{"title":"Resistive Switching Behavior seen from the Energy Point of View","authors":"Jorge Gomez, Angel Abusleme, I. Vourkas, A. Rubio","doi":"10.1109/IOLTS.2018.8474167","DOIUrl":"https://doi.org/10.1109/IOLTS.2018.8474167","url":null,"abstract":"The technology of Resistive Switching (RS) devices (memristors) is continuously maturing on its way towards viable commercial establishment. So far, the change of resistance has been identified as a function of the applied pulse characteristics, such as amplitude and duration. However, parameter variability holds back any universal approach based on these two magnitudes, making also difficult even the qualitative comparison between different RS material compounds. On the contrary, there is a relevant magnitude which is much less affected by device variability; the energy. In this direction, we doubt anyone so far has ever wondered “what is the quantitative effect of the injected energy on the device state?” Interestingly, a first step was made recently towards the definition of performance parameters for this emerging device technology, using as fundamental parameter the energy. In this work, we further elaborate on such ideas, proving experimentally that the “resistance change per energy unit” $( dR/ dE )$ can be considered a significant magnitude in analog operation of bipolar memristors, being a key performance parameter worth of timely disclosure.","PeriodicalId":241735,"journal":{"name":"2018 IEEE 24th International Symposium on On-Line Testing And Robust System Design (IOLTS)","volume":"28 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126600114","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Robert Schmidt, Rehab Massoud, J. Raik, A. Ortiz, R. Drechsler
{"title":"Reliability Improvements for Multiprocessor Systems by Health-Aware Task Scheduling","authors":"Robert Schmidt, Rehab Massoud, J. Raik, A. Ortiz, R. Drechsler","doi":"10.1109/IOLTS.2018.8474101","DOIUrl":"https://doi.org/10.1109/IOLTS.2018.8474101","url":null,"abstract":"The probability that a particular device is operational for a given duration, or reliability, is a dependability attribute and key metric for systems in critical applications. For example, systems for long-term autonomous exploration missions have to be operational during their complete mission. Other critical applications like banking, medical automotive or aerospace face similar reliability requirements that are only met by dependable systems. Traditional dependable systems, compared to their non-dependable counterparts, have three key issues: They are more expensive, consume more power, and provide less performance.","PeriodicalId":241735,"journal":{"name":"2018 IEEE 24th International Symposium on On-Line Testing And Robust System Design (IOLTS)","volume":"57 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126634102","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Semeen Rehman, F. Kriebel, B. Prabakaran, Faiq Khalid, M. Shafique
{"title":"Hardware and Software Techniques for Heterogeneous Fault-Tolerance","authors":"Semeen Rehman, F. Kriebel, B. Prabakaran, Faiq Khalid, M. Shafique","doi":"10.1109/IOLTS.2018.8474219","DOIUrl":"https://doi.org/10.1109/IOLTS.2018.8474219","url":null,"abstract":"With the advancements in the process technology, fault-tolerance against transient errors has emerged as an important design requirement for computing systems fabricated using nano-scale devices. Traditionally, redundancy-based techniques have been employed to detect and correct errors, and to achieve full system protection. However, as fault masking properties on different system levels have been observed and applications with lower accuracy demands or error-tolerant properties exist, reliability-heterogeneous architectures have recently paved the way for power-efficient dependable systems. In this paper, we will discuss the building blocks of such processors (both embedded and superscalar) with different fault-tolerant modes on the architecture level covering memory components like caches as well as in-order and out-of-order processor designs. We analyze the soft error vulnerability of different components and show how the variations in vulnerabilities can be exploited to improve the performance and power efficiency of such processors. We additionally show that a reliability-driven compiler can be leveraged to realize software-level heterogeneous fault tolerance by generating different reliable application versions with diverse reliability and performance properties.","PeriodicalId":241735,"journal":{"name":"2018 IEEE 24th International Symposium on On-Line Testing And Robust System Design (IOLTS)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125811125","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Mounia Kharbouche-Harrari, J. Postel-Pellerin, G. D. Pendina, R. Wacquez, Driss Aboulkassimi, M. Bocquet, R. Sousa, R. Delattre, J. Portal
{"title":"Impact of a Laser Pulse on a STT-MRAM Bitcell: Security and Reliability Issues","authors":"Mounia Kharbouche-Harrari, J. Postel-Pellerin, G. D. Pendina, R. Wacquez, Driss Aboulkassimi, M. Bocquet, R. Sousa, R. Delattre, J. Portal","doi":"10.1109/IOLTS.2018.8474088","DOIUrl":"https://doi.org/10.1109/IOLTS.2018.8474088","url":null,"abstract":"The Spin Transfer Torque Magnetic Random Access Memory (STT-MRAM) has been identified, by the International Technology Roadmap for Semiconductors (ITRS), as one of the most promising emerging technology. Different works handled the retention and reliability of STT-MRAM. However, to the best of our knowledge, the impact of a pulsed laser beam on STT-MRAM reliability and security has not been investigated so far as proposed in this paper. Since STT-MRAM are Back-end Of Line devices, we exposed the bit cells from the front-side to a 1064 nm wavelength laser pulse. The devices are electrically characterized (switching conditions between the two logical states) before and after the laser irradiation. The main result of this study is the demonstration of a resistance switching from Anti-Parallel (AP) to Parallel (P) state after the laser irradiation. That is how data integrity was altered by this irradiation, flipping the bit stored in this memory.","PeriodicalId":241735,"journal":{"name":"2018 IEEE 24th International Symposium on On-Line Testing And Robust System Design (IOLTS)","volume":"25 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121361298","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Robust co-synthesis of embedded control systems with occasional deadline misses","authors":"A. Behrouzian, Dip Goswami, T. Basten","doi":"10.1109/IOLTS.2018.8474138","DOIUrl":"https://doi.org/10.1109/IOLTS.2018.8474138","url":null,"abstract":"Feedback control applications are robust to occasional deadline misses. This opens up the possibility of saving scarce (computation and communication) resources on embedded platforms. Stability and performance requirements of a control loop impose restrictions on acceptable patterns of deadline misses (e.g., not too many misses in a row). Such requirements are captured by (m,k)-firmness conditions. That is, at least m control computation jobs must meet deadlines in any k consecutive jobs. (m,k)-firm design requires (i) representation of stability and performance requirements in terms of (m,k)-firm deadlines (ii) controller synthesis taking into account the (m,k)-firmness parameters (iii) schedule analysis to verify guarantees on meeting the firmness conditions. We present a co-synthesis framework for these three design components and illustrate its applicability with examples.","PeriodicalId":241735,"journal":{"name":"2018 IEEE 24th International Symposium on On-Line Testing And Robust System Design (IOLTS)","volume":"114 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116536826","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"A Test Register Assignment Method Based on Controller Augmentation to Reduce the Number of Test Patterns","authors":"Toshinori Hosokawa, Hiroshi Yamazaki, Shun Takeda, Masayoshi Yoshimura","doi":"10.1109/IOLTS.2018.8474097","DOIUrl":"https://doi.org/10.1109/IOLTS.2018.8474097","url":null,"abstract":"Recently, it is very important to reduce the number of test patterns by using design-for-testability (DFT) with the increase in test costs for VLSI. Especially DFT methods to reduce the number of test patterns at register transfer level (RTL) are required for the adaptability of traditional VLSI design flows and the reduction of time to search DFT locations. In this paper, we propose a DFT method at RTL to enable hardware elements including operational units and multiplexers to be concurrently tested with as small number of test patterns as possible in scan testing. The proposed method enhances the effectiveness of test compaction by assigning test registers for hardware elements such that efficient concurrent testing is executed based on controller augmentation. Experimental results on high-level benchmark circuits show that our proposed method reduced the number oftest patterns by 33%with 7.1 % area overhead on average compared with full scan design.","PeriodicalId":241735,"journal":{"name":"2018 IEEE 24th International Symposium on On-Line Testing And Robust System Design (IOLTS)","volume":"321 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122867396","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Development flow of on-line Software Test Libraries for asynchronous processor cores","authors":"A. Floridia, E. Sánchez, Nikolaos Andrikos","doi":"10.1109/IOLTS.2018.8474126","DOIUrl":"https://doi.org/10.1109/IOLTS.2018.8474126","url":null,"abstract":"Asynchronous design style is quite appealing from various perspectives. In particular, several studies confirmed the reliability of asynchronous circuits in harsh environments, being capable to better tolerate power supply and temperature variations with respect to their synchronous counterparts. However, despite these advantages and many others, their applicability (especially in safety-critical scenarios) is quite limited today. Additionally, commercial EDA tools can be hardly used for asynchronous designs; hence, designers are discouraged of using such approaches for their applications. Notably, devices deployed for safety-critical applications must satisfy stringent requirements in order to guarantee the highest level of functional safety. Commonly, on-line testing mechanisms are necessary to achieve standards compliance. Such mechanisms undergo a validation process to assess their effectiveness, fault injection campaigns being the most commonly used. For doing so, designers exploit commercial EDA tools, intended to certificate standard compliance. In this paper, a methodology for the validation of Software Test Libraries (STLs) targeting on-line testing of asynchronous processor cores is proposed. The methodology is based exclusively on commercial tools, currently used in industry for functional safety analysis.","PeriodicalId":241735,"journal":{"name":"2018 IEEE 24th International Symposium on On-Line Testing And Robust System Design (IOLTS)","volume":"28 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126055366","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pascal Raiola, M. Kochte, A. Atteya, Laura Rodríguez Gómez, H. Wunderlich, B. Becker, M. Sauer
{"title":"Detecting and Resolving Security Violations in Reconfigurable Scan Networks","authors":"Pascal Raiola, M. Kochte, A. Atteya, Laura Rodríguez Gómez, H. Wunderlich, B. Becker, M. Sauer","doi":"10.1109/IOLTS.2018.8474188","DOIUrl":"https://doi.org/10.1109/IOLTS.2018.8474188","url":null,"abstract":"Reconfigurable Scan Networks (RSNs) allow flexible access to embedded instruments for post-silicon validation and debug or diagnosis. However, this scan infrastructure can also be exploited to leak or corrupt critical information as observation and controllability of registers deep inside the circuit are increased. Securing an RSN is mandatory for maintaining safe and secure circuit operations but difficult due to its complex data flow dependencies. This work proposes a method that detects security violations and transforms a given insecure RSN into a secure RSN for which the secure data flow as specified by a user is guaranteed by construction. The presented method is guided by user-defined cost functions that target e.g., test performance or wiring cost. We provide a case study and experimental results demonstrating the applicability of the method to large designs with low runtime.","PeriodicalId":241735,"journal":{"name":"2018 IEEE 24th International Symposium on On-Line Testing And Robust System Design (IOLTS)","volume":"97 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124672892","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Sara Carbonara, A. Firrincieli, M. Reorda, Jan-Gerd Mess
{"title":"On the test of a COTS-based system for space applications","authors":"Sara Carbonara, A. Firrincieli, M. Reorda, Jan-Gerd Mess","doi":"10.1109/IOLTS.2018.8474085","DOIUrl":"https://doi.org/10.1109/IOLTS.2018.8474085","url":null,"abstract":"The MaMMoTH-Up project aims at designing and manufacturing a COTS-based system to be used on the Ariane5 launcher. One of the key challenges in the project lies in guaranteeing the same level of reliability of previous systems, which were based on space qualified components. To achieve this goal, new solutions for the test of the system hardware were developed, able to guarantee a high level of fault coverage while matching several constraints in terms of system accessibility and hardware complexity. An approach based on Software-based Self-test is described to test the OR1200 processor adopted in the system, combined with new and effective techniques for identifying the on-line functionally untestable faults. Results including a comparison between a functional and a structural test approach are also reported.","PeriodicalId":241735,"journal":{"name":"2018 IEEE 24th International Symposium on On-Line Testing And Robust System Design (IOLTS)","volume":"33 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129271394","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Effective Control Flow Integrity Checks for Intrusion Detection","authors":"A. Chaudhari, J. Abraham","doi":"10.1109/IOLTS.2018.8474130","DOIUrl":"https://doi.org/10.1109/IOLTS.2018.8474130","url":null,"abstract":"Ensuring run time Control Flow Integrity (CFI) has proven to be a good way to detect and prevent intrusions which result from exploitation of unknown vulnerabilities in the software. Attackers need to change the control flow and/or the code text of the victim application to achieve their malicious intent. However, existing techniques for monitoring run time CFI have been impractical due to their large software and hardware costs. In this paper, we describe a practical hardware based approach at a fine granularity to ensure integrity of code and the control flow of an executing application. We utilize the low power benefits and randomness of a stream cipher based hash, combined with the efficient hardware based monitoring, to provide a practical and functional defense against intrusion attacks.","PeriodicalId":241735,"journal":{"name":"2018 IEEE 24th International Symposium on On-Line Testing And Robust System Design (IOLTS)","volume":"3 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134229158","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}