基于六端口技术的源拉和多谐波负载拉测量

1998 Conference on Precision Electromagnetic Measurements Digest (Cat. No.98CH36254) Pub Date : 1998-07-06 DOI:10.1109/CPEM.1998.700021

G. Berghoff, O. Gibrat, E. Bergeault, B. Huyart, L. Jallet

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引用次数: 1

摘要

提出了一种基于六端口反射计的非线性微波功率晶体管特性测量系统。它允许独立主动调谐输出阻抗在f/sub 0/和2f/sub 0/(多谐波负载拉)和源阻抗的变化在输入端口在f/sub 0/(源拉)。给出了商用GaAs MESFET功率晶体管的实验结果。

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Source-pull and multiharmonic load-pull measurements based on six-port techniques

An original measurement system for nonlinear microwave power transistor characterization, using six-port reflectometers, is presented. It allows independent active tuning of the output impedances at f/sub 0/ and 2f/sub 0/ (multiharmonic load-pull) and variation of the source impedance at the input port at f/sub 0/ (source-pull). Experimental results are shown for a commercial GaAs MESFET power transistor.

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来源期刊

1998 Conference on Precision Electromagnetic Measurements Digest (Cat. No.98CH36254)

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