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1986 IEEE International Symposium on Electromagnetic Compatibility最新文献

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Preliminary Evaluation of Reverberation Chamber Method for Pulsed RF Immunity Testing 脉冲射频抗扰度测试混响室法的初步评价
1986 IEEE International Symposium on Electromagnetic Compatibility Pub Date : 1986-09-01 DOI: 10.1109/ISEMC.1986.7568253
M. Crawford, G. Koepke
{"title":"Preliminary Evaluation of Reverberation Chamber Method for Pulsed RF Immunity Testing","authors":"M. Crawford, G. Koepke","doi":"10.1109/ISEMC.1986.7568253","DOIUrl":"https://doi.org/10.1109/ISEMC.1986.7568253","url":null,"abstract":"","PeriodicalId":244612,"journal":{"name":"1986 IEEE International Symposium on Electromagnetic Compatibility","volume":"84 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1986-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116316578","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
RF Stabilization 射频稳定
1986 IEEE International Symposium on Electromagnetic Compatibility Pub Date : 1986-09-01 DOI: 10.1109/isemc.1986.7568272
D. Staggs
{"title":"RF Stabilization","authors":"D. Staggs","doi":"10.1109/isemc.1986.7568272","DOIUrl":"https://doi.org/10.1109/isemc.1986.7568272","url":null,"abstract":"This paper presents a new technique for emission control of Electronic Systems. The technique, called \"RF Stabilization\" reduces Conducted and Radiated emissions and raises immunity levels significantly. Three design areas are examined in implementation of this technique; Multipoint High Frequency Grounding, Circuit Board Design, and Internal Harness (Cable) Design. Conducted and Radiated emission data is presented showing the reduction of the emissions due to changes in the design areas.","PeriodicalId":244612,"journal":{"name":"1986 IEEE International Symposium on Electromagnetic Compatibility","volume":"64 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1986-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115035672","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
The Value and Methods of Evaluation of Computer Aided Design in the Classroom 计算机辅助设计在课堂教学中的价值与评价方法
1986 IEEE International Symposium on Electromagnetic Compatibility Pub Date : 1986-09-01 DOI: 10.1109/ISEMC.1986.7568246
J. Osburn, D. White
{"title":"The Value and Methods of Evaluation of Computer Aided Design in the Classroom","authors":"J. Osburn, D. White","doi":"10.1109/ISEMC.1986.7568246","DOIUrl":"https://doi.org/10.1109/ISEMC.1986.7568246","url":null,"abstract":"The effectiveness of training and devices or methodology used to support. training (Training Aids) are often discussed but, to date, actual evaluation of learning effectiveness is subjective. The use of Computer Aided Design (CAD) to support EMC education is a case in point. For specialized EMC Training, this paper reviews traditional instructional approaches, CAD augmentation of such instruction, and suggests an evaluation method that quantifies the performance of CAD as a training aid.","PeriodicalId":244612,"journal":{"name":"1986 IEEE International Symposium on Electromagnetic Compatibility","volume":"21 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1986-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122061509","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
A Model for Predicting the Surface Transfer Impedance of Braided Cable 编织电缆表面传递阻抗的预测模型
1986 IEEE International Symposium on Electromagnetic Compatibility Pub Date : 1986-09-01 DOI: 10.1109/ISEMC.1986.7568276
L. Hoeft
{"title":"A Model for Predicting the Surface Transfer Impedance of Braided Cable","authors":"L. Hoeft","doi":"10.1109/ISEMC.1986.7568276","DOIUrl":"https://doi.org/10.1109/ISEMC.1986.7568276","url":null,"abstract":"A model for predicting the surface transfer impedance of non-optimized braided cables has been developed. This model is based on theory and is supported by extensive measurements. The transfer impedance of a braided cable is modeled as the sum of a transfer resistance and a transfer mutual inductance. The latter gives rise to a frequency dependent term. The transfer resistance is inversely proportional to cable diameter. The transfer mutual inductance is best modeled as being independent of diameter. A worst case cable overbraid model accounts for multiple layers of braid. Thus, the surface transfer impedance can be repre­ sented as the sum of a transfer resistance R, and a mutual inductance M-jg• To a first approximation, the transfer resist­ ance is determined by the amount of metal in the braid. This can be calculated using Equation 3","PeriodicalId":244612,"journal":{"name":"1986 IEEE International Symposium on Electromagnetic Compatibility","volume":"14 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1986-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125484837","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 10
Use of the Compact Range for Radiative Susceptibility and Emission Testing 使用紧凑型量程进行辐射敏感性和发射测试
1986 IEEE International Symposium on Electromagnetic Compatibility Pub Date : 1986-09-01 DOI: 10.1109/ISEMC.1986.7568254
M. Rousseau, P. Excell
{"title":"Use of the Compact Range for Radiative Susceptibility and Emission Testing","authors":"M. Rousseau, P. Excell","doi":"10.1109/ISEMC.1986.7568254","DOIUrl":"https://doi.org/10.1109/ISEMC.1986.7568254","url":null,"abstract":"The compact range technique enables the production of a quasi-plane wave (the ideal condition for susceptibility and, by reciprocity, emission testing) with no Inherent frequency limits and with weaker image effects than occur in the parallel-plate line technique. Studies of the error levels in measurements undertaken in such a range are presented, with emphasis on the scope for reduction of the lower frequency limits of practical realizations in the context of typical EMC accuracy requirements. CH2294-7/86/0000-0279 $1.00 © 1986 IEEE 279","PeriodicalId":244612,"journal":{"name":"1986 IEEE International Symposium on Electromagnetic Compatibility","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1986-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128805095","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
A Positive Step Toward the EMC Education 迈向EMC教育的积极一步
1986 IEEE International Symposium on Electromagnetic Compatibility Pub Date : 1986-09-01 DOI: 10.1109/ISEMC.1986.7568248
V. Ungvichian
{"title":"A Positive Step Toward the EMC Education","authors":"V. Ungvichian","doi":"10.1109/ISEMC.1986.7568248","DOIUrl":"https://doi.org/10.1109/ISEMC.1986.7568248","url":null,"abstract":"","PeriodicalId":244612,"journal":{"name":"1986 IEEE International Symposium on Electromagnetic Compatibility","volume":"11 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1986-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129596316","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Shielding Effectiveness Measurements Using an Apertured TEM Cell in a Reverberation Chamber 在混响室中使用多孔透射电镜电池测量屏蔽效能
1986 IEEE International Symposium on Electromagnetic Compatibility Pub Date : 1986-09-01 DOI: 10.1109/ISEMC.1986.7568252
P. Wilson, M. Ma
{"title":"Shielding Effectiveness Measurements Using an Apertured TEM Cell in a Reverberation Chamber","authors":"P. Wilson, M. Ma","doi":"10.1109/ISEMC.1986.7568252","DOIUrl":"https://doi.org/10.1109/ISEMC.1986.7568252","url":null,"abstract":"II TEST CONFIGURATION M e a s u r e m e n t s of n e a r f i e l d s h i e l d i n g effectiveness are performed in a reverberation chamber using an apertured transverse electromagnetic cell as the receiver. This configuration allows one to investigate the electricand magnetic-field shielding properties of a material simultaneously. Coupling to the cell is modeled using small-aperture theory, and predicted results agree well with measured data.","PeriodicalId":244612,"journal":{"name":"1986 IEEE International Symposium on Electromagnetic Compatibility","volume":"17 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1986-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121098888","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 7
Prediction of Conducted Emissions in Switched Mode Power Supplies 开关模式电源传导辐射的预测
1986 IEEE International Symposium on Electromagnetic Compatibility Pub Date : 1986-09-01 DOI: 10.1109/ISEMC.1986.7568233
M. Nave
{"title":"Prediction of Conducted Emissions in Switched Mode Power Supplies","authors":"M. Nave","doi":"10.1109/ISEMC.1986.7568233","DOIUrl":"https://doi.org/10.1109/ISEMC.1986.7568233","url":null,"abstract":"The article discusses the generation and modeling of EMI in switched mode power supplies. Other authors have investigated the mechanism of generation of EMI in switched mode power supplies, but no model has been advanced to predict what the emanations will be. Discussion of common mode and differential mode noise is given, and a method for developing quick predictions in the frequency domain is given. Introduction The modeling of two of the predominate noise sources in Switched Mode Power Supplies (SMPS) is done in the frequency domain. To convert the time domain switching waveforms into the frequency domain, the envelope approximation to the Fourier transform of a trapezodial waveform HI (appendix A) is used. In the derivation of the noise models, the mathematical model is given first, then simplifying assumptions are made, and a graphical technique is developed.","PeriodicalId":244612,"journal":{"name":"1986 IEEE International Symposium on Electromagnetic Compatibility","volume":"41 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1986-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131371085","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 42
A Standard Test To Determine the Susceptibility of a Machine to Electrostatic Discharge 测定机器对静电放电敏感性的标准试验
1986 IEEE International Symposium on Electromagnetic Compatibility Pub Date : 1986-09-01 DOI: 10.1109/ISEMC.1986.7568289
R. Calcavecchio, D. Pratt
{"title":"A Standard Test To Determine the Susceptibility of a Machine to Electrostatic Discharge","authors":"R. Calcavecchio, D. Pratt","doi":"10.1109/ISEMC.1986.7568289","DOIUrl":"https://doi.org/10.1109/ISEMC.1986.7568289","url":null,"abstract":"","PeriodicalId":244612,"journal":{"name":"1986 IEEE International Symposium on Electromagnetic Compatibility","volume":"20 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1986-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123893476","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 10
Bases of Receptor Immunity Limits Establishing 受体免疫限度建立的基础
1986 IEEE International Symposium on Electromagnetic Compatibility Pub Date : 1986-09-01 DOI: 10.1109/ISEMC.1986.7568285
G. K. Boronichev
{"title":"Bases of Receptor Immunity Limits Establishing","authors":"G. K. Boronichev","doi":"10.1109/ISEMC.1986.7568285","DOIUrl":"https://doi.org/10.1109/ISEMC.1986.7568285","url":null,"abstract":"","PeriodicalId":244612,"journal":{"name":"1986 IEEE International Symposium on Electromagnetic Compatibility","volume":"65 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1986-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121634296","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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