector inhibiting technique for low energy BIST design 一种低能量BIST设计的测试矢量抑制技术

Proceedings 17th IEEE VLSI Test Symposium (Cat. No.PR00146) Pub Date : 1999-04-26 DOI: 10.1109/VTEST.1999.766696

P. Girard, Loïs Guiller, C. Landrault, S. Pravossoudovitch

引用次数: 189

Behavioral fault modeling in a VHDL synthesis environment VHDL合成环境中的行为错误建模

Proceedings 17th IEEE VLSI Test Symposium (Cat. No.PR00146) Pub Date : 1999-04-26 DOI: 10.1109/VTEST.1999.766684

R. Hayne, Barry W. Johnson

引用次数: 32

Time redundancy based soft-error tolerance to rescue nanometer technologies 基于时间冗余的纳米救援软容错技术

Proceedings 17th IEEE VLSI Test Symposium (Cat. No.PR00146) Pub Date : 1999-04-26 DOI: 10.1109/VTEST.1999.766651

M. Nicolaidis

引用次数: 518

Testing high speed VLSI devices using slower testers 使用较慢的测试器测试高速VLSI器件

Proceedings 17th IEEE VLSI Test Symposium (Cat. No.PR00146) Pub Date : 1999-04-26 DOI: 10.1109/VTEST.1999.766641

Angela Krstic, K. Cheng, S. Chakradhar

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引用次数: 9

RT-level TPG exploiting high-level synthesis information 利用高级综合信息的rt级TPG

Proceedings 17th IEEE VLSI Test Symposium (Cat. No.PR00146) Pub Date : 1999-04-26 DOI: 10.1109/VTEST.1999.766685

S. Chiusano, Fulvio Corno, P. Prinetto

引用次数: 16

On n-detection test sets and variable n-detection test sets for transition faults 对过渡故障的n检测测试集和变量n检测测试集

Proceedings 17th IEEE VLSI Test Symposium (Cat. No.PR00146) Pub Date : 1999-04-26 DOI: 10.1109/VTEST.1999.766662

I. Pomeranz, S. Reddy

引用次数: 105

P1500-CTL: Towards a Standard Core Test Language P1500-CTL:迈向标准核心测试语言

Proceedings 17th IEEE VLSI Test Symposium (Cat. No.PR00146) Pub Date : 1999-04-25 DOI: 10.1109/VTEST.1999.766708

R. Kapur, B. Keller, B. Koenemann, M. Lousberg, P. Reuter, T. Taylor, P. Varma

引用次数: 17