M. Rousseau, P. Excell
{"title":"使用紧凑型量程进行辐射敏感性和发射测试","authors":"M. Rousseau, P. Excell","doi":"10.1109/ISEMC.1986.7568254","DOIUrl":null,"url":null,"abstract":"The compact range technique enables the production of a quasi-plane wave (the ideal condition for susceptibility and, by reciprocity, emission testing) with no Inherent frequency limits and with weaker image effects than occur in the parallel-plate line technique. Studies of the error levels in measurements undertaken in such a range are presented, with emphasis on the scope for reduction of the lower frequency limits of practical realizations in the context of typical EMC accuracy requirements. CH2294-7/86/0000-0279 $1.00 © 1986 IEEE 279","PeriodicalId":244612,"journal":{"name":"1986 IEEE International Symposium on Electromagnetic Compatibility","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1986-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Use of the Compact Range for Radiative Susceptibility and Emission Testing\",\"authors\":\"M. Rousseau, P. Excell\",\"doi\":\"10.1109/ISEMC.1986.7568254\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The compact range technique enables the production of a quasi-plane wave (the ideal condition for susceptibility and, by reciprocity, emission testing) with no Inherent frequency limits and with weaker image effects than occur in the parallel-plate line technique. Studies of the error levels in measurements undertaken in such a range are presented, with emphasis on the scope for reduction of the lower frequency limits of practical realizations in the context of typical EMC accuracy requirements. CH2294-7/86/0000-0279 $1.00 © 1986 IEEE 279\",\"PeriodicalId\":244612,\"journal\":{\"name\":\"1986 IEEE International Symposium on Electromagnetic Compatibility\",\"volume\":\"1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1986-09-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"1986 IEEE International Symposium on Electromagnetic Compatibility\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISEMC.1986.7568254\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"1986 IEEE International Symposium on Electromagnetic Compatibility","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISEMC.1986.7568254","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0