2018 IEEE 24th International Symposium on On-Line Testing And Robust System Design (IOLTS)最新文献

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A Capture Safe Static Test Compaction Method Based on Don't Cares 一种基于不在乎的捕获安全静态测试压实方法
Sayuri Ochi, Hiroshi Yamazaki, Toshinori Hosokawa, Masayoshi Yoshimura
{"title":"A Capture Safe Static Test Compaction Method Based on Don't Cares","authors":"Sayuri Ochi, Hiroshi Yamazaki, Toshinori Hosokawa, Masayoshi Yoshimura","doi":"10.1109/IOLTS.2018.8474080","DOIUrl":"https://doi.org/10.1109/IOLTS.2018.8474080","url":null,"abstract":"In recent years, the number of test vectors has increased due to VLSI circuit density and complexity. A test compaction technique can reduce the number of test vectors without losing fault coverage. However, the number of transitioned signal lines per one test vector increases since each compacted test vector detects more faults. Therefore, excessive capture power consumption at scan testing causes the excessive IR drop and it might induce unnecessary yield loss. In this paper, we propose a static test compaction method which guarantees that generated test vectors are capture-safe.","PeriodicalId":241735,"journal":{"name":"2018 IEEE 24th International Symposium on On-Line Testing And Robust System Design (IOLTS)","volume":"108 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129918987","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Efficient Software-Based Partitioning for Commercial-off-the-Shelf NoC-based MPSoCs for Mixed-Criticality Systems 用于混合临界系统的商用现成的基于noc的mpsoc的高效软件分区
Stefano Esposito, Serhiy Avramenko, M. Violante
{"title":"Efficient Software-Based Partitioning for Commercial-off-the-Shelf NoC-based MPSoCs for Mixed-Criticality Systems","authors":"Stefano Esposito, Serhiy Avramenko, M. Violante","doi":"10.1109/IOLTS.2018.8474155","DOIUrl":"https://doi.org/10.1109/IOLTS.2018.8474155","url":null,"abstract":"Some industrial domains, characterized by particularly strict safety standards – e.g., avionics – are facing issues when addressing the usage of commercial-off-the-shelf multi-processor system-on-chips and in particular new network-on-chip-based architectures. One key issue is related to the usage of such system-on-chips to implement mixed-criticality systems with the main goal of reducing size, weight, and power consumption of on-board equipment by reducing the number of computers moving from federated architectures based on singlecore processors to a single multi-core processor. To comply with relevant safety standards, a mixed-criticality system should be proven to enforce isolation among safety-critical and non-safetycritical tasks running on the multi-core hardware platform. This paper presents a software-level methodology tackling such issue. The proposed methodology exploits knowledge of the deterministic routing algorithm used by the network-on-chip to implement a safe and efficient partitioning of the system. This paper presents the software implementation and an experimental evaluation of the solution, proving its suitability for integration in an avionic application.","PeriodicalId":241735,"journal":{"name":"2018 IEEE 24th International Symposium on On-Line Testing And Robust System Design (IOLTS)","volume":"56 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121371687","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Test Compression Using Extended Nonlinear Binary Codes 使用扩展非线性二进制码的测试压缩
O. Novák
{"title":"Test Compression Using Extended Nonlinear Binary Codes","authors":"O. Novák","doi":"10.1109/IOLTS.2018.8474242","DOIUrl":"https://doi.org/10.1109/IOLTS.2018.8474242","url":null,"abstract":"The linear binary codes can be extended by a relatively high number of nonlinear check bits in such a way that the code words preserve the value of the maximum number of independently specified bits from the original linear code words. A substantial improvement can be achieved in the field of sequential pattern compression using these nonlinear codes. The number of scan chains loaded in parallel can be increased while the number of specified bits is kept. We propose an algorithm that finds the appropriate nonlinear modification circuit structure and verifies the test pattern quality for different numbers of care bits in a test pattern.","PeriodicalId":241735,"journal":{"name":"2018 IEEE 24th International Symposium on On-Line Testing And Robust System Design (IOLTS)","volume":"41 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121447597","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Integrated Test Structures for Reliability Investigation under Dynamic Stimuli 用于动态刺激下可靠性研究的集成测试结构
F. Cacho, D. Nouguier, M. Arabi, X. Federspiel, Y. Carminati, M. Saliva
{"title":"Integrated Test Structures for Reliability Investigation under Dynamic Stimuli","authors":"F. Cacho, D. Nouguier, M. Arabi, X. Federspiel, Y. Carminati, M. Saliva","doi":"10.1109/IOLTS.2018.8474074","DOIUrl":"https://doi.org/10.1109/IOLTS.2018.8474074","url":null,"abstract":"Reliability for advanced CMOS nodes is becoming very challenging. Static stress may not be sufficient to understand digital circuit reliability in case of transient and frequency effect. For NBTI mechanism, it is known that projection end-of-life degradation based on DC stress is pessimistic and thus poorly accurate. This paper presents dedicated test structures to evaluate different wear-out mechanisms under dynamic stimuli. Firstly, oxide breakdown is investigated with 1GHz AC signal generated by a ring oscillator. Post-breakdown devices characteristics are significantly different between static and dynamic stress. Then, with another structure, the effect of hot carrier is shown in data path with different duty cycles and frequencies. Finally, a built-in $text{V}_{mathbf {th}}$ measurement structure is developed to investigate the negative bias temperature instability. It was measured that dynamic stimuli results in a different degradation magnitude than DC or low frequency one.","PeriodicalId":241735,"journal":{"name":"2018 IEEE 24th International Symposium on On-Line Testing And Robust System Design (IOLTS)","volume":"11 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128001380","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 5
Reliability And Performance Challenges Of Ultra-Low Voltage Caches: A Trade-Off Analysis 超低电压高速缓存的可靠性和性能挑战:权衡分析
A. Gebregiorgis, M. Tahoori
{"title":"Reliability And Performance Challenges Of Ultra-Low Voltage Caches: A Trade-Off Analysis","authors":"A. Gebregiorgis, M. Tahoori","doi":"10.1109/IOLTS.2018.8474272","DOIUrl":"https://doi.org/10.1109/IOLTS.2018.8474272","url":null,"abstract":"Supply voltage scaling is an effective technique to reduce the power consumption of modern VLSI circuits. However, the scaling extent is often limited by variation-induced failures of on-chip memories, such as cache units. Hence, the memory components dictate the minimum voltage for the entire system below which reliable operation is not guaranteed. These failures can be permanent, which reduce the yield, or transient, such as soft-errors, impacting runtime operation. Both permanent and transient failures will significantly affect the overall energy-efficiency and hence, need to be addressed in order to achieve reliable low-voltage cache operation. This issue is more pronounced in the design of devices with a stringent energy budget, such as IoT applications. This paper studies different memory failure mechanisms across wide supply voltage range, and evaluates the disposable counter-measures such as error correcting codes and architectural techniques as well as the extent of their applicability for reliable and energy-efficient cache operation.","PeriodicalId":241735,"journal":{"name":"2018 IEEE 24th International Symposium on On-Line Testing And Robust System Design (IOLTS)","volume":"5 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127426013","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
About the functional test of the GPGPU scheduler 关于GPGPU调度程序的功能测试
B. Du, J. E. R. Condia, M. Reorda, L. Sterpone
{"title":"About the functional test of the GPGPU scheduler","authors":"B. Du, J. E. R. Condia, M. Reorda, L. Sterpone","doi":"10.1109/IOLTS.2018.8474174","DOIUrl":"https://doi.org/10.1109/IOLTS.2018.8474174","url":null,"abstract":"General Purpose Graphical Processing Units (GPGPUs) are increasingly used in safety critical applications such as the automotive ones. Hence, techniques are required to test them during the operational phase with respect to possible permanent faults arising when the device is already deployed in the field. Functional tests adopting Software-based Self-test (SBST) are an effective solution since they provide benefits in terms of intrusiveness, flexibility and test duration. While the development of the functional test code addressing the several computational cores composing a GPGPU can be done resorting to known methods developed for CPUs, for other modules which are typical of a GPGPU we still miss effective solutions. This paper focuses on one of the most relevant module consists on the scheduler core which is in charge of managing different scalar computational cores and the different executed threads. At first, we propose a method for evaluating the fault coverage that can be achieved using an application program. Then, we provide some guidelines for improving the achieved fault coverage. Experimental results are provided on an open-source VHDL model of a GPGPU.","PeriodicalId":241735,"journal":{"name":"2018 IEEE 24th International Symposium on On-Line Testing And Robust System Design (IOLTS)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130517175","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 15
Resistive and Spintronic RAMs: Device, Simulation, and Applications 电阻和自旋电子ram:器件、仿真和应用
E. Vatajelu, L. Anghel, J. Portal, M. Bocquet, G. Prenat
{"title":"Resistive and Spintronic RAMs: Device, Simulation, and Applications","authors":"E. Vatajelu, L. Anghel, J. Portal, M. Bocquet, G. Prenat","doi":"10.1109/IOLTS.2018.8474226","DOIUrl":"https://doi.org/10.1109/IOLTS.2018.8474226","url":null,"abstract":"The emergence of non-volatile random access memory technologies, such as resistive and spintronic RAMs are triggering intense interdisciplinary activity. These technologies have the potential of providing many benefits, such as energy efficiency, high integration density, CMOS-compatibility, re-configurability, non-volatility and open the path towards novel computational structures and approaches, for the traditional Von-Neumann architectures and beyond. These promising characteristics, coupled with the ever-increasing limitations faced by traditional CMOS-based storage and computational structures, have driven the research community towards completely revisiting the existing computing and storage paradigms, now focusing on providing hardware solutions for in-memory and neuromorphic computing. This has resulted in an intensified research activity in the device physics, striving to achieve circuit-worth devices, reliable compact models and novel architectures. The purpose of this paper is to provide a comprehensive overview of the device physics, issues related to its use in electronic circuits, methodologies for their compact modelling and simulations, and their integration in storage and computational structures.","PeriodicalId":241735,"journal":{"name":"2018 IEEE 24th International Symposium on On-Line Testing And Robust System Design (IOLTS)","volume":"35 3","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131575097","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
IOLTS 2018 Welcome Message IOLTS 2018欢迎辞
{"title":"IOLTS 2018 Welcome Message","authors":"","doi":"10.1109/iolts.2018.8474227","DOIUrl":"https://doi.org/10.1109/iolts.2018.8474227","url":null,"abstract":"","PeriodicalId":241735,"journal":{"name":"2018 IEEE 24th International Symposium on On-Line Testing And Robust System Design (IOLTS)","volume":"31 2 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115933054","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Towards an automatic approach for hardware verification according to ISO 26262 functional safety standard 朝着根据ISO 26262功能安全标准自动进行硬件验证的方向发展
J. Sini, M. Reorda, M. Violante, Peter Sarson
{"title":"Towards an automatic approach for hardware verification according to ISO 26262 functional safety standard","authors":"J. Sini, M. Reorda, M. Violante, Peter Sarson","doi":"10.1109/IOLTS.2018.8474083","DOIUrl":"https://doi.org/10.1109/IOLTS.2018.8474083","url":null,"abstract":"The Failure Mode, Effect and Diagnostic Analysis (FMEDA) is a technique widely adopted by automotive industry to assess the level of reliability of hardware designs. Although very useful, it has the problem of taking a long time to complete and requires experts with extensive knowledge of the circuit under consideration. In this paper, it is presented a comparison between the analysis results obtained from an automatic tool developed by the authors with respect to the ones obtained by hand from a team of experts, followed by a critical review of the strengths and weaknesses, about the rules for automatic classification of the faults effects.","PeriodicalId":241735,"journal":{"name":"2018 IEEE 24th International Symposium on On-Line Testing And Robust System Design (IOLTS)","volume":"60 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114181614","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Fault-Resilient Topology Planning and Traffic Configuration for IEEE 802.1Qbv TSN Networks IEEE 802.1Qbv TSN网络的故障恢复拓扑规划与流量配置
Ayman A. Atallah, Ghaith Bany Hamad, O. Mohamed
{"title":"Fault-Resilient Topology Planning and Traffic Configuration for IEEE 802.1Qbv TSN Networks","authors":"Ayman A. Atallah, Ghaith Bany Hamad, O. Mohamed","doi":"10.1109/IOLTS.2018.8474201","DOIUrl":"https://doi.org/10.1109/IOLTS.2018.8474201","url":null,"abstract":"Time-Sensitive Networking (TSN) is a set of IEEE standards that are being developed to enable a reliable and real-time communication based on Ethernet technology. It supports Time-Triggered (TT) traffic to allow a low latency as well as deterministic timing behavior. TSN adapts the concept of seamless redundancy to ensure interruption-free fault-resilience. In this paper, our goal is to synthesize a network topology that supports seamless redundant transmission for TT messages. Therefore, we propose a greedy heuristic algorithm for joint topology, routing, and schedule synthesis. The proposed algorithm is capable to generate fault-resilient topology that guarantee feasible routing and scheduling for TT traffic. In particular, the topology is constructed iteratively such that all messages are routed through disjoint paths with a feasible schedule and the network cost is minimized. To achieve this goal, we formulate the topology synthesis problem as iterative path selection problem. Starting from a weighted undirected graph which represents an initial fully-connected network, the cost implied of using each link is mapped as arcs weights in the graph. Then, we adapt Yen's algorithm to iteratively find the minimum-cost paths for the considered messages. The scalability and the efficiency of the proposed approach are demonstrated using 380 synthetic test cases. The results show that the proposed approach is capable of finding fault-resilient topology with up to 50% less cost compared to the typical approach. Moreover, the approach scalability is validated e.g., it handles 24 ECUs with 600 messages problems within an average time of 8 sec.","PeriodicalId":241735,"journal":{"name":"2018 IEEE 24th International Symposium on On-Line Testing And Robust System Design (IOLTS)","volume":"33 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133291015","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 30
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