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1998 Conference on Precision Electromagnetic Measurements Digest (Cat. No.98CH36254)最新文献

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A metrological scanning probe microscope 计量扫描探针显微镜
1998 Conference on Precision Electromagnetic Measurements Digest (Cat. No.98CH36254) Pub Date : 1998-07-06 DOI: 10.1109/CPEM.1998.699768
Cao Shizhi, Xu Yi, Z. Kegong, C. Harms, L. Koenders
{"title":"A metrological scanning probe microscope","authors":"Cao Shizhi, Xu Yi, Z. Kegong, C. Harms, L. Koenders","doi":"10.1109/CPEM.1998.699768","DOIUrl":"https://doi.org/10.1109/CPEM.1998.699768","url":null,"abstract":"A metrological scanning probe microscope (SPM) has been jointly developed and manufactured by NIM (China) and PTB (Germany). This instrument is a \"sample scan\" SPM. A new and high precision scanning X-Y table (monolithic flecxible hinge type) equipped with capacitance transducers for all 6 axis and is controlled by a corresponding digital signal, and it is made of aluminum. The Z-scanner uses a built-in capacitance transducer for its active element. The X-Y scan is generated in a closed feedback-loop. This SPM includes a two tip holder in the Z-scanner, one is for tunnel-tip and the other is for needle sensor. This construction is very convenience for different types of measurement STM and AFM. The measurements of the instrument are controlled by a computer with a DSP card and a IEEE card. The IEEE card can drive the X-Y scanning table by a digital signal. The software of this system was written in C language and IDL language. The program for controling the DSP card and data collection was written in C language.","PeriodicalId":239228,"journal":{"name":"1998 Conference on Precision Electromagnetic Measurements Digest (Cat. No.98CH36254)","volume":"2 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1998-07-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131572861","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 5
Technical objects external magnetic fields automatic measuring system 技术对象外磁场自动测量系统
1998 Conference on Precision Electromagnetic Measurements Digest (Cat. No.98CH36254) Pub Date : 1998-07-06 DOI: 10.1109/CPEM.1998.700068
V.V. Degtyaryov
{"title":"Technical objects external magnetic fields automatic measuring system","authors":"V.V. Degtyaryov","doi":"10.1109/CPEM.1998.700068","DOIUrl":"https://doi.org/10.1109/CPEM.1998.700068","url":null,"abstract":"The automatic measuring system of technical objects magnetic fields control measurements is developed. The high level of anticountermeasures from external object magnetic fields is achieved. The multifield measuring EMF noise influence on accuracy is eliminated. The methodic measuring error is reduced. The system has a flexible software, mobility and possibility of function modules interchange ability, it allows to make direct indirect and aggregate measurements.","PeriodicalId":239228,"journal":{"name":"1998 Conference on Precision Electromagnetic Measurements Digest (Cat. No.98CH36254)","volume":"17 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1998-07-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131591021","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
A capacitance standard based on counting electrons: progress report 基于电子计数的电容标准:进度报告
1998 Conference on Precision Electromagnetic Measurements Digest (Cat. No.98CH36254) Pub Date : 1998-07-06 DOI: 10.1109/CPEM.1998.699821
M. Keller, J. Martinis, N. Zimmerman
{"title":"A capacitance standard based on counting electrons: progress report","authors":"M. Keller, J. Martinis, N. Zimmerman","doi":"10.1109/CPEM.1998.699821","DOIUrl":"https://doi.org/10.1109/CPEM.1998.699821","url":null,"abstract":"We have combined an electron pump and a vacuum-gap capacitor to create a prototype capacitance standard based on electron counting. We are testing various components individually to determine whether a standard with an overall uncertainty of 1 part in 10/sup 8/ is feasible.","PeriodicalId":239228,"journal":{"name":"1998 Conference on Precision Electromagnetic Measurements Digest (Cat. No.98CH36254)","volume":"64 14","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1998-07-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133488329","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Characterization of the traveling standard for an international comparison of DC voltage ratio 描述了国际间直流电压比比较的旅行标准
1998 Conference on Precision Electromagnetic Measurements Digest (Cat. No.98CH36254) Pub Date : 1998-07-06 DOI: 10.1109/CPEM.1998.699925
G. Marullo-Reedtz, R. Cerri
{"title":"Characterization of the traveling standard for an international comparison of DC voltage ratio","authors":"G. Marullo-Reedtz, R. Cerri","doi":"10.1109/CPEM.1998.699925","DOIUrl":"https://doi.org/10.1109/CPEM.1998.699925","url":null,"abstract":"An international comparison of DC voltage ratio up to 1000 V has been started. It is one of the electrical key-comparisons selected by the CCEM. Preliminary work carried out by the pilot laboratory, IEN, in order to characterize the candidate traveling standard is reported.","PeriodicalId":239228,"journal":{"name":"1998 Conference on Precision Electromagnetic Measurements Digest (Cat. No.98CH36254)","volume":"17 22","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1998-07-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134411379","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 11
Properties of iodine cells contaminated by the heteromolecule /sup 127/I/sup 129/I for metrological applications 异分子/sup 127/I/sup 129/I污染碘电池的特性及其计量应用
1998 Conference on Precision Electromagnetic Measurements Digest (Cat. No.98CH36254) Pub Date : 1998-07-06 DOI: 10.1109/CPEM.1998.699889
P. Balling, J. Blabla
{"title":"Properties of iodine cells contaminated by the heteromolecule /sup 127/I/sup 129/I for metrological applications","authors":"P. Balling, J. Blabla","doi":"10.1109/CPEM.1998.699889","DOIUrl":"https://doi.org/10.1109/CPEM.1998.699889","url":null,"abstract":"The influence of contamination of the iodine cell by heteroisotopic molecule is discussed. Numerical model results are compared with measured values for both third (THT) and fifth (FHT) harmonic method of detection. Contamination causes substantially lower frequency shift in the case of FHT.","PeriodicalId":239228,"journal":{"name":"1998 Conference on Precision Electromagnetic Measurements Digest (Cat. No.98CH36254)","volume":"56 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1998-07-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133134837","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
An advanced technique for the multipole imaging of a magnetic source: discrete transforms in high-precision magnetic signature processing 磁源多极成像的先进技术:高精度磁特征处理中的离散变换
1998 Conference on Precision Electromagnetic Measurements Digest (Cat. No.98CH36254) Pub Date : 1998-07-06 DOI: 10.1109/CPEM.1998.699897
D. Bojko, A. Kildishev, S. Volokhov
{"title":"An advanced technique for the multipole imaging of a magnetic source: discrete transforms in high-precision magnetic signature processing","authors":"D. Bojko, A. Kildishev, S. Volokhov","doi":"10.1109/CPEM.1998.699897","DOIUrl":"https://doi.org/10.1109/CPEM.1998.699897","url":null,"abstract":"An extension of a magnetic moment theorem for all multipoles, presented here for the first time, leads to development of an orthonormal set of discrete selective functions, applied to an accurate multipole imaging of an object by analysis of its magnetic signature (MS). The computed solution generates this orthonormal set for different trace grids. An example set is tested numerically with a non-uniform normalised grid and its selective efficiency is proved.","PeriodicalId":239228,"journal":{"name":"1998 Conference on Precision Electromagnetic Measurements Digest (Cat. No.98CH36254)","volume":"13 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1998-07-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133805733","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Source-pull and multiharmonic load-pull measurements based on six-port techniques 基于六端口技术的源拉和多谐波负载拉测量
1998 Conference on Precision Electromagnetic Measurements Digest (Cat. No.98CH36254) Pub Date : 1998-07-06 DOI: 10.1109/CPEM.1998.700021
G. Berghoff, O. Gibrat, E. Bergeault, B. Huyart, L. Jallet
{"title":"Source-pull and multiharmonic load-pull measurements based on six-port techniques","authors":"G. Berghoff, O. Gibrat, E. Bergeault, B. Huyart, L. Jallet","doi":"10.1109/CPEM.1998.700021","DOIUrl":"https://doi.org/10.1109/CPEM.1998.700021","url":null,"abstract":"An original measurement system for nonlinear microwave power transistor characterization, using six-port reflectometers, is presented. It allows independent active tuning of the output impedances at f/sub 0/ and 2f/sub 0/ (multiharmonic load-pull) and variation of the source impedance at the input port at f/sub 0/ (source-pull). Experimental results are shown for a commercial GaAs MESFET power transistor.","PeriodicalId":239228,"journal":{"name":"1998 Conference on Precision Electromagnetic Measurements Digest (Cat. No.98CH36254)","volume":"57 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1998-07-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114514938","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
All-diode-laser based, dual-cavity AgGaS/sub 2/ difference-frequency spectrometer for the 9-11 /spl mu/m range 全二极管激光为基础，双腔AgGaS/sub - 2/差频光谱仪，用于9-11 /spl μ m范围
1998 Conference on Precision Electromagnetic Measurements Digest (Cat. No.98CH36254) Pub Date : 1998-07-06 DOI: 10.1109/CPEM.1998.699834
T. Kaing, D. Lee, J. Zondy
{"title":"All-diode-laser based, dual-cavity AgGaS/sub 2/ difference-frequency spectrometer for the 9-11 /spl mu/m range","authors":"T. Kaing, D. Lee, J. Zondy","doi":"10.1109/CPEM.1998.699834","DOIUrl":"https://doi.org/10.1109/CPEM.1998.699834","url":null,"abstract":"We report on preliminary performance of a mid-IR doubly-resonant difference frequency (DFG) spectrometer generating 30 nW of 10.2-/spl mu/m tunable radiation out of 7 mW and 275 mW of the diode laser pump inputs at 778 nm and 842 nm.","PeriodicalId":239228,"journal":{"name":"1998 Conference on Precision Electromagnetic Measurements Digest (Cat. No.98CH36254)","volume":"122 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1998-07-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124719632","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
G measurement with the dynamic free pendulum method: first results 用动态自由摆法测量G:第一个结果
1998 Conference on Precision Electromagnetic Measurements Digest (Cat. No.98CH36254) Pub Date : 1998-07-06 DOI: 10.1109/CPEM.1998.699829
A. De Marchi, M. Ortolano, F. Periale
{"title":"G measurement with the dynamic free pendulum method: first results","authors":"A. De Marchi, M. Ortolano, F. Periale","doi":"10.1109/CPEM.1998.699829","DOIUrl":"https://doi.org/10.1109/CPEM.1998.699829","url":null,"abstract":"This paper presents some preliminary results about the measurement of G with the dynamic pendulum method. Although the uncertainty is still high (20%), the measurements are well centered on the known value of G. Present problems of the experiment are discussed and solutions to reach the projected accuracy of the method are proposed.","PeriodicalId":239228,"journal":{"name":"1998 Conference on Precision Electromagnetic Measurements Digest (Cat. No.98CH36254)","volume":"3 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1998-07-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123185040","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
AC and DC voltage standards based on silicon micromechanics 基于硅微力学的交流和直流电压标准
1998 Conference on Precision Electromagnetic Measurements Digest (Cat. No.98CH36254) Pub Date : 1998-07-06 DOI: 10.1109/CPEM.1998.699739
M. Suhonen, H. Seppa, A. Oja, M. Heinila, I. Nakki
{"title":"AC and DC voltage standards based on silicon micromechanics","authors":"M. Suhonen, H. Seppa, A. Oja, M. Heinila, I. Nakki","doi":"10.1109/CPEM.1998.699739","DOIUrl":"https://doi.org/10.1109/CPEM.1998.699739","url":null,"abstract":"Micromechanical AC and DC standards, suitable for compact, low-cost precision electronics applications are described. The standards are based on controlling the charge of a parallel-moving-plate capacitor. We expect that the voltage standards based on mechanical and geometrical properties of single crystalline silicon can have a high stability. We show the basic principle of the AC and DC standards and preliminary experiments with the AC voltage standard.","PeriodicalId":239228,"journal":{"name":"1998 Conference on Precision Electromagnetic Measurements Digest (Cat. No.98CH36254)","volume":"19 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1998-07-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121604509","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 48
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