Specification back-propagation and its application to DC fault simulation for analog/mixed-signal circuits

Jiun-Lang Huang, Chen-Yang Pan, K. Cheng
{"title":"Specification back-propagation and its application to DC fault simulation for analog/mixed-signal circuits","authors":"Jiun-Lang Huang, Chen-Yang Pan, K. Cheng","doi":"10.1109/VTEST.1999.766669","DOIUrl":null,"url":null,"abstract":"In this paper we present the specification backpropagation technique which enables one to derive the constraint of an internal functional block with respect to a given DC specification for an analog/mixed-signal system. Based on this technique, we implement an efficient fault simulator which reduces the required efforts by (1) removing undetectable faults from the fault list, and (2) performing fault simulation only locally for the fault block. Simulation results on an industrial design show a speedup factor of 7.2 with 98% correct classification of detected and undetected faults as compared with full-chip DC fault simulation.","PeriodicalId":248104,"journal":{"name":"Proceedings 17th IEEE VLSI Test Symposium (Cat. No.PR00146)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1999-04-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"17","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings 17th IEEE VLSI Test Symposium (Cat. No.PR00146)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/VTEST.1999.766669","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 17

Abstract

In this paper we present the specification backpropagation technique which enables one to derive the constraint of an internal functional block with respect to a given DC specification for an analog/mixed-signal system. Based on this technique, we implement an efficient fault simulator which reduces the required efforts by (1) removing undetectable faults from the fault list, and (2) performing fault simulation only locally for the fault block. Simulation results on an industrial design show a speedup factor of 7.2 with 98% correct classification of detected and undetected faults as compared with full-chip DC fault simulation.
规范反向传播及其在模拟/混合信号电路直流故障仿真中的应用
在本文中,我们提出了规范反向传播技术,该技术使人们能够根据模拟/混合信号系统的给定直流规范推导出内部功能块的约束。基于这一技术,我们实现了一种高效的故障模拟器,通过(1)从故障列表中去除不可检测的故障,(2)仅对故障块局部进行故障模拟,减少了所需的工作量。在工业设计上的仿真结果表明,与全芯片直流故障仿真相比,该方法的加速系数为7.2,对检测到的和未检测到的故障进行分类的正确率为98%。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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