P1500-CTL:迈向标准核心测试语言

Proceedings 17th IEEE VLSI Test Symposium (Cat. No.PR00146) Pub Date : 1999-04-25 DOI:10.1109/VTEST.1999.766708

R. Kapur, B. Keller, B. Koenemann, M. Lousberg, P. Reuter, T. Taylor, P. Varma

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引用次数: 17

摘要

作为P1500的IEEE标准化活动的一部分，正在为嵌入式核心测试定义一种语言，以支持在芯片环境中的系统中重用知识产权。核心测试描述语言(CTL)被提议作为捕获和表达可重用核心的测试相关信息的行业标准方法。本文讨论了标准化活动的范围。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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P1500-CTL: Towards a Standard Core Test Language

As part of the IEEE standardization activities of P1500, a language is being defined for embedded core test to enable the reuse of intellectual property in a system on a chip environment. A Core Test Description Language (CTL) is being proposed as an industry standard method for capturing and expressing test related information for reusable cores. This paper discusses the scope of the standardization activity.

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Proceedings 17th IEEE VLSI Test Symposium (Cat. No.PR00146)

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