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1998 Conference on Precision Electromagnetic Measurements Digest (Cat. No.98CH36254)最新文献

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Frequency stabilization of extended cavity diode lasers to iodine at 633 nm. Review of different methods 扩展腔二极管激光器在633 nm处对碘的频率稳定。不同方法综述
1998 Conference on Precision Electromagnetic Measurements Digest (Cat. No.98CH36254) Pub Date : 1998-07-06 DOI: 10.1109/CPEM.1998.699861
H. Simonsen
{"title":"Frequency stabilization of extended cavity diode lasers to iodine at 633 nm. Review of different methods","authors":"H. Simonsen","doi":"10.1109/CPEM.1998.699861","DOIUrl":"https://doi.org/10.1109/CPEM.1998.699861","url":null,"abstract":"In this paper we discuss different approaches to frequency stabilize extended cavity diode lasers to I/sub 2/-Doppler-free absorption signals. This includes the use of intra-cavity/extra-cavity absorption cells, and application of either third harmonic detection techniques or frequency-modulation spectroscopy.","PeriodicalId":239228,"journal":{"name":"1998 Conference on Precision Electromagnetic Measurements Digest (Cat. No.98CH36254)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1998-07-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129372503","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
A new atomic frequency standard: the coherent population trapping Cs maser 一种新的原子频率标准:相干居群诱捕Cs脉泽
1998 Conference on Precision Electromagnetic Measurements Digest (Cat. No.98CH36254) Pub Date : 1998-07-06 DOI: 10.1109/CPEM.1998.699845
A. Godone, F. Levi, J. Vanier
{"title":"A new atomic frequency standard: the coherent population trapping Cs maser","authors":"A. Godone, F. Levi, J. Vanier","doi":"10.1109/CPEM.1998.699845","DOIUrl":"https://doi.org/10.1109/CPEM.1998.699845","url":null,"abstract":"Recent studies have shown the feasibility of a Cs maser without population inversion based on the coherent population trapping phenomenon. Among the main advantages of this type of frequency standard are size, simplicity of implementation, virtual absence of first order light shift and the availability of a low noise microwave signal leading to the realization of a standard with an excellent short term frequency stability.","PeriodicalId":239228,"journal":{"name":"1998 Conference on Precision Electromagnetic Measurements Digest (Cat. No.98CH36254)","volume":"33 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1998-07-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130665894","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Wide band measurement of precision magnetic potentiometer with proportion-integral-differentiator for heavy pulse current 带比例-积分-微分器的精密磁电位器对大脉冲电流的宽带测量
1998 Conference on Precision Electromagnetic Measurements Digest (Cat. No.98CH36254) Pub Date : 1998-07-06 DOI: 10.1109/CPEM.1998.699952
S. Ren, Zhenggang Cheng, Wenyi Hu
{"title":"Wide band measurement of precision magnetic potentiometer with proportion-integral-differentiator for heavy pulse current","authors":"S. Ren, Zhenggang Cheng, Wenyi Hu","doi":"10.1109/CPEM.1998.699952","DOIUrl":"https://doi.org/10.1109/CPEM.1998.699952","url":null,"abstract":"A wide band measurement system of magnetic potentiometer of high precision with proportion-integral-differentiator for heavy pulse and alternating current is developed. The experiment results show that the new measurement system achieves band spread from 8 kHz to 70 kHz. The band of new measurement system is about 10 times wider than a conventional measurement system. The design and calculations of the new measurement system are given.","PeriodicalId":239228,"journal":{"name":"1998 Conference on Precision Electromagnetic Measurements Digest (Cat. No.98CH36254)","volume":"11 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1998-07-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131954207","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Sub-nanometric metrology for high resolution astrometric interferometry 高分辨率天文测量干涉测量的亚纳米计量
1998 Conference on Precision Electromagnetic Measurements Digest (Cat. No.98CH36254) Pub Date : 1998-07-06 DOI: 10.1109/CPEM.1998.699935
M. Bisi, G. Alasia, F. Bertinetto, P. Cordiale, G. Galzerano, G. Mana, M. Zangirolami
{"title":"Sub-nanometric metrology for high resolution astrometric interferometry","authors":"M. Bisi, G. Alasia, F. Bertinetto, P. Cordiale, G. Galzerano, G. Mana, M. Zangirolami","doi":"10.1109/CPEM.1998.699935","DOIUrl":"https://doi.org/10.1109/CPEM.1998.699935","url":null,"abstract":"A study team, funded by the European Space Agency, is working on some scientific and technological aspects of a future astrometric space mission. In this framework, we are carrying out an experiment which aims at define the bounds to the performance of the metrology subsystem necessary to the sub-nanometric stabilization of stellar interferometers in space.","PeriodicalId":239228,"journal":{"name":"1998 Conference on Precision Electromagnetic Measurements Digest (Cat. No.98CH36254)","volume":"9 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1998-07-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127867107","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Lasers for a trapped Hg/sup +/ optical frequency standard 用于捕获汞/sup +/光学频率标准的激光器
1998 Conference on Precision Electromagnetic Measurements Digest (Cat. No.98CH36254) Pub Date : 1998-07-06 DOI: 10.1109/CPEM.1998.699832
B. Young, Dana Joy Berkeland, F. Cruz, J. Bergquist, W. Itano, D. Wineland
{"title":"Lasers for a trapped Hg/sup +/ optical frequency standard","authors":"B. Young, Dana Joy Berkeland, F. Cruz, J. Bergquist, W. Itano, D. Wineland","doi":"10.1109/CPEM.1998.699832","DOIUrl":"https://doi.org/10.1109/CPEM.1998.699832","url":null,"abstract":"We have demonstrated a frequency source at 563 nm with an approximately 6 Hz linewidth for use in an optical frequency standard based on trapped and cooled /sup 199/Hg/sup +/ ions. Additionally, we are developing solid state laser replacements for gas and dye lasers presently used for driving 194 nm and 282 nm /sup 199/Hg/sup +/ transitions.","PeriodicalId":239228,"journal":{"name":"1998 Conference on Precision Electromagnetic Measurements Digest (Cat. No.98CH36254)","volume":"30 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1998-07-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125478174","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Micromechanical silicon scale 微机械硅秤
1998 Conference on Precision Electromagnetic Measurements Digest (Cat. No.98CH36254) Pub Date : 1998-07-06 DOI: 10.1109/CPEM.1998.699805
T. Sillanpaa, A. Oja, H. Seppa
{"title":"Micromechanical silicon scale","authors":"T. Sillanpaa, A. Oja, H. Seppa","doi":"10.1109/CPEM.1998.699805","DOIUrl":"https://doi.org/10.1109/CPEM.1998.699805","url":null,"abstract":"A novel miniature capacitive scale is described. The device is realized by micromachining single-crystalline silicon. Our design calculations show that it is possible to weigh one gram with an accuracy on the order of a part in million.","PeriodicalId":239228,"journal":{"name":"1998 Conference on Precision Electromagnetic Measurements Digest (Cat. No.98CH36254)","volume":"805 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1998-07-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123289582","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
Calibration of precision measuring amplifiers for strain gauge transducers 校正应变计传感器的精密测量放大器
1998 Conference on Precision Electromagnetic Measurements Digest (Cat. No.98CH36254) Pub Date : 1998-07-06 DOI: 10.1109/CPEM.1998.699813
J. Bohacek, Y. Nakamura, K. Yoshihiro, T. Endo
{"title":"Calibration of precision measuring amplifiers for strain gauge transducers","authors":"J. Bohacek, Y. Nakamura, K. Yoshihiro, T. Endo","doi":"10.1109/CPEM.1998.699813","DOIUrl":"https://doi.org/10.1109/CPEM.1998.699813","url":null,"abstract":"A method is described that utilizes a ratio device consisting of multi-decade inductive voltage dividers to calibrate precision measuring amplifiers for strain gauge transducers. Most frequently, this device is used to calibrate 2.5 mV/V ranges of the amplifiers, relative standard uncertainty being 5 ppm for the ratio of 0.0025 and at 225 Hz.","PeriodicalId":239228,"journal":{"name":"1998 Conference on Precision Electromagnetic Measurements Digest (Cat. No.98CH36254)","volume":"89 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1998-07-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123313827","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
Status of SET activities at NMi-VSL NMi-VSL的SET活动状况
1998 Conference on Precision Electromagnetic Measurements Digest (Cat. No.98CH36254) Pub Date : 1998-07-06 DOI: 10.1109/CPEM.1998.699822
P. Teunissen, C. Rietveld, F. Liefrink, E. Dierikx
{"title":"Status of SET activities at NMi-VSL","authors":"P. Teunissen, C. Rietveld, F. Liefrink, E. Dierikx","doi":"10.1109/CPEM.1998.699822","DOIUrl":"https://doi.org/10.1109/CPEM.1998.699822","url":null,"abstract":"We discuss the present status of the activities at the NMi Van Swinden Laboratorium in the field of application of single electron transport devices in a future primary standard of electrical current. The activities cover single electron transport (SET) device fabrication and testing, as well as precision measurements of the small SET currents.","PeriodicalId":239228,"journal":{"name":"1998 Conference on Precision Electromagnetic Measurements Digest (Cat. No.98CH36254)","volume":"917 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1998-07-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123042484","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
Precision computer-controlled decade capacitor 精密计算机控制的十进电容
1998 Conference on Precision Electromagnetic Measurements Digest (Cat. No.98CH36254) Pub Date : 1998-07-06 DOI: 10.1109/CPEM.1998.700022
H. Eckardt, Heinz-Günther Behnke, W. Bemme, Y. Semyonov, O. A. Shvedov
{"title":"Precision computer-controlled decade capacitor","authors":"H. Eckardt, Heinz-Günther Behnke, W. Bemme, Y. Semyonov, O. A. Shvedov","doi":"10.1109/CPEM.1998.700022","DOIUrl":"https://doi.org/10.1109/CPEM.1998.700022","url":null,"abstract":"A precision computer-controlled decade capacitor switching capacitance values from 100 pF to 1 /spl mu/F in steps of 100 pF with an uncertainty of the order 10/sup -6/ is described. To minimize the temperature influence, special ceramic capacitors with temperature coefficients of 10/sup -6/ K/sup -1/ and low loss factor are used. Switching impedances are avoided by a four-terminal-pair definition of capacitors and quasi-coaxial connection. The capacitor can be used for automatic calibrations of capacitance bridges with a basic accuracy of 10/sup -4/ to 10/sup -5/.","PeriodicalId":239228,"journal":{"name":"1998 Conference on Precision Electromagnetic Measurements Digest (Cat. No.98CH36254)","volume":"2 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1998-07-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121023589","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
Level analysis and control of electromagnetic radiation from microwave oscillators 微波振荡器电磁辐射的电平分析与控制
1998 Conference on Precision Electromagnetic Measurements Digest (Cat. No.98CH36254) Pub Date : 1998-07-06 DOI: 10.1109/CPEM.1998.700075
A. Nikitenko, I. Ruzhentsev, V.N. Zin'kovsky
{"title":"Level analysis and control of electromagnetic radiation from microwave oscillators","authors":"A. Nikitenko, I. Ruzhentsev, V.N. Zin'kovsky","doi":"10.1109/CPEM.1998.700075","DOIUrl":"https://doi.org/10.1109/CPEM.1998.700075","url":null,"abstract":"Theoretical and experimental studies of spurious and extra waveguide oscillation in crossed-field devices are described. Theoretically the existence is shown of spurious and extra waveguide oscillations in wide band (from some cycles to dozen gigacycles), and amplitude-from some millivolts to hundred volts. We studied two oscillation processes: ion and electron. Experimentally these oscillations are detected in the output spectrum, and emission from cathode junction is found. Thus crossed-field devices influence EMC.","PeriodicalId":239228,"journal":{"name":"1998 Conference on Precision Electromagnetic Measurements Digest (Cat. No.98CH36254)","volume":"577 2 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1998-07-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122718061","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
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