{"title":"Micromechanical silicon scale","authors":"T. Sillanpaa, A. Oja, H. Seppa","doi":"10.1109/CPEM.1998.699805","DOIUrl":null,"url":null,"abstract":"A novel miniature capacitive scale is described. The device is realized by micromachining single-crystalline silicon. Our design calculations show that it is possible to weigh one gram with an accuracy on the order of a part in million.","PeriodicalId":239228,"journal":{"name":"1998 Conference on Precision Electromagnetic Measurements Digest (Cat. No.98CH36254)","volume":"805 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1998-07-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"1998 Conference on Precision Electromagnetic Measurements Digest (Cat. No.98CH36254)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CPEM.1998.699805","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 3
Abstract
A novel miniature capacitive scale is described. The device is realized by micromachining single-crystalline silicon. Our design calculations show that it is possible to weigh one gram with an accuracy on the order of a part in million.