1986 IEEE International Symposium on Electromagnetic Compatibility最新文献

{"title":"An Undergraduate Course in Electromagnetic Compatibility","authors":"C. Paul","doi":"10.1109/ISEMC.1986.7568244","DOIUrl":"https://doi.org/10.1109/ISEMC.1986.7568244","url":null,"abstract":"This paper describes the establishment, content and experience w ith an undergraduate course in Electromagnetic Compatibility in the Electrical Engineering program at the University of Kentucky. In addition to the topic organiza­ tion, this course contains several innovative features designed to stimulate student interest and to enhance learning the principles. Several small laboratory experiments are used throughout the course to give hands-on experience with modern test equipment and to illustrate the basic principles. Students are required to construct a simple digital device and incorporate the EMC design principles of the course in order to have it pass the FCC Class B radiated and conducted emissions tests. A key ingredient in the success of this course is the cooperation and encouragement of local industry—the Information Products Division of the International Business Machines Corporation at Lexington.","PeriodicalId":244612,"journal":{"name":"1986 IEEE International Symposium on Electromagnetic Compatibility","volume":"54 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1986-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115737589","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Overview of a Wideband Communications EMC Analysis System","authors":"M. Lustgarten, M. Maiuzzo, J. Rockway, S. T. Li","doi":"10.1109/ISEMC.1986.7568238","DOIUrl":"https://doi.org/10.1109/ISEMC.1986.7568238","url":null,"abstract":"A model has been developed to support the design and analysis o f shipboard RF communication systems including a wideband RF architecture. The wideband RF architecture considered in the pro­ gram involves the use of narrowband exciters whose outputs are combined, fed into a common wideband power bank and connected to broadband antennas. At the receiving system, a single electrically small, broadband antenna is used, followed by a wideband RF amplifier, several wideband multicouplers and a number o f narrow­ band receivers. It is the latest version of a sequence of models developed by both the Electromagnetic Compatibility Analysis Center (ECAC) and","PeriodicalId":244612,"journal":{"name":"1986 IEEE International Symposium on Electromagnetic Compatibility","volume":"306 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1986-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127388719","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"The Relationship Between MIL-SPEC. and Commercial EMI Requirements","authors":"R. Cowdell","doi":"10.1109/ISEMC.1986.7568274","DOIUrl":"https://doi.org/10.1109/ISEMC.1986.7568274","url":null,"abstract":"","PeriodicalId":244612,"journal":{"name":"1986 IEEE International Symposium on Electromagnetic Compatibility","volume":"93 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1986-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131346814","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"A Survey of VHF Man-made Noise in the Metropolitan City Area of New Delhi","authors":"A. Sanyal","doi":"10.1109/ISEMC.1986.7568214","DOIUrl":"https://doi.org/10.1109/ISEMC.1986.7568214","url":null,"abstract":"Multiple sets of man-made radio noise data are reported for a number of locations in the metropolitan city area of New Delhi. These are examined to assess the frequency, distance and diurnal characteristics of the composite city noise for urban locations. The measurement was restricted in the frequency band of 50-100 MHz to observe the impact of noise on VHF land-mobile and TV broadcasting services. The incidental noise environment to be experienced by these services at different busy activity zones of the city is observed to have a contrasting spectral pattern.","PeriodicalId":244612,"journal":{"name":"1986 IEEE International Symposium on Electromagnetic Compatibility","volume":"33 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1986-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130454807","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"An Automated HF Noise Measurement System","authors":"L. D. Dornetto, J. R. Reaves, L. Valoppi","doi":"10.1109/ISEMC.1986.7568217","DOIUrl":"https://doi.org/10.1109/ISEMC.1986.7568217","url":null,"abstract":"The determination and control of man-made noise in the 2MHz 32 MHz (HF) frequency band is a major concern to those who must operate, maintain, and plan for HF receiver installations. The ability to obtain an accurate and statistically significant characterization of the RF noise throughout the entire HF spectrum and not be limited to a set of noise measurements taken at several preselected points within the spectrum is paramount. This paper describes an automated noise measurement system, configured entirely with off the shelf components, that accurately gathers a representative sample of both noise and signal data over the entire HF spectrum. The measurement system described, although not strictly portable, has been taken literally around the world, via commercial air carriers, to gather noise data. The results of two surveys, one conducted in a quiet rural area and the other conducted in a suburban area are also presented.","PeriodicalId":244612,"journal":{"name":"1986 IEEE International Symposium on Electromagnetic Compatibility","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1986-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122280261","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Extending the National EMC Instrumentation Standard to Frequencies Below 10 kHz","authors":"E. Bronaugh","doi":"10.1109/ISEMC.1986.7568201","DOIUrl":"https://doi.org/10.1109/ISEMC.1986.7568201","url":null,"abstract":"The paper discusses the measurement standards and applications for an Audio Frequency EMI Analyzer and how these diverse needs may be met by a standard­ ized instrument. Some background is given on ANSI C63.2, which is THE U. S. national standard for EMC measurement instrumentation, and its role in providing manufacturers and users in divergent application areas with a common standard to assure highly economical and technically sound instrumentation. Summary For many years, the U. S. national standard on EMC measuring instrumentation has failed to cover the audio frequency range. Its lower boundary was origin­ ally 150 kHz, later this was lowered to 14 kHz, and it is currently 10 kHz in ANSI C63.2 [1]. However, more and more needs have surfaced for a standardized instru­ ment with coverage down to 10 Hz or 20 Hz. Defacto instrument standards have been implied from time—to— time by measurement methods used in various application TABLE I. SUMMARY OF STANDARD EMC MEASUREMENTS, A.F. TO L.F. Standard Method Freq. Range (Hz) Measurement MIL-STD-461B CE01 CS01 CS09 RE01/RE04 RS01 30 to 15k 30 to 50k 60 to 100k 30 to 50k 30 to 50k Cond. Emissions, NB & BB Cond. Suscep., NB3 Cond. Suscep., NB3 Rad. Emissions, NB,, H-Fld.1 Rad. Suscep., NB, H-Fld.3 SL-E-0002, Rev. A (Space S hu tt le )2 CE01 CS01 30 to 20k 30 to 50k Cond. Emissions, NB & BB Cond. Suscep., NB3 MIL-STD-1541 (USAF) 115.1.2.2.1 0.1 to »10k Cond. Emissions, Pwr & Sig. Lines MSFC-SPEC-521A 113.2.1.1.1 H3.2.1.2.3 113.2.2.1.1 113.2.2.2.2 30 to 20k 20 to 50k 30 to 50k 30 to 50k Cond. Emission, DC Pwr Bus Rad. Emissions, H-Fld Cond. Suscep., NB3 Rad. Suscep., NB, H-Fld3 MDS-201-0004 1979 (FDA) 113.2.2 H3.3.2 500 to 30M 100 to 50k Cond. Emission, NB Cond. Suscep., NB3 MIL-STD-285A (Draft '82) NSA 65-6, and IEEE-299A (Draft ‘84) — 900 to 16k Rad. Shielding Effec. Measurements (H-Fld) NACSIM-5100A1* — 100 to »10k Cond. & Rad. Emis., NB & BB CISPR Pub 16-1977 Section 6 10 to 20k Cond. & Rad. Emis. IEC 555-2 115.2.4 150 to 2.5k Cond. Emis., Pwr Cir Harm. CCITT Rec. & CCIR-468 — 16 to 16k Psophometric Voltmeter5 Notes: 'The requirement in MIL-STD-461B appears to be a combination of both RE01 and RE04 in MIL-STD-461A/462 2Used with MIL-STD-461A instrum ent used as tuned vo ltm eter /f ie ld strength meter to monitor Suscepti­ b i l i t y te s ts ‘'Needs special charac ter is t ics 5Needs special pass band shape CH2294-7/86/000-0008 $01 .00(c )l986 IEEE 8 SESSION 2A areas such as MIL-STD-462 [4] and CCIR Recommendation 468 [8]. Other test methods and applications have appeared over a period of time [1, 2, 3, 4, 5, 6, 7, 8, etc.]. It is clear that C63.2 must be extended to include these audio frequency measurements; in fact, such an extension is well past due! A task group has been working in Subcommittee 1, Techniques and Develop­ ments, of Accredited National Standards Committee C63 for about five years to develop an extension of C63.2 down to 20 Hz. However, up until about a year ago, the scope of the doc","PeriodicalId":244612,"journal":{"name":"1986 IEEE International Symposium on Electromagnetic Compatibility","volume":"8 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1986-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132739288","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Survey of the State of the Art of Electrical Transient Upset in Digital Circuits","authors":"J. Stellato, R. Garver","doi":"10.1109/ISEMC.1986.7568294","DOIUrl":"https://doi.org/10.1109/ISEMC.1986.7568294","url":null,"abstract":"A survey was conducted to assess the present upset technology status. Upset is defined as the malfunction of a circuit or system due to interference. This paper focuses on the malfunction of digital circuits due to electrical transients that cause nonpermanent undesirable logic states which show up in the output as errors. As integrated circuits are being made more dense, their susceptibility to upset is increasing. Thus, upset, which may be induced at far lower levels than damage, demands attention. Knowledge voids that were identified in this investigation of upset must be resolved. Although this survey concentrates on upset due to the electromagnetic pulse (EMP) type of transients, in the process it sorts through other types of upset as they relate to it. The survey results increase the need for a basic upset test which should lead to a systematic characterization of upset due to EMP. The test results should be fundamental building blocks in the computer modeling of circuit response to transient drivers, in addition to aiding in the prediction of the stochastic response of systems to known transients.","PeriodicalId":244612,"journal":{"name":"1986 IEEE International Symposium on Electromagnetic Compatibility","volume":"6 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1986-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132947574","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Transient Field of Earth Fault Currents","authors":"G. Mrozynski","doi":"10.1109/ISEMC.1986.7568291","DOIUrl":"https://doi.org/10.1109/ISEMC.1986.7568291","url":null,"abstract":"","PeriodicalId":244612,"journal":{"name":"1986 IEEE International Symposium on Electromagnetic Compatibility","volume":"109 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1986-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133183178","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Projected Susceptibilities of VHSIC/VLSIC Devices to the Year 2000 Electromagnetic Environment","authors":"H. W. Denny","doi":"10.1109/ISEMC.1986.7568258","DOIUrl":"https://doi.org/10.1109/ISEMC.1986.7568258","url":null,"abstract":"With proper doping of Class IIIA and IVA transitional elements (primarily germanium, silicon, and gallium) with selected impurities, semiconducting devices offering detection, amplification, and switching properties are obtainable. Originally, diodes and transistors were fabricated on silicon and germanium substrates only as single pn junctions or as pnp/npn junction sets, respectively. The next logical step was the integration of ordered sets of diodes and transistors on a common substrate to produce functional circuits.","PeriodicalId":244612,"journal":{"name":"1986 IEEE International Symposium on Electromagnetic Compatibility","volume":"22 8","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1986-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133817673","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Vertical Site Attenuation - A Necessity!","authors":"D. Heirman","doi":"10.1109/ISEMC.1986.7568265","DOIUrl":"https://doi.org/10.1109/ISEMC.1986.7568265","url":null,"abstract":"This paper introduces a further improvement in determining the quality of an open area test site (OATS) for making radiated emission measurements. This technique extends present requirements suggested by the FCC in OST55 to characterize the site attenuation of open area test facilities by using transmit and receive antennas which are vertically as well as horizontally aligned with respect to the metallic ground plane. Vertical polarization is generally more sensitive than horizontal in showing certain site imperfections, such as surrounding reflecting buildings, fences, and other obstructions that might adversely affect measurements. Vertical polarization measurements are also more sensitive to recording technique and measurement system (antenna factor, cable loss, and receiver/spectrum analyzer miscalibrations) inadequacies. Areas for further site attenuation analysis are also indicated. National Standards Institute C63 (now called Accredited Standards Com­ mittee C63 Electromagnetic Compatibility) decided that vertical site attenuation was a necessary addition in determining site quality. The Com­ mittee recommended the continued inclusion of horizontal polarization measurements primarily as a check of the instrumentation, test setup, and antenna calibration prior to making the vertical polarization measurement. The Committee could have recommended dropping horizontal polarization altogether. It felt, however, that was premature since there was not enough data to ensure that vertical polarization measurements would catch all site anomalies. The Ad Hoc Committee’s work is contained in a draft which is undergoing the final approval process within C63 prior to publishing as an ANSI Standard.4 Details of this work and supporting experimentation are now summarized.","PeriodicalId":244612,"journal":{"name":"1986 IEEE International Symposium on Electromagnetic Compatibility","volume":"28 3","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1986-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133042829","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}